Patents by Inventor I. Jonathan Amster

I. Jonathan Amster has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Mass defect labeling and methods of use thereof
    Patent number: 7951602
    Abstract: Mass defect labeled peptides and methods of identifying peptides are provided. In particular, embodiments of the present disclosure include mass defect labels for polypeptides that include at least one cysteine and/or at least one tryptophan and methods of using the mass defect labels to identify polypeptides. One embodiment, among others, includes a mass defect labeled peptide including at least one cysteine residue labeled with 2,4-dibromo-acetanilide. Another embodiment, among others, includes a mass defect labeled peptide including at least one tryptophan residue labeled with 4,6-dibromo-2-trifluoromethylphenylsulfenyl chloride.
    Type: Grant
    Filed: August 28, 2007
    Date of Patent: May 31, 2011
    Assignee: University of Georgia Research Foundation, Inc.
    Inventors: I. Jonathan Amster, Robert S. Phillips
  • Mass spectrometry calibration methods
    Patent number: 7700912
    Abstract: Briefly described, embodiments of this disclosure include methods of calibrating a mass spectrometry system, and the like.
    Type: Grant
    Filed: May 29, 2007
    Date of Patent: April 20, 2010
    Assignee: University of Georgia Research Foundation, Inc.
    Inventors: I. Jonathan Amster, Richard L. Wong
  • MASS DEFECT LABELING AND METHODS OF USE THEREOF
    Publication number: 20090061523
    Abstract: Briefly described, embodiments of this disclosure include mass defect labeled peptides, methods of identifying peptides, and the like.
    Type: Application
    Filed: August 28, 2007
    Publication date: March 5, 2009
    Inventors: I. Jonathan Amster, Robert S. Phillips
  • Mass spectrometry calibration methods
    Publication number: 20080067346
    Abstract: Briefly described, embodiments of this disclosure include methods of calibrating a mass spectrometry system, and the like.
    Type: Application
    Filed: May 29, 2007
    Publication date: March 20, 2008
    Inventors: I. Jonathan Amster, Richard L. Wong