Patents by Inventor Ian Barkshire

Ian Barkshire has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sample inspection apparatus
    Publication number: 20060255290
    Abstract: A sample inspection apparatus comprises a sample support; a detection system for detecting radiation emitted by or transmitted through a sample on the sample support in response to radiation incident on the sample; and a cooling system for cooling at least one of the sample support and detection system. The cooling system includes at least one oscillating, mechanical component which oscillates at a frequency different from the at least one of the support and detection system.
    Type: Application
    Filed: May 10, 2005
    Publication date: November 16, 2006
    Applicant: OXFORD INSTRUMENTS ANALYTICAL LIMITED
    Inventors: Santokh Bhadare, Ian Barkshire, Daniel Turner