Abstract: A machine direction (MD) position profile measurement of a moving sheet records the MD position of each of the cross direction (CD) measurements. A sheet monitoring system includes means for measuring the MD speed of the sheet of material; means for associating measured MD speed with time to generate time-associated MD speeds; means for recording the time-associated MD speeds; a first scanning sensor for measuring a first characteristic of the sheet material wherein the first scanning sensor is located at a first position along the MD and the first scanner sensor traverses back and forth along a CD; and means for associating first characteristic measurements with time to generate time-associated first characteristic measurements. Single and multiple scanning sensors can be employed. For multiple scanner systems where the scanners are synchronized, the technique enables recreation of the real zig-zag measurement path and same spot measurements.

Abstract: An apparatus includes a transmitter configured to transmit a signal including an electromagnetic pulse towards material in a tank. The apparatus also includes a receiver configured to receive a signal including multiple reflections of the pulse. The apparatus further includes at least one processing device configured to process the received signal and determine a measurement associated with the material in the tank. To process the received signal, the at least one processing device is configured to fit multiple models onto the received signal, select one of the models, identify at least one of the multiple reflections in the received signal using the selected model, and determine the measurement using the at least one identified reflection in the received signal. Each model is constructed from a superposition of multiple types of pulse reflections.

Abstract: An apparatus includes a transmitter configured to transmit a signal including an electromagnetic pulse towards material in a tank. The apparatus also includes a receiver configured to receive a signal including multiple reflections of the pulse. The apparatus further includes at least one processing device configured to process the received signal and determine a measurement associated with the material in the tank. To process the received signal, the at least one processing device is configured to fit multiple models onto the received signal, select one of the models, identify at least one of the multiple reflections in the received signal using the selected model, and determine the measurement using the at least one identified reflection in the received signal. Each model is constructed from a superposition of multiple types of pulse reflections.