Patents by Inventor Ian C. Hutcheon

Ian C. Hutcheon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4967302
    Abstract: A single-channel shunt-diode safety barrier for energizing a 2-wire transmitter, particularly for use in process control, incorporates within the barrier a floating d.c. power supply or its equivalent to enable the barrier to deliver into an earthed load a direct current substantially equal to that which it draws from the transmitter. The floating d.c. power supply is preferably derived from an external d.c. power source via a transformer or diode-pump circuit within the barrier itself. The barrier is enabled to pass superimposed digital or frequency signals in both directions to and from the transmitter.
    Type: Grant
    Filed: May 31, 1988
    Date of Patent: October 30, 1990
    Assignee: Measurement Technology Limited
    Inventors: Ian C. Hutcheon, David J. Epton
  • Patent number: 4860151
    Abstract: An electrical safety barrier which is adapted to pass a current returning from a hazardous area to a safe area but which will transmit negligible energy from the safe area to the hazardous area under fault conditions has in its return channel a fuse, shunt diodes and additional diodes. These additional diodes are either conventional rectifier diodes positioned at the safe-area end of the return channel or are Schottky diodes or diodes with a low forward voltage drop positioned at the hazardous-area end of the return channel.
    Type: Grant
    Filed: September 2, 1988
    Date of Patent: August 22, 1989
    Assignee: Measurement Technology Limited
    Inventors: Ian C. Hutcheon, David J. Epton
  • Patent number: 4301403
    Abstract: A method of testing operation of an electrical circuit involves supplying a test signal to circuit terminals (1 to 4), which signal may be a pulsed signal, to the circuit, thereby to switch off a switch component (ZD1). When the circuit is in this condition, further test signals may be applied to the terminals (1 to 4) to test operation of other circuit components (11, 12, 13, ZD2). The method is particularly applicable to circuits, e.g. diode safety barriers, that are encapsulated and require testing after encapsulation, when only terminals (1 to 4) are exposed for connection into an external circuit.
    Type: Grant
    Filed: December 21, 1979
    Date of Patent: November 17, 1981
    Assignee: Measurement Technology Ltd.
    Inventors: David W. Hawkes, Ian C. Hutcheon