Patents by Inventor Ian C. Shay

Ian C. Shay has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150160144
    Abstract: The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses.
    Type: Application
    Filed: February 19, 2015
    Publication date: June 11, 2015
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Ian C. Shay, Christopher A. Craven, David C. Grundy, Volker Weiss, Andrew P. Washabaugh
  • Patent number: 8981018
    Abstract: The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses.
    Type: Grant
    Filed: March 14, 2005
    Date of Patent: March 17, 2015
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Ian C. Shay, Christopher A. Craven, David C. Grundy, Volker Weiss, Andrew P. Washabaugh
  • Patent number: 8237433
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Grant
    Filed: January 19, 2011
    Date of Patent: August 7, 2012
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein
  • Publication number: 20110163742
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Application
    Filed: January 19, 2011
    Publication date: July 7, 2011
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein
  • Patent number: 7876094
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Grant
    Filed: April 4, 2008
    Date of Patent: January 25, 2011
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 7696748
    Abstract: Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.
    Type: Grant
    Filed: October 12, 2004
    Date of Patent: April 13, 2010
    Assignee: Jentek Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Andrew P. Washabaugh, Vladimir Tsukernik, Mark D. Windoloski, Ian C. Shay
  • Publication number: 20100045277
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Application
    Filed: April 4, 2008
    Publication date: February 25, 2010
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 7526964
    Abstract: Methods are described for the use of conformable eddy-current sensors and sensor arrays for characterizing residual stresses and applied loads in materials. In addition, for magnetizable materials such as steels, these methods can be used to determine carbide content and to inspect for grinding burn damage. The sensor arrays can be mounted inside or scanned across the inner surface of test articles and hollow fasteners to monitor stress distributions. A technique for placing eddy-current coils around magnetizable fasteners for load distribution monitoring is also disclosed.
    Type: Grant
    Filed: January 24, 2003
    Date of Patent: May 5, 2009
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, James M. Fisher, David C. Grundy, Darrell E. Schlicker, Vladimir Tsukernik, Robert J. Lyons, Ian C. Shay, Andrew P. Washabaugh
  • Patent number: 7451657
    Abstract: Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: November 18, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir A. Zilberstein, Andrew P. Washabaugh, Volker Weiss, Christopher A. Craven, Ian C. Shay, David C. Grundy, Karen E. Walrath, Robert J. Lyons
  • Patent number: 7411390
    Abstract: For the inspection of materials and the detection and characterization of hidden objects, features, or flaws sensors and sensor arrays are used to image form two-dimensional images suitable for characterizing the hidden features. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and conducting materials, while capacitive sensors can be used for dielectric materials. Enhanced drive windings and electrode structures permit nulling or cancellation of local fields in the vicinity of the sense elements to increase sensor sensitivity. The addition of calibration windings, which are not energized during measurements, allows absolute impedance and material property measurements with nulled sensors. Sensors, sensor arrays, and support fixtures are described which permit relative motion between the drive and sense elements. This facilitates the volumetric reconstruction of hidden features and objects.
    Type: Grant
    Filed: June 3, 2003
    Date of Patent: August 12, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh
  • Patent number: 7188532
    Abstract: Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.
    Type: Grant
    Filed: September 8, 2004
    Date of Patent: March 13, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Andrew P. Washabaugh, Darrell E. Schlicker, Ian C. Shay, Robert J. Lyons, Christopher A. Craven, Christopher Root, Mark D. Windoloski, Volker Weiss
  • Patent number: 7183764
    Abstract: Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the balloons permit easier insertion of the probes into the component and reduce the mechanical stresses on the sensors, thereby extending the sensor lifetime. By sequentially partially inserting the sensor into a limited access area from either side of the limited access area and scanning in opposite directions, the entire surface of the test material can be inspected.
    Type: Grant
    Filed: August 28, 2003
    Date of Patent: February 27, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir Tsukernik, Ian C. Shay, David C. Grundy, Andrew P. Washabaugh
  • Patent number: 7161351
    Abstract: Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown model parameters, such as the electrical conductivity, magnetic permeability, dielectric permittivity, thermal conductivity, and/or layer thickness. These parameter responses are then used to obtain a quantitative estimate of a property of a hidden feature, such as corrosion loss layer thicknesses, inclusion size and depth, or stress variation. The sensors can be single element sensors or sensor arrays and impose an interrogation electric, magnetic, or thermal field.
    Type: Grant
    Filed: September 3, 2004
    Date of Patent: January 9, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian C. Shay, Robert J. Lyons, Andrew P. Washabaugh
  • Patent number: 7049811
    Abstract: A test circuit having a drive winding with parallel conducting segments and a plurality of sense elements used for the nondestructive measurement of materials. The drive winding segments have extended portions and are driven by a time varying electric current to impose a magnetic field in the test material. Sense elements are distributed in a direction parallel to the extended portions of these drive segments, with separate connections provided to each sense element. A second plurality of sense elements may also be distributed parallel to the extended portions of the drive windings, being either aligned or offset from a first plurality of sense elements.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: May 23, 2006
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Publication number: 20040232911
    Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.
    Type: Application
    Filed: June 23, 2004
    Publication date: November 25, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Patent number: 6784662
    Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.
    Type: Grant
    Filed: March 19, 2002
    Date of Patent: August 31, 2004
    Assignee: Jentek Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Patent number: 6781387
    Abstract: Described is an inspection method for detecting defects in dielectic test materials using a penetrant material and a dielectric sensor. The penetrant material provides differing dielectric properties from test material and improves the dielectric contrast between defects substantially filled by the penetrant and the test material. The penetrant can be a liquid, such as water, or a powder, as long as it provides a substantially different complex permittivity than the test material.
    Type: Grant
    Filed: August 20, 2002
    Date of Patent: August 24, 2004
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Markus Zahn, Wayne D. Ryan, Ian C. Shay, Andrew Washabaugh
  • Publication number: 20040124834
    Abstract: Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the balloons permit easier insertion of the probes into the component and reduce the mechanical stresses on the sensors, thereby extending the sensor lifetime. By sequentially partially inserting the sensor into a limited access area from either side of the limited access area and scanning in opposite directions, the entire surface of the test material can be inspected.
    Type: Application
    Filed: August 28, 2003
    Publication date: July 1, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir Tsukernik, Ian C. Shay, David C. Grundy, Andrew P. Washabaugh
  • Publication number: 20040056654
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Application
    Filed: May 20, 2003
    Publication date: March 25, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Publication number: 20040021461
    Abstract: Methods and apparatus are described for the inspection of materials and the detection and characterization of hidden objects, features, or flaws. Sensors and sensor arrays are used to image form two-dimensional images suitable for characterizing the hidden features. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and conducting materials, while capacitive sensors can be used for dielectric materials. Enhanced drive windings and electrode structures permit nulling or cancellation of local fields in the vicinity of the sense elements to increase sensor sensitivity. The addition of calibration windings, which are not energized during measurements, allows absolute impedance and material property measurements with nulled sensors. Sensors, sensor arrays, and support fixtures are described which permit relative motion between the drive and sense elements. This facilitates the volumetric reconstruction of hidden features and objects.
    Type: Application
    Filed: June 3, 2003
    Publication date: February 5, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh