Patents by Inventor Ian K. Buehring

Ian K. Buehring has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5517307
    Abstract: Apparatus for surface measurement has a grating interferometer with a curved diffraction grating carried on a pivotal support arm of a probe for contacting a surface. The probe is biased into contact with a surface by an electromagnetic coil acting on an armature, or a pair of such biasing arrangements. A laser diode illuminates the grating to produce a pair of first order diffracted beams of opposite sign which are reflected from internal faces of a prism, and combined by a diachronic central layer of the prism and a pair of beam splitters. Output signals from the beam splitters are supplied to a signal processing circuit having a fringe counter and an interpolator. The fringe counter detects zero crossings of the signals and the interpolator maintains a digital estimate of the phase of the signals and updates the estimate when the phase difference between the estimate and the input signals exceeds a predetermined threshold.
    Type: Grant
    Filed: November 30, 1993
    Date of Patent: May 14, 1996
    Assignee: Rank Taylor Hobson Limited
    Inventors: Ian K. Buehring, Daniel Mansfield
  • Patent number: 5150314
    Abstract: A metrological apparatus for measuring form and texture of a surface employs an inductive transducer producing an AC gauge signal, and a tracking AC analogue to digital converter. In order to avoid errors in the output signal at a relatively high speed of traverse of the surface due to a non-flat frequency response of the converter, the output signal is processed by a digital filter to provide a combined frequency response which is flat over a desired range. In order to avoid errors in the output signal due to non-linearity of the transducer, a square or cubic correction is applied to the signal. A method calibrating the apparatus to obtain coefficients for the square and cube terms in the correction process is also described.
    Type: Grant
    Filed: June 22, 1990
    Date of Patent: September 22, 1992
    Assignee: Rank Taylor Hobson Limited
    Inventors: John D. Garratt, Paul J. Scott, Ian K. Buehring
  • Patent number: 5063291
    Abstract: An interpolator, particularly for use with an optical grating for detecting position in a metrological apparatus, receives input signals in quadrature. One of the input signals is squared and the two signals are multiplied together to provide further signals in quadrature at twice the frequency of the input signals. One of the further signals is also squared and the further signals are multiplied together to provide output signals at four times the frequency of the input signals. Filtering is provided to remove DC components, such as due to drift. In the illustrated metrological apparatus, the zero crossing points of the output signals are detected to effect sampling, with high resolution, of a surface sensor output. Interpolation noise occurs at a high frequency and is removed by low pass filtering of the sample signal from the surface sensor.
    Type: Grant
    Filed: June 22, 1990
    Date of Patent: November 5, 1991
    Assignee: Rank Taylor Hobson Limited
    Inventor: Ian K. Buehring