Patents by Inventor Ian Melnick

Ian Melnick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220125303
    Abstract: An ocular measurement system including an integrated measurement subsystem including at least a refraction measurement module for measuring at least refraction of an eye of a subject and a corneal measurement module integrated with the refraction measurement module for measuring at least a thickness and a shape of a cornea of the eye and an axial length finding subsystem for finding an axial length of the eye, based on taking into account at least the refraction of the eye and the thickness and the shape of the cornea.
    Type: Application
    Filed: November 7, 2018
    Publication date: April 28, 2022
    Applicant: VISIONIX - LUNEAU TECHNOLOGY
    Inventors: Marc ABITBOL, Ian MELNICK, Haniel ABITBOL
  • Patent number: 10383513
    Abstract: An objective phoropter utilizing an illuminated keratometric object projecting its illumination onto the subject's cornea, and imaging the reflection therefrom in an imaging camera. Image processing of these images is used to improve the focusing and centering of the cornea subject's eyes. Once the correctly focused position of the eyes is obtained relative to the keratometer object, an accurate longitudinal position of the eyes relative to the lens wheel assemblies can also be achieved. This results in more accurate prescription generation than in prior art systems where the eyes may not be accurately positioned relative to the lens wheels. Additionally, the lens combinations of the entire phoropter wheel can be calibrated using an artificial eye having adjustable levels of aberration. Each lens combination is adjusted to supposedly correct a selected aberration level, and any residual aberration measured represents the correction to be applied to that lens combination.
    Type: Grant
    Filed: May 5, 2016
    Date of Patent: August 20, 2019
    Assignee: VISIONIX LTD.
    Inventors: Marc Abitbol, Ran Yam, Haggai Herman, Ian Melnick, Aderet Sompolinsky
  • Publication number: 20180116505
    Abstract: An objective phoropter utilizing an illuminated keratometric object projecting its illumination onto the subject's cornea, and imaging the reflection therefrom in an imaging camera. Image processing of these images is used to improve the focusing and centering of the cornea subject's eyes. Once the correctly focused position of the eyes is obtained relative to the keratometer object, an accurate longitudinal position of the eyes relative to the lens wheel assemblies can also be achieved. This results in more accurate prescription generation than in prior art systems where the eyes may not be accurately positioned relative to the lens wheels. Additionally, the lens combinations of the entire phoropter wheel can be calibrated using an artificial eye having adjustable levels of aberration. Each lens combination is adjusted to supposedly correct a selected aberration level, and any residual aberration measured represents the correction to be applied to that lens combination.
    Type: Application
    Filed: May 5, 2016
    Publication date: May 3, 2018
    Inventors: MARC ABITBOL, RAN YAM, HAGGAI HERMAN, IAN MELNICK, ADERET SOMPOLINSKY
  • Patent number: 9462939
    Abstract: Systems for performing combined phoropter and refractive measurements to ascertain the aberrations present in the eye of a subject. The systems use a pair of phoropter wheel assemblies, one for each eye, each assembly comprising a number of lens wheels incorporating the series of lenses and wedges required to compensate for a range of refractive vision aberrations. The vision of each eye is corrected by a combination of a subjective phoropter measurement, iteratively performed with an objective wavefront analysis measurement to determine the residual aberrations existing after the initial phoropter correction. The system is able to automatically align the axes of each wavefront analyzer with is corresponding eye, by means of centering the pupil image in the wavefront analyzer camera, and to determine the pupil distance. By changing the focusing point on the wavefront analyzer of the light reflected from the eye, the corneal profile can be measured.
    Type: Grant
    Filed: April 4, 2013
    Date of Patent: October 11, 2016
    Assignee: VISIONIX LTD.
    Inventors: Marc Abitbol, Ran Yam, Haggai Herman, Ian Melnick
  • Patent number: 9220407
    Abstract: Systems for performing sequential multiple function ophthalmic measurements using separate measurement instruments, by mechanical switching between the instruments. In prior art systems, the separate measurement instruments are stacked, and transfer between them is performed by means of a linear mechanical motion stage. The separate measurement instruments of the present application are mounted on a base which is rotatably pivoted around a joint at a location remote from the optical entry apertures of the instruments. The entrance apertures of the measurement instruments then traverse the eye being measured sequentially. A rotational motion around the pivoted joint is thus transformed into a linear motion at the eye of the subject, without the need for a linear motion stage. A Scheimpflug camera corneal thickness measurement is also described, in which the measurement head is tilted during the corneal scan such that the illuminating slit beam always impinges on the cornea normally.
    Type: Grant
    Filed: September 6, 2012
    Date of Patent: December 29, 2015
    Assignee: Visionix Ltd.
    Inventors: Ran Yam, Aderet Sompolinsky, Ian Melnick
  • Patent number: 9192296
    Abstract: A wavefront measurement system, for measurement of aberrations in the eye, and for measurement of the topography of the cornea of the eye. The system differs from previously available systems in that the wavefront measurement of the eye's aberrations can be performed as a function of eye accommodation. Furthermore, methods for reducing corneal reflection are described. Additionally, the use of a very short focal length Hartman Shack lenslet array enables a very wide range of low order aberrations, up to ±25 diopters, to be measured without any refocusing or motion of the system. Also, methods are described for enabling the presence of defects within the eye to be determined using the aberration measurement system. Another embodiment captures the pupil centering position without any projected illumination pattern being used, so that a subsequent accurate centering and focusing procedure can commence at the initially captured position, thus reducing measurement time.
    Type: Grant
    Filed: August 21, 2008
    Date of Patent: November 24, 2015
    Assignee: VISIONIX LTD.
    Inventors: Marc Abitbol, Ian Melnick, Ran Yam, Haggai Herman
  • Publication number: 20150042957
    Abstract: Systems for performing combined phoropter and refractive measurements to ascertain the aberrations present in the eye of a subject. The systems use a pair of phoropter wheel assemblies, one for each eye, each assembly comprising a number of lens wheels incorporating the series of lenses and wedges required to compensate for a range of refractive vision aberrations. The vision of each eye is corrected by a combination of a subjective phoropter measurement, iteratively performed with an objective wavefront analysis measurement to determine the residual aberrations existing after the initial phoropter correction. The system is able to automatically align the axes of each wavefront analyzer with is corresponding eye, by means of centering the pupil image in the wavefront analyzer camera, and to determine the pupil distance. By changing the focusing point on the wavefront analyzer of the light refleeted from the eye, the corneal profile can be measured.
    Type: Application
    Filed: April 4, 2013
    Publication date: February 12, 2015
    Inventors: Marc Abitbol, Ran Yam, Haggai Herman, Ian Melnick
  • Publication number: 20140211161
    Abstract: Systems for performing sequential multiple function ophthalmic measurements using separate measurement instruments, by mechanical switching between the instruments. In prior art systems, the separate measurement instruments are stacked, and transfer between them is performed by means of a linear mechanical motion stage. The separate measurement instruments of the present application are mounted on a base which is rotatably pivoted around a joint at a location remote from the optical entry apertures of the instruments. The entrance apertures of the measurement instruments then traverse the eye being measured sequentially. A rotational motion around the pivoted joint is thus transformed into a linear motion at the eye of the subject, without the need for a linear motion stage. A Scheimpflug camera corneal thickness measurement is also described, in which the measurement head is tilted during the corneal scan such that the illuminating slit beam always impinges on the cornea normally.
    Type: Application
    Filed: September 6, 2012
    Publication date: July 31, 2014
    Inventors: Ran Yam, Aderet Sompolinsky, Ian Melnick
  • Publication number: 20110273669
    Abstract: A wavefront measurement system, for measurement of aberrations in the eye, and for measurement of the topography of the cornea of the eye. The system differs from previously available systems in that the wavefront measurement of the eye's aberrations can be performed as a function of eye accommodation. Furthermore, methods for reducing corneal reflection are described. Additionally, the use of a very short focal length Hartman Shack lenslet array enables a very wide range of low order aberrations, up to ±25 diopters, to be measured without any refocusing or motion of the system. Also, methods are described for enabling the presence of defects within the eye to be determined using the aberration measurement system. Another embodiment captures the pupil centering position without any projected illumination pattern being used, so that a subsequent accurate centering and focusing procedure can commence at the initially captured position, thus reducing measurement time.
    Type: Application
    Filed: August 21, 2008
    Publication date: November 10, 2011
    Inventors: Marc Abitbol, Ian Melnick, Ran Yam, Haggai Herman