Abstract: A method of protecting the pins of a pin connector of a backplane preferably includes installing a protective cover over the pins of the pin connector. The protective cover preferably includes at least one connector having receptacles for receiving the pins of the pin connector of the backplane and a handle extending from the at least one connector.

Abstract: A method and apparatus controls fans and power supplies to provide accelerated run-in testing. By modulating fans to increase case temperatures and adjusting power supplies to provide “worst case” voltages, a computer system can be subjected to a run-in tests under taxing conditions. By alternately cooling and heating devices such as CPUs, devices can be subjected to mechanical stresses associated with power-on/power off cycles. A time based test implements the present invention based on time, and a temperature based test implements the present invention based on temperature. The present invention can be used to implement a run-in test in which the computer system is operated at an elevated temperature, thereby achieving results similar to those achieved by performing a run-in test in an environmental chamber at an elevated temperature. Alternatively, the a run-in test can be performed by repeatedly cycling the temperature between relatively high and low values.

Abstract: A method of protecting the pins of a pin connector of a backplane preferably includes installing a protective cover over the pins of the pin connector. The protective cover preferably includes at least one connector having receptacles for receiving the pins of the pin connector of the backplane and a handle extending from the at least one connector.

Abstract: A method and apparatus controls fans and power supplies to provide accelerated run-in testing. By modulating fans to increase case temperatures and adjusting power supplies to provide “worst case” voltages, a computer system can be subjected to a run-in tests under taxing conditions. By alternately cooling and heating devices such as CPUs, devices can be subjected to mechanical stresses associated with power-on/power off cycles. A time based test implements the present invention based on time, and a temperature based test implements the present invention based on temperature. The present invention can be used to implement a run-in test in which the computer system is operated at an elevated temperature, thereby achieving results similar to those achieved by performing a run-in test in an environmental chamber at an elevated temperature. Alternatively, the a run-in test can be performed by repeatedly cycling the temperature between relatively high and low values.

Abstract: A mammalian pesticidal composition, and in particular a pesticidal composition for the control of insectivores, in which a pesticidal agent comprising one or more low molecular weight halogenated hydrocarbons, and in particular bromoform, is provided in microencapsulated form, for example, in a coacervated gelatinous base. The resultant microcapsule is preferably provided with a moisture resistant coating which is degradable in a mammalian alimentary system. A method of controlling mammalian pests, in particular insectivores such as moles, using the above composition is also described.