Patents by Inventor Ian R. M. Wardell

Ian R. M. Wardell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electron spectrometer
    Patent number: 4758723
    Abstract: There is provided an electron spectrometer operable to produce an image of an electron emitting surface, said spectrometer comprising in sequence:(a) means for causing electrons to be emitted from said surface;(b) a first electrostatic lens system arranged to project at least some of said electrons onto a first diffraction plane as a Fourier transform of an electron image of at least a part of said surface;(c) a torroidal capacitor type electrostatic energy analyzer having an object plane and conjugate thereto a first image plane, said analyzer being disposed with said object plane coincident with said first diffraction plane and being arranged to project electrons of said Fourier transform as an energy dispersed Fourier transform in said first image plane;(d) energy selection means for transmitting electrons of said energy dispersed Fourier transform having energies only within a selected range; and(e) a second electrostatic lens system arranged to receive electrons transmitted by said energy selection means
    Type: Grant
    Filed: May 18, 1987
    Date of Patent: July 19, 1988
    Assignee: VG Instruments Group Limited
    Inventors: Ian R. M. Wardell, Peter A. Coxon
  • Electron Spectrometer
    Patent number: RE33275
    Abstract: There is provided an electron spectrometer operable to produce an image of an electron emitting surface, said spectrometer comprising in sequence:(a) means for causing electrons to be emitted from said surface;(b) a first electrostatic lens system arranged to project at least some of said electrons onto a first diffraction plane as a Fourier transform of an electron image of at least a part of said surface;(c) a torroidal capacitor type electrostatic energy analyzer having an object plane and conjugate thereto a first image plane, said analyzer being disposed with said object plane coincident with said first diffraction plane and being arranged to project electrons of said Fourier transform as an energy dispersed Fourier transform in said first image plane;(d) energy selection means for transmitting electrons of said energy dispersed Fourier transform having energies only within a selected range; and(e) a second electrostatic lens system arranged to receive electrons transmitted by said energy selection means
    Type: Grant
    Filed: September 18, 1989
    Date of Patent: July 24, 1990
    Assignee: VG Instruments Group, Limited
    Inventors: Ian R. M. Wardell, Peter A. Coxon