Patents by Inventor Ichiro Anjoh
Ichiro Anjoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20040224149Abstract: The object of the present invention is provide a semiconductor device in semiconductor package configuration, characterized by excellent connection reliability ensured by incorporating a buffer for absorbing differences in thermal expansion rate between a mounting substrate and a semiconductor element even when an organic material is used for a mounting substrate.Type: ApplicationFiled: December 1, 2003Publication date: November 11, 2004Inventors: Akira Nagai, Shuji Eguchi, Masahiko Ogino, Masanori Segawa, Toshiak Ishii, Nobutake Tsuyuno, Hiroyoshi Kokaku, Rie Hattori, Makoto Morishima, Ichiro Anjoh, Kunihiro Tsubosaki, Chuichi Miyazaki, Makoto Kitano, Mamoru Mita, Norio Okabe
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Publication number: 20040217453Abstract: Semiconductor devices,-semiconductor wafers, and semiconductor modules are provided: wherein the semiconductor device has a small warp; damages at chip edge and cracks in a dropping test are scarcely generated; and the semiconductor device is superior in mounting reliability and mass producibility.Type: ApplicationFiled: June 7, 2004Publication date: November 4, 2004Inventors: Masahiko Ogino, Takumi Ueno, Shuji Eguchi, Akira Nagai, Toshiya Satoh, Toshiaki Ishii, Hiroyoshi Kokaku, Tadanori Segawa, Nobutake Tsuyuno, Asao Nishimura, Ichiro Anjoh
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Publication number: 20040195702Abstract: In a semiconductor device having a three-layered buffer layer comprising core layer 1 having interconnected foams such as a three-dimensional reticular structure and adhesive layers 2 provided on both sides of the core layer as a stress buffer layer between semiconductor chip 5 and wiring 4 to lessen a thermal stress generated between the semiconductor device and the package substrate, where a thickness ratio of the core layer 1 to total buffer layer is at least 0.2, the production process can be simplified by using such a buffer layer, thereby improving the mass production capacity and enhancing the package reliability.Type: ApplicationFiled: April 23, 2004Publication date: October 7, 2004Inventors: Masahiko Ogino, Shuji Eguchi, Akira Nagai, Takumi Ueno, Masanori Segawa, Hiroyoshi Kokaku, Toshiaki Ishii, Ichiro Anjoh, Asao Nishimura, Chuichi Miyazaki, Mamoru Mita, Norio Okabe
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Patent number: 6791194Abstract: A semiconductor device having a superior connection reliability is obtained by providing a buffer body for absorbing the difference of thermal expansion between the mounting substrate and the semiconductor element in a semiconductor package structure, even if an organic material is used for mounting substrate. A film material is used as the body for buffering the thermal stress generated by the difference in thermal expansion between the mounting substrate and the semiconductor element. The film material has modulus of elasticity of at least 1 MPa in the reflow temperature range (200-250° C.).Type: GrantFiled: January 28, 2000Date of Patent: September 14, 2004Assignees: Hitachi, Ltd., Hitachi Cable, Ltd.Inventors: Akira Nagai, Shuji Eguchi, Masahiko Ogino, Masanori Segawa, Toshiak Ishii, Nobutake Tsuyuno, Hiroyoshi Kokaku, Rie Hattori, Makoto Morishima, Ichiro Anjoh, Kunihiro Tsubosaki, Chuichi Miyazaki, Makoto Kitano, Mamoru Mita, Norio Okabe
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Publication number: 20040063272Abstract: A semiconductor plastic package, more particularly a preferred package structure and method for making a BGA package. A resin sealed BGA package where a supporting frame which fixedly supports semiconductor parts; i.e., an IC chip, a circuit board, or a circuit film, is sealed with resin, using a mold which is composed of an upper mold half and a lower mold half with the lower mold half having a plurality of projections, one at a position corresponding to each of the external terminals. The mold has a divisional structure which has an air vent between the divisional elements thereof.Type: ApplicationFiled: September 30, 2003Publication date: April 1, 2004Applicant: HITACHI, LTD.Inventors: Shigeharu Tsunoda, Junichi Saeki, Isamu Yoshida, Kazuya Ooji, Michiharu Honda, Makoto Kitano, Nae Yoneda, Shuji Eguchi, Kunihiko Nishi, Ichiro Anjoh, Kenichi Otsuka
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Publication number: 20040061220Abstract: A semiconductor device includes a semiconductor chip formed with connection terminals, an elastic structure interposed between a main surface of the chip and a wiring substrate formed with wirings connected at first ends thereof to the connection terminals, and bump electrodes connected to the other ends of the wirings. The connection terminals may be at a center part or in peripheral part(s) of the chip main surface and both the elastic structure and wiring substrate are not provided at locations of connection terminals. A resin body seals at least the connection terminals and the exposed first ends of wirings (leads). In a scheme in which the connection terminals are located in a peripheral part of the chip main surface, the wiring substrate protrudes beyond the chip boundary where the connection terminals are arranged, and the resin body shape is restricted by the protruding part of the wiring substrate.Type: ApplicationFiled: February 28, 2003Publication date: April 1, 2004Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masnori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe, Takehiro Ohnishi, Noriou Shimada, Shuji Eguchi, Hiroshi Koyama, Akira Nagai, Masahiko Ogino
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Patent number: 6710610Abstract: Electrode pads are formed on a tape circuit to correspond to positions of solder bumps on an IC. A plurality of pins formed on a periphery of the tape circuit provide electrical connection between the tape circuit and a mother socket. An elastomer sheet is provided between a portion of the tape circuit, on which the electrode pads are formed and the IC is mounted, and the mother socket, and a side surface of the sheet, which contacts with the tape circuit, is formed with cut grooves in lattice fashion such that respective centers of the electrode pads substantially coincide with intersections of the grooves.Type: GrantFiled: September 29, 1999Date of Patent: March 23, 2004Assignee: Hitachi, Ltd.Inventors: Naotaka Tanaka, Hiroyuki Ohta, Ichiro Anjoh, Hideo Arima, Akio Hasebe, Kenichi Yamamoto
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Patent number: 6710446Abstract: A semiconductor device and a manufacturing method thereof, which device includes a semiconductor element arranged to form integrated circuitry, a plurality of electrode pads formed on the side of the integrated circuitry formation surface of the semiconductor element, bump electrodes for electrically connecting to the electrode pads through a conductive layer, and a stress relaxation layer formed between the integrated circuitry formation surface and electrode pads on one hand and the bump electrodes and conductive layer on the other hand, the stress relaxation layer being adhered thereto, wherein more than one third of the stress relaxation layer from a surface thereof is cut away for removal and wherein the stress relaxation layer is subdivided into a plurality of regions. Accordingly, it is possible to provide a semiconductor device capable of offering high density mounting schemes with increased reliability while reducing production costs.Type: GrantFiled: May 2, 2002Date of Patent: March 23, 2004Assignee: Renesas Technology CorporationInventors: Akira Nagai, Takumi Ueno, Haruo Akahoshi, Syuji Eguchi, Masahiko Ogino, Toshiya Satoh, Asao Nishimura, Ichiro Anjoh
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Patent number: 6686226Abstract: A semiconductor plastic package, more particularly a preferred package structure and method for making a BGA package. A resin sealed BGA package where a supporting frame which fixedly supports semiconductor parts; i.e., an IC chip, a circuit board, or a circuit film, is sealed with resin, using a mold, which is composed of an upper mold half and a lower mold half with the lower mold half having a plurality of projections, one at a position corresponding to each of the external terminals. The mold has a divisional structure which has an air vent between the divisional elements thereof.Type: GrantFiled: May 2, 2000Date of Patent: February 3, 2004Assignee: Hitachi, Ltd.Inventors: Shigeharu Tsunoda, Junichi Saeki, Isamu Yoshida, Kazuya Ooji, Michiharu Honda, Makoto Kitano, Nae Yoneda, Shuji Eguchi, Kunihiko Nishi, Ichiro Anjoh, Kenichi Otsuka
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Patent number: 6670215Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 30, 2002Date of Patent: December 30, 2003Assignees: Renesas Technology Corporation, Hitachi ULSI Systems Co., Ltd.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Patent number: 6664135Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 30, 2002Date of Patent: December 16, 2003Assignees: Renesas Technology Corporation, Hitachi ULSI Systems Co., Ltd.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Patent number: 6642083Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 30, 2002Date of Patent: November 4, 2003Assignees: Hitachi, Ltd., Hitachi Microcomputer Systems, Ltd., Hitachi ULSI Engineering Corp.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Patent number: 6521981Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 22, 2001Date of Patent: February 18, 2003Assignee: Hitachi, Ltd.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Publication number: 20020158343Abstract: In a semiconductor device having a three-layered buffer layer comprising core layer 1 having interconnected foams such as a three-dimensional reticular structure and adhesive layers 2 proved on both sides of the core layer as a stress buffer layer between semiconductor chip 5 and wiring 4 to lessen a thermal stress generated between the semiconductor device and the package substrate, where a thickness ratio of core layer 1 to total buffer layer is at least 0.2, the production process can be simplified by using such a buffer layer, thereby improving the mass production capacity and enhancing the package reliability.Type: ApplicationFiled: April 30, 2002Publication date: October 31, 2002Inventors: Masahiko Ogino, Shuji Eguchi, Akira Nagai, Takumi Ueno, Masanori Segawa, Hiroyoshi Kokaku, Toshiaki Ishii, Ichiro Anjoh, Asao Nishimura, Chuichi Miyazaki, Mamoru Mita, Norio Okabe
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Publication number: 20020160185Abstract: A semiconductor device having a superior connection reliability is obtained by providing a buffer body for absorbing the difference of thermal expansion between the mounting substrate and the semiconductor element in a semiconductor package structure, even if an organic material is used for the mounting substrate. A film material is used as the body for buffering the thermal stress generated by the difference in thermal expansion between the mounting substrate and the semiconductor element. The film material has modulus of elasticity of at least 1 MPa in the reflow temperature range (200-250° C.).Type: ApplicationFiled: May 6, 2002Publication date: October 31, 2002Inventors: Akira Nagai, Shuji Eguchi, Masahiko Ogino, Masanori Segawa, Toshiak Ishii, Nobutake Tsuyuno, Hiroyoshi Kokaku, Rie Hattori, Makoto Morishima, Ichiro Anjoh, Kunihiro Tsubosaki, Chuichi Miyazaki, Makoto Kitano, Mamoru Mita, Norio Okabe
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Patent number: 6472727Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 30, 2001Date of Patent: October 29, 2002Assignees: Hitachi, Ltd., Hitahi Microcomputer System, Ltd, Hitachi ULSI Engineering Corp.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Patent number: 6465876Abstract: A semiconductor device which can improve the connection reliability of solder bumps and productivity in manufacturing. Insulating tape having wiring patterns on its surface is bond ed to a lead frame. Semiconductor elements are loaded and circuit formed surfaces and sides of the semiconductor elements are sealed with sealing resin. After arrangements of individual semiconductor devices are formed, the lead frame is separated into individual metal plates to form individual semiconductor devices. Such simultaneous production of a plurality of semiconductor devices enhances productivity, and improves flatness of the insulating tape, whereby the connection reliability of solder bumps is improved.Type: GrantFiled: November 19, 1997Date of Patent: October 15, 2002Assignee: Hitachi, Ltd.Inventors: Makoto Kitano, Akihiro Yaguchi, Naotaka Tanaka, Takeshi Terasaki, Ichiro Anjoh, Ryo Haruta, Asao Nishimura, Junichi Saeki
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Publication number: 20020130412Abstract: A semiconductor device and a manufacturing method thereof, which device includes a semiconductor element arranged to form integrated circuitry, a plurality of electrode pads formed on the side of the integrated circuitry formation surface of the semiconductor element, bump electrodes for electrically connecting to the electrode pads through a conductive layer, and a stress relaxation layer formed between the integrated circuitry formation surface and electrode pads on one hand and the bump electrodes and conductive layer on the other hand, the stress relaxation layer being adhered thereto, wherein more than one third of the stress relaxation layer from a surface thereof is cut away for removal and wherein the stress relaxation layer is subdivided into a plurality of regions. Accordingly, it is possible to provide a semiconductor device capable of offering high density mounting schemes with increased reliability while reducing production costs.Type: ApplicationFiled: May 2, 2002Publication date: September 19, 2002Inventors: Akira Nagai, Takumi Ueno, Haruo Akahoshi, Syuji Eguchi, Masahiko Ogino, Toshiya Satoh, Asao Nishimura, Ichiro Anjoh
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Patent number: 6433440Abstract: In a semiconductor device having a three-layered buffer layer comprising core layer 1 having interconnected foams such as a three-dimensional reticular structure and adhesive layers 2 provided on both sides of the core layer as a stress buffer layer between semiconductor chip 5 and wiring 4 to lessen a thermal stress generated between the semiconductor device and the package substrate, where a thickness ratio of core layer 1 to total buffer layer is at least 0.2, the production process can be simplified by using such a buffer layer, thereby improving the mass production capacity and enhancing the package reliability.Type: GrantFiled: June 5, 1998Date of Patent: August 13, 2002Assignees: Hitachi, Ltd., Hitachi Cable, Ltd.Inventors: Masahiko Ogino, Shuji Eguchi, Akira Nagai, Takumi Ueno, Masanori Segawa, Hiroyoshi Kokaku, Toshiaki Ishii, Ichiro Anjoh, Asao Nishimura, Chuichi Miyazaki, Mamoru Mita, Norio Okabe
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Publication number: 20020070461Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: ApplicationFiled: January 30, 2002Publication date: June 13, 2002Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe