Abstract: An optical measuring device includes: an emission device configured to emit a scanning light, of which an optical axis parallelly moves, to an object; a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object; a calculation device configured to calculate, from a voltage wave obtained from time change of an electrical signal that is output by the light receiving element, a distance corresponding to a time range from a first edge with respect to a voltage value where the scanning light is not interrupted by the object and a second edge with respect to a voltage value where the scanning light is interrupted by the object, when a part of the scanning light is interrupted by the object for the time range.

Abstract: An optical measuring device includes: an emission device configured to emit a scanning light, of which an optical axis parallelly moves, to an object; a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object; a calculation device configured to calculate, from a voltage wave obtained from time change of an electrical signal that is output by the light receiving element, a distance corresponding to a time range from a first edge with respect to a voltage value where the scanning light is not interrupted by the object and a second edge with respect to a voltage value where the scanning light is interrupted by the object, when a part of the scanning light is interrupted by the object for the time range.

Abstract: An optical measuring device includes: an emission device configured to emit a scanning light, of which an optical axis parallely moves, to an object; a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object; a calculation device configured to calculate, from a voltage wave obtained from time change of an electrical signal that is output by the light receiving element, a distance corresponding to a time range from a first edge with respect to a voltage value where the scanning light is not interrupted by the object and a second edge with respect to a voltage value where the scanning light is interrupted by the object, when a part of the scanning light is interrupted by the object for the time range.

Abstract: A correction device for an optical measuring apparatus obtains correction data for each scanning position of a light beam from an optical measuring apparatus that includes a light beam scanner which scans with a light beam a measuring region where a measured object is placed, and a light receiver which receives a transmitted light beam from the measuring region. The correction device includes a translucent scale having scale marks arranged at a predetermined pitch, and a support to mount the scale in the measuring region so that an arrangement direction of the scale marks is a scanning direction of the light beam.

Abstract: A shape measuring apparatus includes: an irradiating part configured to irradiate work with a linear line laser, the irradiating part including: a light source configured to produce light; and an optical element configured to linearly spread the light from the light source and generate the line laser, the optical element being constructed rotatably around an optical axis of the line laser; and an imaging part configured to image the line laser reflected by the work.

Abstract: A correction device for an optical measuring apparatus obtains correction data for each scanning position of a light beam from an optical measuring apparatus that includes a light beam scanner which scans with a light beam a measuring region where a measured object is placed, and a light receiver which receives a transmitted light beam from the measuring region. The correction device includes a translucent scale having scale marks arranged at a predetermined pitch, and a support to mount the scale in the measuring region so that an arrangement direction of the scale marks is a scanning direction of the light beam.

Abstract: A shape measuring apparatus includes: an irradiating part configured to irradiate work with a linear line laser, the irradiating part including: a light source configured to produce light; and an optical element configured to linearly spread the light from the light source and generate the line laser, the optical element being constructed rotatably around an optical axis of the line laser; and an imaging part configured to image the line laser reflected by the work.

Abstract: The present invention relates to a manufacturing system which accepts a custom order of product from a customer and custom manufactures a product without sacrificing manufacturing efficiency. The manufacturing system includes the featuring steps of inputting the required specification of a product, creating the product design based on the design information of the product transmitted from a designing department, status data from the production department, and the input required specification, showing the created product design to the customer, selectively indicating a product to be purchased, transmitting the specification of the selected product to the production department, and producing a product based on the selected product specification.

Abstract: A six-degree-of-freedom articulated robot mechanism includes a three-degree-of-freedom translation unit for adjusting the position. The translation unit includes an orientation maintaining mechanism which has a rotation articulation of the direct drive type connecting a drive motor directly to an arm, and a link mechanism. A three-degree-of-freedom rotation unit for adjusting the orientation includes three rotation articulators of the direct drive type connecting a drive motor directly to a table, and the axes of the three rotation articulators intersect one another at one point.

Abstract: A resist layer comprising an organic polymer which is formed by subjecting a methacrylate incorporating fluorine and/or an acrylate incorporating fluorine to a glow-discharge plasma polymerization process.Further, a process for forming resist pattern on the resist layer comprising a step of forming the resist layer; a step of forming a latent image by exposing the resist layer to an electron beam; and a step of visualizing the latent image by plasma etching.