Patents by Inventor Ignacio Lesser

Ignacio Lesser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fault test circuit using launch-off-shift scan
    Patent number: 11016145
    Abstract: An integrated circuit sensor can have a test program generator that is configured to receive a portion of a scan vector, where the scan vector includes a test mode signal and a scan enable signal. The test program generator is configured to retrieve a launch-off-capture test sequence from the scan vector and use the launch-off-capture test sequence and the test mode signal to generate a launch-off-capture test signal. A test signal generator is configured to generate a launch-off-shift test signal using the launch-off-capture test signal and the scan enable signal. A built-in self-test circuit is configured to test the integrated circuit sensor using the launch-off-shift test signal.
    Type: Grant
    Filed: December 19, 2019
    Date of Patent: May 25, 2021
    Assignee: Allegro MicroSystems, LLC
    Inventors: Ignacio Lesser, Nicolas Rigoni, Octavio H. Alpago, Lautaro Casella