Patents by Inventor Ignatius Yeo

Ignatius Yeo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for testing semiconductors for cell to bitline leakage
    Patent number: 5199034
    Abstract: A method of testing for cell to bitline leakage using an improved algorithm is disclosed. A selected portion of the bitlines, both true and complement, are changed. In this manner, the entire memory can be tested without regard to memory size. The prior algorithm used to perform this same function on a megabit dram would take about 570 seconds. The new procedure performs the same function in a more efficient manner, resulting in a test time of approximately 2.8 seconds which is over 200 times faster.
    Type: Grant
    Filed: December 31, 1990
    Date of Patent: March 30, 1993
    Assignee: Texas Instruments Incorporated
    Inventors: Ignatius Yeo, Eileen W. L. Kam