Abstract: A method includes receiving first data at a first I/O module from a second I/O module, where the first data defines a programmable device configuration. The method also includes configuring a programmable device in the first I/O module based on the first data, where the programmable device is associated with a first I/O channel of the first I/O module. The method further includes receiving second data at the first I/O module from the second I/O module, where the second data is associated with a second I/O channel of the second I/O module. In addition, the method includes synchronizing the first I/O channel with the second I/O channel based on the second data.

Abstract: A method includes receiving a first clock signal from a first clock source at a clock monitoring unit. The method also includes counting a first number of pulses in the first clock signal during a specified time period. The method further includes identifying a fault with the first clock source when the first number does not have an acceptable value. In addition, the method includes testing the clock monitoring unit by determining whether the clock monitoring unit identifies an artificial clock fault. The time period could be defined by receiving a second clock signal, counting a second number of pulses in the second clock signal, and signaling when the second number meets or exceeds a threshold value. In response to the identified fault with the first clock source, a second clock source could be used to provide a second clock signal.

Abstract: A method includes receiving first data at a first I/O module from a second I/O module, where the first data defines a programmable device configuration. The method also includes configuring a programmable device in the first I/O module based on the first data, where the programmable device is associated with a first I/O channel of the first I/O module. The method further includes receiving second data at the first I/O module from the second I/O module, where the second data is associated with a second I/O channel of the second I/O module. In addition, the method includes synchronizing the first I/O channel with the second I/O channel based on the second data.

Abstract: A method includes receiving first data at a first I/O module from a second I/O module, where the first data defines a programmable device configuration. The method also includes configuring a programmable device in the first I/O module based on the first data, where the programmable device is associated with a first I/O channel of the first I/O module. The method further includes receiving second data at the first I/O module from the second I/O module, where the second data is associated with a second I/O channel of the second I/O module. In addition, the method includes synchronizing the first I/O channel with the second I/O channel based on the second data.

Abstract: A method includes receiving first data at a first I/O module from a second I/O module, where the first data defines a programmable device configuration. The method also includes configuring a programmable device in the first I/O module based on the first data, where the programmable device is associated with a first I/O channel of the first I/O module. The method further includes receiving second data at the first I/O module from the second I/O module, where the second data is associated with a second I/O channel of the second I/O module. In addition, the method includes synchronizing the first I/O channel with the second I/O channel based on the second data.

Abstract: A method includes receiving a first clock signal from a first clock source at a clock monitoring unit. The method also includes counting a first number of pulses in the first clock signal during a specified time period. The method further includes identifying a fault with the first clock source when the first number does not have an acceptable value. In addition, the method includes testing the clock monitoring unit by determining whether the clock monitoring unit identifies an artificial clock fault. The time period could be defined by receiving a second clock signal, counting a second number of pulses in the second clock signal, and signaling when the second number meets or exceeds a threshold value. In response to the identified fault with the first clock source, a second clock source could be used to provide a second clock signal.