Patents by Inventor Igor Chernushevich
Igor Chernushevich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20210366701Abstract: Systems and methods are disclosed for dynamically switching an ion guide and a TOF mass analyzer between concentrating or not concentrating ions in a targeted acquisition. Product ions are ejected from the ion guide into the TOF mass analyzer and the intensity of a known product ion is measured at two or more time steps. The ion guide initially ejects product ions using a sequential or Zeno pulsing mode that concentrates product ions with different m/z values within the TOF mass analyzer at the same time. If the intensity of the product ion is increasing and greater than a threshold intensity, the ion guide switches to a continuous or normal pulsing mode that does not concentrate ions with different m/z values in the TOF mass analyzer at the same time. Similarly, if the intensity decreases below a threshold in continuous mode, the ion guide switches back to sequential mode.Type: ApplicationFiled: April 10, 2019Publication date: November 25, 2021Inventors: Nic BLOOMFIELD, Igor CHERNUSHEVICH, Robert HAUFLER
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Patent number: 10784098Abstract: Two-channel electrical and photo-electrical TOF ion detection systems are provided. These systems maintain the resolution and dynamic range advantages of four-channel systems but at a lower cost. Electrodes or light pipes are configured to direct electrons or photons produced by ion impacts into two separate channels. The first channel receives electrons or photons resulting from the inner or central part of the rectangular pattern of each ion impact. The second channel receives electrons or photons resulting from the two outer ends of the rectangular pattern of each ion impact. In a two-channel digitizer, the first channel and the second channel are independently calibrated to align the first digital value and the second digital value in time and account for the convex shape of the ion impacts of each ion packet and/or the curvature of a microchannel plate.Type: GrantFiled: March 1, 2018Date of Patent: September 22, 2020Assignee: DH Technologies Development Pte. Ltd.Inventors: Igor Chernushevich, Nic G. Bloomfield
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Publication number: 20200020517Abstract: Two-channel electrical and photo-electrical TOF ion detection systems are provided. These systems maintain the resolution and dynamic range advantages of four-channel systems but at a lower cost. Electrodes or light pipes are configured to direct electrons or photons produced by ion impacts into two separate channels. The first channel receives electrons or photons resulting from the inner or central part of the rectangular pattern of each ion impact. The second channel receives electrons or photons resulting from the two outer ends of the rectangular pattern of each ion impact. In a two-channel digitizer, the first channel and the second channel are independently calibrated to align the first digital value and the second digital value in time and account for the convex shape of the ion impacts of each ion packet and/or the curvature of a microchannel plate.Type: ApplicationFiled: March 1, 2018Publication date: January 16, 2020Inventors: Igor Chernushevich, Nic G. Bloomfield
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Publication number: 20160209361Abstract: Systems and methods are provided for calculating and storing an average amplitude response for each peak of a mass spectrum during data acquisition. A mass analyzer is instructed to analyze N extractions of an ion beam, producing N sub-spectra. For each sub-spectrum of the N sub-spectra, a nonzero amplitude from an ADC detector subsystem is counted as one ion, producing a count of one for each ion. The ADC amplitudes and counts of the N sub-spectra are summed, producing a spectrum that includes a summed ADC amplitude and a total count for each ion. For each ion of the spectrum, an estimated ion count is calculated from a Poisson distribution of the total count of each ion for the N sub-spectra. For each ion of the spectrum, an average amplitude response is calculated by dividing the summed amplitude by the estimated ion count and stored.Type: ApplicationFiled: August 7, 2014Publication date: July 21, 2016Inventors: Nic G. Bloomfield, Alexandre V. Loboda, Igor Chernushevich
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Patent number: 9390238Abstract: In a first location of a mass spectrometer, a plurality of ionized molecules of an ion source are selected that have mass-to-charge ratios within a mass-to-charge ratio window width. The plurality of selected ionized molecules are transmitted from a first to a second location. Reagent ions are transmitted to the second location to reduce a charge state of one or more of the plurality of selected ionized molecules. A mass analyzer is used to analyze the plurality of reduced ionized molecules and produce a mass spectrum. A compound is identified from a peak of the spectrum that has a mass-to-charge ratio less than or equal to the highest mass-to-charge ratio in the window width if the noise is multiply charged and greater than the highest mass-to-charge ratio in the window width if the noise is singly charged.Type: GrantFiled: November 28, 2012Date of Patent: July 12, 2016Assignee: DH Technologies Development Pte. Ltd.Inventors: John Lawrence Campbell, Yves Le Blanc, Alexandre V. Loboda, Igor Chernushevich
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Publication number: 20140357502Abstract: In a first location of a mass spectrometer, a plurality of ionized molecules of an ion source are selected that have mass-to-charge ratios within a mass-to-charge ratio window width. The plurality of selected ionized molecules are transmitted from a first to a second location. Reagent ions are transmitted to the second location to reduce a charge state of one or more of the plurality of selected ionized molecules. A mass analyzer is used to analyze the plurality of reduced ionized molecules and produce a mass spectrum. A compound is identified from a peak of the spectrum that has a mass-to-charge ratio less than or equal to the highest mass-to-charge ratio in the window width if the noise is multiply charged and greater than the highest mass-to-charge ratio in the window width if the noise is singly charged.Type: ApplicationFiled: November 28, 2012Publication date: December 4, 2014Inventors: John Lawrence Campbell, Yves Le Blanc, Alexandre V. Loboda, Igor Chernushevich
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Patent number: 7737396Abstract: In a tandem mass spectrometer using a collision cell for ion fragmentation, the upper limit of the collision energy required for collision induced dissociation (CID) can be extended without reaching or going beyond the upper electrical discharge limit of the system components. The present teachings describe a method of lifting the potential energy of ions to a predetermined level sufficient for CID fragmentation while satisfying a discharge free condition. The present teaching also describes a method of lifting the potential energy of the fragment ions after CID fragmentation so that the product ions have sufficient energy for mass analysis.Type: GrantFiled: January 30, 2009Date of Patent: June 15, 2010Inventors: Igor Chernushevich, Alexandre V. Loboda
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Publication number: 20090189071Abstract: In a tandem mass spectrometer using a collision cell for ion fragmentation, the upper limit of the collision energy required for collision induced dissociation (CID) can be extended without reaching or going beyond the upper electrical discharge limit of the system components. The present teachings describe a method of lifting the potential energy of ions to a predetermined level sufficient for CID fragmentation while satisfying a discharge free condition. The present teaching also describes a method of lifting the potential energy of the fragment ions after CID fragmentation so that the product ions have sufficient energy for mass analysis.Type: ApplicationFiled: January 30, 2009Publication date: July 30, 2009Applicants: MDS Analytical Technologies, a Business Unit of MDS Inc., doing it business through its Sciex Div., Life Technologies Corporation, a Delaware Corp.Inventors: Igor Chernushevich, Alexandre V. Loboda
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Patent number: 7557344Abstract: The applicants' teachings provide methods, systems, and apparatus useful in operating mass spectrometers and other devices incorporating multipole rod sets or other multi-electrode devices to simultaneously contain ions of both positive and negative charges through the simultaneous application to the rods or other electrodes of both radio-frequency (RF) and alternating (AC) currents.Type: GrantFiled: July 9, 2007Date of Patent: July 7, 2009Assignees: MDS Analytical Technologies, a business unit of MDS Inc., Applera CorporationInventors: Igor Chernushevich, Alexandre Loboda
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Patent number: 7504621Abstract: A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.Type: GrantFiled: June 22, 2006Date of Patent: March 17, 2009Assignee: MDS Inc.Inventor: Igor Chernushevich
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Publication number: 20090014645Abstract: The applicants' teachings provide methods, systems, and apparatus useful in operating mass spectrometers and other devices incorporating multipole rod sets or other multi-electrode devices to simultaneously contain ions of both positive and negative charges through the simultaneous application to the rods or other electrodes of both radio-frequency (RF) and alternating (AC) currents.Type: ApplicationFiled: July 9, 2007Publication date: January 15, 2009Inventors: Igor CHERNUSHEVICH, Alexandre LOBODA
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Publication number: 20070057178Abstract: A multi-device interface for use in mass spectrometry for interfacing one or more ion sources to one or more downstream devices. The multi-device interface comprises three or more multipole rod sets configured as either an input rod set or an output rod set depending on potentials applied to the multipole rod sets. The multipole rod sets configured as an input rod set are connectable to the one or more ion sources for receiving generated ions therefrom and sending the ions to at least one multipole rod set configured as an output multipole rod set. The output multipole rod sets are connectable to a downstream device for sending the generated ions thereto. At least two of the multipole rod sets are configured as input rod sets or at least two of the multipole rod sets are configured as output rod sets.Type: ApplicationFiled: September 12, 2005Publication date: March 15, 2007Applicants: MDS Inc., University of ManitobaInventors: Igor Chernushevich, Alexandre Loboda, Bruce Thomson, Andrew Krutchinsky
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Publication number: 20070023645Abstract: A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.Type: ApplicationFiled: June 22, 2006Publication date: February 1, 2007Applicant: MDS Inc., doing business through its MDS Sciex DivisionInventor: Igor Chernushevich
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Patent number: 7126114Abstract: A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.Type: GrantFiled: February 24, 2005Date of Patent: October 24, 2006Assignee: MDS Inc.Inventor: Igor Chernushevich
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Publication number: 20050194531Abstract: A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.Type: ApplicationFiled: February 24, 2005Publication date: September 8, 2005Applicant: MDS Inc., doing business through its MDS Sciex DivisionInventor: Igor Chernushevich
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Patent number: 6507019Abstract: There is provided a method of effecting mass analysis on an ion stream, the method comprising passing the ion stream through a first mass resolving spectrometer, to select parent ions having a first desired mass-to-charge ratio. The parent ions are then subject to collision-induced dissociation (CID) to generate product ions, and the product Ions and any remaining parent ions are trapped the CID and trapping can be carried out together in a linear ion trap. Periodically pulses of the trapped ions are released into a time of flight (TOF) instrument to determine the mass-to-charge ratio of the ions. The delay between the release of the pulses and the initiation of the push-pull pulses of the TOF instrument are adjusted to maximize the duty cycle efficiency and hence the sensitivity for a selected ion with a desired mass-to-charge ratio. This technique can be used to optimize the performance for a parent ion scan, and MRM scan or a neutral loss scan.Type: GrantFiled: May 25, 2001Date of Patent: January 14, 2003Assignee: MDS Inc.Inventors: Igor Chernushevich, Bruce Thomson
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Publication number: 20020030159Abstract: There is provided a method of effecting mass analysis on an ion stream, the method comprising passing the ion stream through a first mass resolving spectrometer, to select parent ions having a first desired mass-to-charge ratio. The parent ions are then subject to collision-induced dissociation (CID) to generate product ions, and the product Ions and any remaining parent ions are trapped the CID and trapping can be carried out together in a linear ion trap. Periodically pulses of the trapped ions are released into a time of flight (TOF) instrument to determine the mass-to-charge ratio of the ions. The delay between the release of the pulses and the initiation of the push-pull pulses of the TOF instrument are adjusted to maximize the duty cycle efficiency and hence the sensitivity for a selected ion with a desired mass-to-charge ratio. This technique can be used to optimize the performance for a parent ion scan, and MRM scan or a neutral loss scan.Type: ApplicationFiled: May 25, 2001Publication date: March 14, 2002Inventors: Igor Chernushevich, Bruce Thomson
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Patent number: 6285027Abstract: There is provided a method of effecting mass analysis on an ion stream, the method comprising passing the ion stream through a first mass resolving spectrometer, to select parent ions having a first desired mass-to-charge ratio. The parent ions are then subject to collision-induced dissociation (CID) to generate fragment ions, and the fragment ions and any remaining parent ions are trapped; the CID and trapping can be carried out together in a linear ion trap. Periodically pulses of the trapped ions are released into a time of flight (TOF) instrument to determine the mass-to-charge ratio of the ions. The delay between the release of the pulses and the initiation of the push-pull pulses of the TOF instrument are adjusted to maximize the duty cycle efficiency and hence the sensitivity for a selected ions with a desired mass-to-charge ratio. This technique can be used to optimize the performance for a parent ion scan, and MRM scan or a neutral loss scan.Type: GrantFiled: May 21, 1999Date of Patent: September 4, 2001Assignee: MDS Inc.Inventors: Igor Chernushevich, Bruce Thomson
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Patent number: 6166378Abstract: A method of improving the signal-to-noise using first and second mass spectrometers in tandem, with an ion detector and data system coupled to the second mass spectrometer, comprising selecting precursor ions with the first mass spectrometer, at least some of the parent ions being multiply charged, colliding or reacting the precursor ions in an intermediate chamber so that multiply charged parent ions produce product ions which have at least one fewer charge than the multiply charged precursor ions, and using the second mass spectrometer or the ion detector and data system to allow only those ions which have an m/z value higher than the multiply charged precursor ions to be recorded for analysis by the ion detector and data system, so that only a signal due to multiply charged precursor ions is obtained in said data system.Type: GrantFiled: May 20, 1998Date of Patent: December 26, 2000Assignee: MDS Inc.Inventors: Bruce Thomson, Igor Chernushevich