Abstract: An arrangement for an inspection of plate-shaped objects moving relative to a camera device in a direction of motion through at least two observation areas. The arrangement includes the camera device which includes one single camera which comprises a matrix sensor, and an image processor. In a first detection state, a first observation area running diagonally opposite to the direction of motion is represented on a first image area of the camera device and is recorded as a strip-shaped image. In a second detection state, a second observation area is represented on a second image area of the camera device and is recorded as a strip-shaped image. The image processor merges the strip-shaped images recorded in the first detection state and in the second detection state to form two-dimensional images. All image areas are located on the matrix sensor.

Abstract: An arrangement for an inspection of plate-shaped objects moving relative to a camera device in a direction of motion through at least two observation areas. The arrangement includes the camera device which includes one single camera which comprises a matrix sensor, and an image processor. In a first detection state, a first observation area running diagonally opposite to the direction of motion is represented on a first image area of the camera device and is recorded as a strip-shaped image. In a second detection state, a second observation area is represented on a second image area of the camera device and is recorded as a strip-shaped image. The image processor merges the strip-shaped images recorded in the first detection state and in the second detection state to form two-dimensional images. All image areas are located on the matrix sensor.

Abstract: A method for the optical inspection of a transparent protective layer and a colored patterned surface which is at least partially covered by the transparent protective layer involves providing a source of illumination and an imaging sensor associated with the source of illumination and illuminating the protective layer with light emitted by the source of illumination in order to recognize defective places inside and beneath the transparent protective layer. The source of illumination emits light in the shortwaved range which is at least partially diffuse and the light striking the surface penetrates at least partially into the protective layer and is scattered at the defective places. Light scattered from the defective places is picked up by the imaging sensor and the defective places are recognized by the local increase in the intensity of the light picked up by the imaging sensor in the area of the defective places.

Abstract: With a method for the optical inspection of a transparent protective layer (14) and of a colored patterned surface, whereby the transparent protective layer (14) at least partially covers the colored patterned surface, and a first source of illumination (40) and an imaging sensor (42) associated with the first source of illumination (40) are provided, the protective layer (14) is illuminated with the light emitted by the source of illumination (40) in order to recognize defective places (30) inside and beneath the transparent protective layer (14). The first source of illumination (40) emits light in the shortwaved visible range and the light striking the surface penetrates at least partially into the protective layer (14) and is scattered at the defective places (30).