Abstract: A system including correction and compensation subsystems is disclosed. The correction subsystem is coupled with a detection objective of an optical microscope of a light sheet microscope. The light sheet microscope includes an illumination source, optical elements, and the detection objective in a detection path of the optical microscope. The illumination source emits light that travels along an illumination path to illuminate a microscopy specimen in the detection path. The optical elements are in the illumination path and at least in part transform the light into a light sheet illuminating the microscopy specimen. The correction subsystem is configured to provide a correction of a spherical aberration using the detection objective.

Abstract: A system for illuminating a microscopy specimen includes an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen. The optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen. The optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes.

Abstract: A system for illuminating a microscopy specimen includes an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen. The optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen. The optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes.

Abstract: A method for viewing a microscopy specimen is described. The method includes receiving a request to change a field of view of an optical microscope system that images the microscopy specimen. In response to the request, a current field of view is automatically changed to a new field of view. Parameters of the optical microscope system are automatically adjusted to align an illumination plane of a light sheet of the optical microscope system and a detection plane of the optical microscope system. The adjustment of parameters to align the illumination plane with the detection plane is based at least on precalibrated parameters that correspond to the new field of view, the illumination path objective, and the detection path objective.

Abstract: A system for illuminating a microscopy specimen includes illumination sources each of which is configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path of each of the illumination sources. The optical elements are configured to at least in part transform the light from each of the illumination sources into a light sheet illuminating the microscopy specimen and to vary a position of a waist of the light sheet from each of the illumination sources that illuminates the microscopy specimen. The optical elements for each of the illumination sources are configured such that the waist of the light sheet from each of the illumination sources are spatially aligned and illuminate a substantially coincident portion of the microscopy specimen.

Abstract: A system for illuminating a microscopy specimen includes an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen. The optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen. The optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes.

Abstract: A system for illuminating a microscopy specimen includes an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen. The optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen. The optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes.

Abstract: A system for illuminating a microscopy specimen includes illumination sources each of which is configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path of each of the illumination sources. The optical elements are configured to at least in part transform the light from each of the illumination sources into a light sheet illuminating the microscopy specimen and to vary a position of a waist of the light sheet from each of the illumination sources that illuminates the microscopy specimen. The optical elements for each of the illumination sources are configured such that the waist of the light sheet from each of the illumination sources are spatially aligned and illuminate a substantially coincident portion of the microscopy specimen.

Abstract: A system for converting a vertical optical microscope unit to provide selective plane illumination microscopy includes an illumination source unit configured to generate a light sheet along a longitudinal axis to illuminate a sample placed in a vertical optical detection axis of the vertical optical microscope unit. The illumination source unit is configured to generate the light sheet along the longitudinal axis that is substantially perpendicular to the vertical optical detection axis of the vertical optical microscope unit. The illumination source unit is configured to produce an excitation at a plane in the sample that generates fluorescent emissions. A detection sensor is placed in a detection optical path of the vertical optical detection axis of the vertical optical microscope unit. The detection sensor is configured to detect the fluorescent emissions to provide selective plane illumination microscopy.

Abstract: A system for holding a sample for a microscope includes a first container with a substantially transparent wall, and a second container formed from a substantially transparent embedding medium molded on a mounting. The second container is configured to enclose the sample and at least a portion of the second container is positioned within the first container. The second container is configured to be rotated at least in part within the first container about a rotational axis and configured to be placed within a detection optical path of an optical detection axis of the microscope.

Abstract: A system for illuminating a microscopy specimen includes an illumination source configured to emit a light that travels along an illumination path to illuminate the microscopy specimen placed on an optical detection path of an optical microscope. The system also includes optical elements in the illumination path and configured to at least in part transform the light from the illumination source into a light sheet illuminating the microscopy specimen. The optical elements include an electronically tunable lens configured to vary a focal distance of the electronically tunable lens to dynamically vary a position of a waist of the light sheet illuminating the microscopy specimen. The optical elements include a deflector configured to vertically move the light sheet to illuminate the microscopy specimen at different horizontal planes.

Abstract: A method of reconstructing a phase of a radiation wave field including determining a representative measure of an intensity variation of the radiation wave field on a selected surface extending globally from one end to another of the radiation wave field, determining a representative measure of the intensity of the radiation wave field on the selected surface, transforming the representative measure of the intensity variation to produce a first representation of integral transform and to apply to the first representation of integral transform a first filter and producing a first representation of modified integral transform, applying a first function of the first representation of integral transform to the first representation of modified integral transform and producing an untransformed representation, applying a correction based on the measure of intensity on the selected surface to the untransformed representation, transforming the untransformed corrected representation to produce a second representation o

Abstract: A method of reconstructing a phase of a radiation wave field including determining a representative measure of an intensity variation of the radiation wave field on a selected surface extending globally from one end to another of the radiation wave field, determining a representative measure of the intensity of the radiation wave field on the selected surface, transforming the representative measure of the intensity variation to produce a first representation of integral transform and to apply to the first representation of integral transform a first filter and producing a first representation of modified integral transform, applying a first function of the first representation of integral transform to the first representation of modified integral transform and producing an untransformed representation, applying a correction based on the measure of intensity on the selected surface to the untransformed representation, transforming the untransformed corrected representation to produce a second representation o

Abstract: The bipolar transistor comprises a collector region (1) of a semiconductor material with a first doping type, an emitter region (2) with a first doping type, and a base region (3) of a semiconductor material with a second doping type, opposite to the first doping type, which base region is arranged between the emitter region (2) and the collector region (1), and a semiconductor area (4) extending between the collector region (1) and the base region (3).