Patents by Inventor Igor Subbotin

Igor Subbotin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11917035
    Abstract: Techniques are described for enabling a cloud-based service to provide rate controls for events to be delivered by the service to event targets. An event bus service, for example, broadly enables users to create and configure event buses that receive events from event sources and from which the event bus service filters, transforms, routes, and delivers events to selected event targets according to configurable rules. A new event egress call pattern is provided that estimates a rate of attempted event traffic to event targets and a rate of successfully delivered event traffic (also referred to as a local rate estimation), and that uses the rate estimations to determine when it may be appropriate to throttle event delivery, thereby reducing stress on downstream systems experiencing capacity issues and potentially reducing a number of event delivery retries to be handled by the event bus service.
    Type: Grant
    Filed: December 15, 2022
    Date of Patent: February 27, 2024
    Assignee: Amazon Technologies, Inc.
    Inventors: Gustavo Soto Ridd, Shawn Patrick Jones, Rishi Baldawa, Nikita Pinski, Asim Himani, Igor Subbotin
  • Patent number: 9781365
    Abstract: A method, apparatus and system that allows for the identification of defective pixels, for example, defective pixel clusters, in an imager device. The method, apparatus and system determine, during use of the imager device, that a pixel defect, e.g., cluster defect, exists and accurately maps the location of the defective pixel. By analyzing more than one frame of an image, the method increases the accuracy of the defect mapping, which is used to improve the quality of the resulting image data.
    Type: Grant
    Filed: October 17, 2013
    Date of Patent: October 3, 2017
    Assignee: Micron Technology, Inc.
    Inventor: Igor Subbotin
  • Patent number: 8934035
    Abstract: An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.
    Type: Grant
    Filed: September 20, 2011
    Date of Patent: January 13, 2015
    Assignee: Micron Technology, Inc.
    Inventors: Dmitri Jerdev, Igor Subbotin, Ilia Ovsiannikov
  • Publication number: 20140043506
    Abstract: A method, apparatus and system that allows for the identification of defective pixels, for example, defective pixel clusters, in an imager device. The method, apparatus and system determine, during use of the imager device, that a pixel defect, e.g., cluster defect, exists and accurately maps the location of the defective pixel. By analyzing more than one frame of an image, the method increases the accuracy of the defect mapping, which is used to improve the quality of the resulting image data.
    Type: Application
    Filed: October 17, 2013
    Publication date: February 13, 2014
    Applicant: MICRON TECHNOLOGY, INC.
    Inventor: Igor Subbotin
  • Patent number: 8582005
    Abstract: A method, apparatus and system that allows for the identification of defective pixels, for example, defective pixel clusters, in an imager device. The method, apparatus and system determine, during use of the imager device, that a pixel defect, e.g., cluster defect, exists and accurately maps the location of the defective pixel. By analyzing more than one frame of an image, the method increases the accuracy of the defect mapping, which is used to improve the quality of the resulting image data.
    Type: Grant
    Filed: March 21, 2011
    Date of Patent: November 12, 2013
    Assignee: Micron Technology, Inc.
    Inventor: Igor Subbotin
  • Patent number: 8300930
    Abstract: A process for performing white balancing of an image is performed by subdividing an image into a plurality of subframes, and then analyzing each subframe to determine if that subframe is predominantly monochromatic other than gray. If so, that subframe is excluded from the computation of the gain adjustments in the white balancing operation. As a result, the white balance process is performed using only the multicolored and/or gray subframes, thus allowing the overall white-balance of the image to be shifted only when a change in the color average is due to a change in the spectra of illumination, and not a presence of large monochromatic areas in the image.
    Type: Grant
    Filed: June 23, 2006
    Date of Patent: October 30, 2012
    Assignee: Micron Technology, Inc.
    Inventors: Michael Kaplinsky, Igor Subbotin
  • Patent number: 8243164
    Abstract: A method, apparatus, and system that use a white balance operation. A selecting process is applied to each pixel selected and considered for automatic white balance statistics to determine the distance from the selected pixel to a white curve defined in a white area corresponding to an image sensor.
    Type: Grant
    Filed: August 25, 2010
    Date of Patent: August 14, 2012
    Assignee: Micron Technology, Inc.
    Inventor: Igor Subbotin
  • Patent number: 8233094
    Abstract: Methods, systems and apparatuses for the detection of motion using statistics data already available within an imager, such as sharpness scores or brightness values. The method includes obtaining at least two sets of statistics data for respective image frames which include corresponding windows; initializing a motion counter; determining, for each window, a relative difference value for the particular window; comparing the relative difference value to a first threshold. If the relative difference value is greater than the first threshold, the method increments the motion counter; and determines if there is motion by comparing the value of the motion counter to a second threshold. The motion detection may further take into account the relative importance of certain areas of the image frame.
    Type: Grant
    Filed: May 24, 2007
    Date of Patent: July 31, 2012
    Assignee: Aptina Imaging Corporation
    Inventors: Igor Subbotin, Alexander Mokhnatyuk
  • Patent number: 8218898
    Abstract: A method of reducing noise in an image including steps for obtaining a first value for a target pixel, obtaining a respective second value for each neighboring pixel surrounding the target pixel and having the same color as the target pixel, for each neighboring pixel, comparing a difference between said first value and said second value to a threshold value, and replacing the first value with an average value obtained from the first value and at all second values from the neighboring pixels which have an associated difference which is less than or equal to the threshold value based on a result of the comparing step.
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: July 10, 2012
    Assignee: Micron Technology, Inc.
    Inventor: Igor Subbotin
  • Patent number: 8212900
    Abstract: A method and apparatus for color plane interpolation are provided which interpolates the color values of pixels differently depending on an edge direction and whether a pixel is at an edge within an image. The use of the edge detection during the interpolation of each of the colors present in the color pattern helps reduce some of the disadvantages of the loss of image sharpness abundant in known demosaicing techniques.
    Type: Grant
    Filed: September 24, 2010
    Date of Patent: July 3, 2012
    Assignee: Micron Technology, Inc.
    Inventor: Igor Subbotin
  • Publication number: 20120008018
    Abstract: An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.
    Type: Application
    Filed: September 20, 2011
    Publication date: January 12, 2012
    Inventors: Dmitri Jerdev, Igor Subbotin, Ilia Ovsiannikov
  • Patent number: 8045040
    Abstract: An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.
    Type: Grant
    Filed: October 5, 2009
    Date of Patent: October 25, 2011
    Assignee: Micron Technology, Inc.
    Inventors: Dmitri Jerdev, Igor Subbotin, Ilia Ovsiannikov
  • Patent number: 8035728
    Abstract: A method and apparatus for applying exposure compensation to an image. Exposure correction limits inclusion of, but does not ignore, image highlights and lowlights.
    Type: Grant
    Filed: June 27, 2008
    Date of Patent: October 11, 2011
    Assignee: Aptina Imaging Corporation
    Inventors: Igor Subbotin, Ilia Ovsiannikov
  • Publication number: 20110193998
    Abstract: A method, apparatus and system that allows for the identification of defective pixels, for example, defective pixel clusters, in an imager device. The method, apparatus and system determine, during use of the imager device, that a pixel defect, e.g., cluster defect, exists and accurately maps the location of the defective pixel. By analyzing more than one frame of an image, the method increases the accuracy of the defect mapping, which is used to improve the quality of the resulting image data.
    Type: Application
    Filed: March 21, 2011
    Publication date: August 11, 2011
    Inventor: Igor Subbotin
  • Patent number: 7973842
    Abstract: The invention provides a new method and apparatus for NTSC and PAL image sensors which employs fusion of adjacent row pixel charge samples to generate image data for a row. A variety of fusion schemes are possible for fusing the pixel signals from the adjacent rows. The rows of pixels are scanned so that each scan takes an odd row signal sample and, in some cases, an adjacent even row signal sample when specified conditions are met. One sampled row of the two adjacent rows integrate an image with a first integration period while the other adjacent row integrates an image with a second integration period.
    Type: Grant
    Filed: April 14, 2008
    Date of Patent: July 5, 2011
    Assignee: Aptina Imaging Corporation
    Inventors: Kwang-Bo Cho, Igor Subbotin, Michael Kaplinsky, Sandor L. Barna, Gary E. Slayton
  • Publication number: 20110149122
    Abstract: A method of reducing noise in an image including steps for obtaining a first value for a target pixel, obtaining a respective second value for each neighboring pixel surrounding the target pixel and having the same color as the target pixel, for each neighboring pixel, comparing a difference between said first value and said second value to a threshold value, and replacing the first value with an average value obtained from the first value and at all second values from the neighboring pixels which have an associated difference which is less than or equal to the threshold value based on a result of the comparing step.
    Type: Application
    Filed: March 4, 2011
    Publication date: June 23, 2011
    Inventor: Igor Subbotin
  • Patent number: 7932938
    Abstract: A method, apparatus and system that allows for the identification of defective pixels, for example, defective pixel clusters, in an imager device. The method, apparatus and system determine, during use of the imager device, that a pixel defect, e.g., cluster defect, exists and accurately maps the location of the defective pixel. By analyzing more than one frame of an image, the method increases the accuracy of the defect mapping, which is used to improve the quality of the resulting image data.
    Type: Grant
    Filed: August 25, 2006
    Date of Patent: April 26, 2011
    Assignee: Micron Technology, Inc.
    Inventor: Igor Subbotin
  • Patent number: 7929798
    Abstract: A method of reducing noise in an image including steps for obtaining a first value for a target pixel, obtaining a respective second value for each neighboring pixel surrounding the target pixel and having the same color as the target pixel, for each neighboring pixel, comparing a difference between said first value and said second value to a threshold value, and replacing the first value with an average value obtained from the first value and at all second values from the neighboring pixels which have an associated difference which is less than or equal to the threshold value based on a result of the comparing step.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: April 19, 2011
    Assignee: Micron Technology, Inc.
    Inventor: Igor Subbotin
  • Patent number: 7893972
    Abstract: An image processing system and method compares each pixel of an image obtained from an image sensor array with at least eight surrounding pixels of the same color in the filter array. If the signal of a given pixel is larger than the respective signals of all eight surrounding pixels of the same color, then the value of that central pixel signal is substituted with the maximum signal value among the surrounding eight pixels of the same color. Similarly, if the signal of a given pixel is smaller than the respective signals of all eight surrounding pixels of the same color, then the value of that central pixel signal is substituted with the minimum signal value among the surrounding eight pixels of the same color.
    Type: Grant
    Filed: November 14, 2006
    Date of Patent: February 22, 2011
    Assignee: Aptina Imaging Corporation
    Inventors: Michael Kaplinsky, Igor Subbotin
  • Publication number: 20110032397
    Abstract: A method and apparatus for color plane interpolation are provided which interpolates the color values of pixels differently depending on an edge direction and whether a pixel is at an edge within an image. The use of the edge detection during the interpolation of each of the colors present in the color pattern helps reduce some of the disadvantages of the loss of image sharpness abundant in known demosaicing techniques.
    Type: Application
    Filed: September 24, 2010
    Publication date: February 10, 2011
    Inventor: Igor Subbotin