Abstract: Inkwells adapted for use in direct-write nanolithography and other applications including use of wells, channels, and posts. The wells can possess a geometry which matches the geometry of tips which are dipped into the inkwells. The channels can be open or closed. Hydrophilicity and hydrophobicity can be used to control ink flow. SEM can be used to characterize the inkwells. Ink flow can be monitored with video. Hydrophobic material layers can be used to prevent cross contamination. Microsyringes can be used to fill reservoirs. Satellite reservoirs can be used to prevent bubble formation.

Abstract: A new type of continuously addressable active material forming linear fibers, woven fabric, or flexible sheets is capable of random read/write access to any location within continuous one-dimensional or two-dimensional range. These materials provide high up to 10 nm spatial resolution of addressing and nanosecond scale access time. They provide new approach for efficient and inexpensive integration of ultra large planar and linear arrays of microstructures.

Abstract: Inkwells adapted for use in direct-write nanolithography and other applications including use of wells, channels, and posts. The wells can possess a geometry which matches the geometry of tips which are dipped into the inkwells. The channels can be open or closed. Hydrophilicity and hydrophobicity can be used to control ink flow. SEM can be used to characterize the inkwells. Ink flow can be monitored with video. Hydrophobic material layers can be used to prevent cross contamination. Microsyringes can be used to fill reservoirs. Satellite reservoirs can be used to prevent bubble formation.

Abstract: Method and apparatus of completely passive and nondestructive monitoring of structural integrity of simple and complex objects. Apparatus is extremely compact, lightweight, inexpensive, and statistically precise and reliable.

Abstract: The invention discloses methods and algorithms that enable precise refinement of current position of active regions of a complex tools with respect to a tool holder, which utilizes simple proximity data and dramatically improve precision of an instrument operations, where in wide range of applications includes nanotechnology, micromechanics, precision manufacturing, etc.

Abstract: Ultra-fast precision motor with X, Y and Theta motion and ultra-fast optical decoding and absolute position detector A high-speed and extremely large range positioning apparatus capable of producing motions in multiple dimensions with high precision and very high reliability. An ultra fast absolute position sensor providing instantaneous position readings with sub nanometer precision on full range of relative positions. A set of optical encoding schemas providing high encoding density and extremely fast decoding regardless of their planar positions.

Abstract: Microfluidic devices and methods for operations on micro through nano-meter scales. Methods of processing, handling and analysis of yocto-liter scale volumes. Methods and devices for single-molecule transports in milli-scale dimensions. Methods of laser propulsion of individual cells and droplets. Methods of packaging and manufacturing of micro and nanofluidic devices. Method of improving dispensing accuracy. Methods of uses and manufacturing of micro-optico-fluidic devices. Bottom up processing method. Ionic particle deflector device. Smart package device and methods for high-throughput synthesis and screening. Methods and devices for controlled refills of micro stamps. Methods and devices for insitu concentration and dilution of micro volumes of solids and liquids. Methods and devices for eliminating undesirable dry outs and evaporation of microscale volumes of fluids.

Abstract: A system and method for aligning prior patterning positions formed by a first SPM tip with a second SPM tip in combination with an SPM system includes identifying first location information that includes a location of the first SPM tip and a sample reference location on an SPM sample and storing the first location information in a storage area. After replacing the first SPM tip with the second SPM tip, second location information, which includes a location of the second SPM tip and the sample reference location on the SPM sample, is identified. Displacement is calculated between the location of the second SPM tip and the first SPM tip based on the first and second location information, and either the second SPM tip or a stage supporting the SPM sample is translated to align the second SPM tip with the location of the first SPM tip in accordance with the calculated displacement.