Patents by Inventor IGOR UMAN

IGOR UMAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260251595
    Abstract: An X-ray fluorescence (XRF) inspection system and method are provided for enhanced detection of light elements in a sample. The system comprises at least one X-ray radiation source configured to emit radiation within a selected energy range, an optical arrangement with one or more reflecting surfaces for filtering and focusing a specific energy band onto an inspection location, and a sample mount for holding the sample. The system is configured to maintain at least one of a vacuum environment or a helium-rich environment along the X-ray path to reduce absorption of low-energy X-rays. In some embodiments, a detector arrangement includes a segmented detector, formed of two or more detection units arranged around the path of the focused radiation, positioned at close proximity to the inspection location. The method includes generating, filtering, and focusing X-ray radiation, providing the controlled environment, and detecting fluorescence emissions for analysis of light elements.
    Type: Application
    Filed: February 19, 2026
    Publication date: August 27, 2026
    Inventors: Kiyoshi OGATA, Markus KUHN, Avishai SHKLAR, Igor UMAN, Daniel Nir BLOCH, Dmitry MILSTEIN, Ariel HILDESHEIM, Licai JIANG, Bonglea KIM, Hideaki Hideaki
  • Patent number: 9012857
    Abstract: An imaging system (100) includes a radiation sensitive detector array (110). The detector array includes at least two scintillator array layers (116). The detector array further includes at least two corresponding photosensor array layers (114). At least one of the at least two photosensor array layers is located between the at least two scintillator array layers in a direction of incoming radiation. The at least one of the at least two photosensor array layers has a thickness that is less than thirty microns.
    Type: Grant
    Filed: May 7, 2012
    Date of Patent: April 21, 2015
    Assignee: Koninklijke Philips N.V.
    Inventors: Simha Levene, Nicolaas Johannes Anthonius Van Veen, Amiaz Altman, Igor Uman, Rafael Goshen
  • Publication number: 20130292574
    Abstract: An imaging system (100) includes a radiation sensitive detector array (110). The detector array includes at least two scintillator array layers (116). The detector array further includes at least two corresponding photosensor array layers (114). At least one of the at least two photosensor array layers is located between the at least two scintillator array layers in a direction of incoming radiation. The at least one of the at least two photosensor array layers has a thickness that is less than thirty microns.
    Type: Application
    Filed: May 7, 2012
    Publication date: November 7, 2013
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: SIMHA LEVENE, NICOLAAS JOHANNES ANTHONIUS VAN VEEN, AMIAZ ALTMAN, IGOR UMAN, RAFAEL GOSHEN