Patents by Inventor Igor Vladimirovich Fomenkov
Igor Vladimirovich Fomenkov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240085796Abstract: An extreme ultraviolet radiation (EUV) source, including: a vessel having an inner vessel wall and an intermediate focus (IF) region; an EUV collector disposed inside the vessel, the EUV collector including a reflective surface configured to reflect EUV radiation toward the intermediate focus region, the reflective surface configured to directionally face the IF region of the vessel; a showerhead disposed along at least a portion of the inner vessel wall, the showerhead including a plurality of nozzles configured to introduce gas into the vessel; and one or more exhausts configured to remove gas introduced into the vessel, the one or more exhausts being oriented along at least a portion of the inner vessel wall so that the gas is caused to flow away from the EUV collector.Type: ApplicationFiled: October 16, 2023Publication date: March 14, 2024Applicant: ASML NETHERLANDS B.V.Inventors: Dzmitry LABETSKI, Christianus Wilhelmus Johannes BERENDSEN, Rui Miguel DUARTE RODRIGUES NUNES, Alexander Igorevich ERSHOV, Kornelis Frits FEENSTRA, Igor Vladimirovich FOMENKOV, Klaus Martin HUMMLER, Arun JOHNKADAKSHAM, Matthias KRAUSHAAR, Andrew David LAFORGE, Marc Guy LANGLOIS, Maksim LOGINOV, Yue MA, Seyedmohammad MOJAB, Kerim NADIR, Alexander SHATALOV, John Tom STEWART, Henricus Gerardus TEGENBOSCH, Chunguang XIA
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Patent number: 11846887Abstract: Degradation of the reflectivity of one or more reflective optical elements in a system for generating EUV radiation is reduced by the controlled introduction of a gas into a vacuum chamber containing the optical element. The gas may be added to the flow of another gas such as hydrogen or alternated with the introduction of hydrogen radicals.Type: GrantFiled: April 7, 2022Date of Patent: December 19, 2023Assignee: ASML Netherlands B.V.Inventors: Yue Ma, Antonius Theodorus Wilhelmus Kempen, Klaus Martin Hummler, Johannes Hubertus Josephina Moors, Jeroen Hubert Rommers, Hubertus Johannes Van De Wiel, Andrew David Laforge, Fernando Brizuela, Rob Carlo Wieggers, Umesh Prasad Gomes, Elena Nedanovska, Celal Korkmaz, Alexander Downn Kim, Rui Miguel Duarte Rodrigues Nunes, Hendrikus Alphonsus Ludovicus Van Dijck, William Peter Van Drent, Peter Gerardus Jonkers, Qiushi Zhu, Parham Yaghoobi, Jan Steven Christiaan Westerlaken, Martinus Hendrikus Antonius Leenders, Alexander Igorevich Ershov, Igor Vladimirovich Fomenkov, Fei Liu, Johannes Henricus Wilhelmus Jacobs, Alexey Sergeevich Kuznetsov
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Patent number: 11822252Abstract: An extreme ultraviolet radiation (EUV) source, including: a vessel having an inner vessel wall and an intermediate focus (IF) region; an EUV collector disposed inside the vessel, the EUV collector including a reflective surface configured to reflect EUV radiation toward the intermediate focus region, the reflective surface configured to directionally face the IF region of the vessel; a showerhead disposed along at least a portion of the inner vessel wall, the showerhead including a plurality of nozzles configured to introduce gas into the vessel; and one or more exhausts configured to remove gas introduced into the vessel, the one or more exhausts being oriented along at least a portion of the inner vessel wall so that the gas is caused to flow away from the EUV collector.Type: GrantFiled: January 22, 2021Date of Patent: November 21, 2023Assignee: ASML NETHERLANDS B.V.Inventors: Dzmitry Labetski, Christianus Wilhelmus Johannes Berendsen, Rui Miguel Duarte Rodreigues Nunes, Alexander Igorevich Ershov, Kornelis Frits Feenstra, Igor Vladimirovich Fomenkov, Klaus Martin Hummler, Arun Johnkadaksham, Matthias Kraushaar, Andrew David Laforge, Marc Guy Langlois, Maksim Loginov, Yue Ma, Seyedmohammad Mojab, Kerim Nadir, Alexander Shatalov, John Tom Stewart, Henricus Gerardus Tegenbosch, Chunguang Xia
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Publication number: 20220291591Abstract: Degradation of the reflectivity of one or more reflective optical elements in a system for generating EUV radiation is reduced by the controlled introduction of a gas into a vacuum chamber containing the optical element. The gas may be added to the flow of another gas such as hydrogen or alternated with the introduction of hydrogen radicals.Type: ApplicationFiled: April 7, 2022Publication date: September 15, 2022Inventors: Yue Ma, Antonius Theodorus Wilhelmus Kempen, Klaus Martin Hummler, Johannes Hubertus Josephina Moors, Jeroen Hubert Rommers, Hubertus Johannes Van De Wiel, Andrew David Laforge, Fernando Brizuela, Rob Carlo Wieggers, Umesh Prasad Gomes, Elena Nedanovska, Celal Korkmaz, Alexander Downn Kim, Rui Miguel Duarte Rodrigues Nunes, Hendrikus Alphonsus Ludovicus Van Dijck, William Peter Van Drent, Peter Gerardus Jonkers, Qiushi Zhu, Parham Yaghoobi, Jan Steven Christiaan Westerlaken, Martinus Hendrikus Antonius Leenders, Alexander Igorevich Ershov, Igor Vladimirovich Fomenkov, Fei Liu, Johannes Henricus Wilhelmus Jacobs, Alexey Sergeevich Kuznetsov
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Publication number: 20220260756Abstract: Provided is an optical element for a lithographic apparatus. The optical element includes a capping layer that includes oxygen vacancies therein. The oxygen vacancies prevent attack of the capping layer by preventing hydrogen and other species from penetrating the capping layer and underlying layers. The capping layer provides a low hydrogen recombination rate enabling hydrogen to clean the surface of the optical element. The capping layer may include an alloyed metal, a mixed metal oxide or a doped metal oxide and it may be a ruthenium capping layer that includes one or more dopants therein.Type: ApplicationFiled: June 26, 2020Publication date: August 18, 2022Inventors: Yue Ma, Marcus Adrianus Van De Kerkhof, Qiushi Zhu, Klaus Martin Hummler, Peter Matthew Mayer, Kay Hoffmann, Andrew David LaForge, Igor Vladimirovich Fomenkov, Daniel John William Brown
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Publication number: 20220192000Abstract: Disclosed is an apparatus and a method in which multiple, e.g., two or more pulses from a single laser source are applied to source material prior to application of a main ionizing pulse in which the multiple pulses are generated by a common laser source. The first pulse is directed towards the source material when the source material is at a first position and the second pulse is directed towards the source material when the source material is at a second position.Type: ApplicationFiled: March 2, 2020Publication date: June 16, 2022Inventors: Igor Vladimirovich Fomenkov, Yezheng Tao, Robert Jay Rafac
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Patent number: 11340532Abstract: Degradation of the reflectivity of one or more reflective optical elements in a system (SO) for generating EUV radiation is reduced by the controlled introduction of a gas into a vacuum chamber (26) containing the optical element. The gas may be added to the flow of another gas such as hydrogen or alternated with the introduction of hydrogen radicals.Type: GrantFiled: February 28, 2019Date of Patent: May 24, 2022Assignee: ASML Netherlands B.V.Inventors: Yue Ma, Antonius Theodorus Wilhelmus Kempen, Klaus Martin Hummler, Johannes Hubertus Josephina Moors, Jeroen Hubert Rommers, Hubertus Johannes Van De Wiel, Andrew David Laforge, Fernando Brizuela, Rob Carlo Wieggers, Umesh Prasad Gomes, Elena Nedanovska, Celal Korkmaz, Alexander Downn Kim, Rui Miguel Duarte Rodrigues Nunes, Hendrikus Alphonsus Ludovicus Van Dijck, William Peter Van Drent, Peter Gerardus Jonkers, Qiushi Zhu, Parham Yaghoobi, Jan Steven Christiaan Westerlaken, Martinus Hendrikus Antonius Leenders, Alexander Igorevich Ershov, Igor Vladimirovich Fomenkov, Fei Liu, Johannes Henricus Wilhelmus Jacobs, Alexey Sergeevich Kuznetsov
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Publication number: 20220151052Abstract: An amplified optical beam is provided to a region that receives a target including target material, an interaction between the amplified optical beam and the target converting at least some of the target material from a first form to a second form to form a light-emitting plasma; first data comprising information related to the amplified optical beam is accessed; second data comprising information related to the light-emitting plasma is accessed; and an amount of the target material converted from the first form to the second form is determined. The determination is based on at least the first data and the second data, and the second form of the target material is less dense than the first form of the target material.Type: ApplicationFiled: January 25, 2022Publication date: May 12, 2022Inventors: Michael Anthony Purvis, Klaus Martin Hummler, Chengyuan Ding, Robert Jay Rafac, Igor Vladimirovich Fomenkov
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Patent number: 11266002Abstract: An amplified optical beam is provided to a region that receives a target including target material, an interaction between the amplified optical beam and the target converting at least some of the target material from a first form to a second form to form a light-emitting plasma; first data comprising information related to the amplified optical beam is accessed; second data comprising information related to the light-emitting plasma is accessed; and an amount of the target material converted from the first form to the second form is determined. The determination is based on at least the first data and the second data, and the second form of the target material is less dense than the first form of the target material.Type: GrantFiled: October 19, 2018Date of Patent: March 1, 2022Assignee: ASML Netherlands B.V.Inventors: Michael Anthony Purvis, Klaus Martin Hummler, Chengyuan Ding, Robert Jay Rafac, Igor Vladimirovich Fomenkov
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Publication number: 20210263422Abstract: Disclosed is a system and method for generating EUV radiation in which a laser is used in a multistage process to illuminate without altering a target material and then irradiate the target material to alter a target material with the illumination stage being used to determine the timing for firing during the irradiation stage or stages.Type: ApplicationFiled: August 12, 2019Publication date: August 26, 2021Inventors: Robert Jay Rafac, Igor Vladimirovich Fomenkov
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Publication number: 20210141311Abstract: An extreme ultraviolet radiation (EUV) source, including: a vessel having an inner vessel wall and an intermediate focus (IF) region; an EUV collector disposed inside the vessel, the EUV collector including a reflective surface configured to reflect EUV radiation toward the intermediate focus region, the reflective surface configured to directionally face the IF region of the vessel; a showerhead disposed along at least a portion of the inner vessel wall, the showerhead including a plurality of nozzles configured to introduce gas into the vessel; and one or more exhausts configured to remove gas introduced into the vessel, the one or more exhausts being oriented along at least a portion of the inner vessel wall so that the gas is caused to flow away from the EUV collector.Type: ApplicationFiled: January 22, 2021Publication date: May 13, 2021Inventors: Dzmitry LABETSKI, Christianus Wilhelmus Johannes BERENDSEN, Rui Miguel DUARTE RODRIGUES NUNES, Alexander Igorevich ERSHOV, Kornelis Frits FEENSTRA, Igor Vladimirovich FOMENKOV, Klaus Martin HUMMLER, Arun JOHNKADAKSHAM, Matthias KRAUSHAAR, Andrew David LAFORGE, Marc Guy LANGLOIS, Maksim LOGINOV, Yue MA, Seyedmohammad MOJAB, Kerim NADIR, Alexander SHATALOV, John Tom STEWART, Henricus Gerardus TEGENBOSCH, Chunguang XIA
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Publication number: 20210109452Abstract: Degradation of the reflectivity of one or more reflective optical elements in a system (SO) for generating EUV radiation is reduced by the controlled introduction of a gas into a vacuum chamber (26) containing the optical element. The gas may be added to the flow of another gas such as hydrogen or alternated with the introduction of hydrogen radicals.Type: ApplicationFiled: February 28, 2019Publication date: April 15, 2021Inventors: Yue Ma, Antonius Theodorus Wilhelmus Kempen, Klaus Martin Hummler, Johannes Hubertus Josephina Moors, Jeroen Hubert Rommers, Hubertus Johannes Van De Wiel, Andrew David Laforge, Fernando Brizuela, Rob Carlo Wieggers, Umesh Prasad Gomes, Elena Nedanovska, Celal Korkmaz, Alexander Downn Kim, Rui Miguel Duarte Rodrigues Nunes, Hendrikus Alphonsus Ludovicus Van Dijck, William Peter Van Drent, Peter Gerardus Jonkers, Qiushi Zhu, Parham Yaghoobi, Jan Steven Christiaan Westerlaken, Martinus Hendrikus Antonius Leenders, Alexander Igorevich Ershov, Igor Vladimirovich Fomenkov, Fei Liu, Johannes Henricus Wilhelmus Jacobs, Alexey Sergeevich Kuznetsov
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Patent number: 10955749Abstract: An extreme ultraviolet radiation (EUV) source, including: a vessel having an inner vessel wall and an intermediate focus (IF) region; an EUV collector disposed inside the vessel, the EUV collector including a reflective surface configured to reflect EUV radiation toward the intermediate focus region, the reflective surface configured to directionally face the IF region of the vessel; a showerhead disposed along at least a portion of the inner vessel wall, the showerhead including a plurality of nozzles configured to introduce gas into the vessel; and one or more exhausts configured to remove gas introduced into the vessel, the one or more exhausts being oriented along at least a portion of the inner vessel wall so that the gas is caused to flow away from the EUV collector.Type: GrantFiled: January 5, 2018Date of Patent: March 23, 2021Assignee: ASML Netherlands B.V.Inventors: Dzmitry Labetski, Christianus Wilhelmus Johannes Berendsen, Rui Miguel Duarte Rodriges Nunes, Alexander Igorevich Ershov, Kornelis Frits Feenstra, Igor Vladimirovich Fomenkov, Klaus Martin Hummler, Arun Johnkadaksham, Matthias Kraushaar, Andrew David Laforge, Marc Guy Langlois, Maksim Loginov, Yue Ma, Seyedmohammad Mojab, Kerim Nadir, Alexander Shatalov, John Tom Stewart, IV, Henricus Gerardus Tegenbosch, Chunguang Xia
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Publication number: 20200344868Abstract: An amplified optical beam is provided to a region that receives a target including target material, an interaction between the amplified optical beam and the target converting at least some of the target material from a first form to a second form to form a light-emitting plasma; first data comprising information related to the amplified optical beam is accessed; second data comprising information related to the light-emitting plasma is accessed; and an amount of the target material converted from the first form to the second form is determined. The determination is based on at least the first data and the second data, and the second form of the target material is less dense than the first form of the target material.Type: ApplicationFiled: October 19, 2018Publication date: October 29, 2020Inventors: Michael Anthony Purvis, Klaus Martin Hummler, Chengyuan Ding, Robert Jay Rafac, Igor Vladimirovich Fomenkov
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Patent number: 10663866Abstract: An optical source for an extreme ultraviolet (EUV) photolithography tool includes a light-generation system including a light-generation module; an optical amplifier including a gain medium associated with a gain band, the gain medium configured to amplify light having a wavelength in the gain band; and a wavelength-based optical filter system on a beam path between the light-generation module and the optical amplifier, the wavelength-based optical filter system including at least one optical element configured to allow light having a wavelength in a first set of wavelengths to propagate on the beam path and to remove light having a wavelength in a second set of wavelengths from the beam path, the first set of wavelengths and the second set of wavelengths including different wavelengths in the gain band of the optical amplifier.Type: GrantFiled: September 20, 2016Date of Patent: May 26, 2020Assignee: ASML Netherlands B.V.Inventors: Alexander Anthony Schafgans, Igor Vladimirovich Fomenkov, Yezheng Tao, Rostislav Rokitski, Robert Jay Rafac, Daniel John William Brown, Cory Alan Stinson
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Publication number: 20200089124Abstract: An extreme ultraviolet radiation (EUV) source, including: a vessel having an inner vessel wall and an intermediate focus (IF) region; an EUV collector disposed inside the vessel, the EUV collector including a reflective surface configured to reflect EUV radiation toward the intermediate focus region, the reflective surface configured to directionally face the IF region of the vessel; a showerhead disposed along at least a portion of the inner vessel wall, the showerhead including a plurality of nozzles configured to introduce gas into the vessel; and one or more exhausts configured to remove gas introduced into the vessel, the one or more exhausts being oriented along at least a portion of the inner vessel wall so that the gas is caused to flow away from the EUV collector.Type: ApplicationFiled: January 5, 2018Publication date: March 19, 2020Applicant: ASML NETHERLANDS B.V.Inventors: Dzmitry LABETSKI, Christianus Wilhelmus Johanne BERENDSEN, Rui Miguel DUARTE RODRIGES NUNES, Alexander Igorevich ERSHOV, Kornelis Frits FEENSTRA, Igor Vladimirovich FOMENKOV, Klaus Martin HUMMLER, Arun JOHNKADAKSHAM, Matthias KRAUSHAAR, Andrew David LAFORGE, Marc Guy LANGLOIS, Maksim LOGINOV, Yue MA, Seyedmohammad MOJAB, Kerim NADIR, Alexander SHATALOV, John Tom STEWART (IV), Henricus Gerardus TEGENBOSCH, Chunguang XIA
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Publication number: 20180081280Abstract: An optical source for an extreme ultraviolet (EUV) photolithography tool includes a light-generation system including a light-generation module; an optical amplifier including a gain medium associated with a gain band, the gain medium configured to amplify light having a wavelength in the gain band; and a wavelength-based optical filter system on a beam path between the light-generation module and the optical amplifier, the wavelength-based optical filter system including at least one optical element configured to allow light having a wavelength in a first set of wavelengths to propagate on the beam path and to remove light having a wavelength in a second set of wavelengths from the beam path, the first set of wavelengths and the second set of wavelengths including different wavelengths in the gain band of the optical amplifier.Type: ApplicationFiled: September 20, 2016Publication date: March 22, 2018Inventors: Alexander Anthony Schafgans, Igor Vladimirovich Fomenkov, Yezheng Tao, Rostislav Rokitski, Robert Jay Rafac, Daniel John William Brown, Cory Alan Stinson
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Patent number: 9462668Abstract: Techniques for forming a target and for producing extreme ultraviolet light include releasing an initial target material toward a target location, the target material including a material that emits extreme ultraviolet (EUV) light when converted to plasma; directing a first amplified light beam toward the initial target material, the first amplified light beam having an energy sufficient to form a collection of pieces of target material from the initial target material, each of the pieces being smaller than the initial target material and being spatially distributed throughout a hemisphere shaped volume; and directing a second amplified light beam toward the collection of pieces to convert the pieces of target material to plasma that emits EUV light.Type: GrantFiled: October 2, 2015Date of Patent: October 4, 2016Assignee: ASML Netherlands B.V.Inventors: Yezheng Tao, Robert Jay Rafac, Igor Vladimirovich Fomenkov, Daniel John William Brown, Daniel James Golich
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Publication number: 20160029471Abstract: Techniques for forming a target and for producing extreme ultraviolet light include releasing an initial target material toward a target location, the target material including a material that emits extreme ultraviolet (EUV) light when converted to plasma; directing a first amplified light beam toward the initial target material, the first amplified light beam having an energy sufficient to form a collection of pieces of target material from the initial target material, each of the pieces being smaller than the initial target material and being spatially distributed throughout a hemisphere shaped volume; and directing a second amplified light beam toward the collection of pieces to convert the pieces of target material to plasma that emits EUV light.Type: ApplicationFiled: October 2, 2015Publication date: January 28, 2016Inventors: Yezheng Tao, Robert Jay Rafac, Igor Vladimirovich Fomenkov, Daniel John William Brown, Daniel James Golich
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Patent number: 5898725Abstract: An excimer laser having reduced spectral bandwidth variation is provided. The laser has an assembly of components comprising a beam expander having at least two prisms that reduces the spectral bandwidth of the laser beam that is passed through the assembly. At least one of the prisms of the beam expander is made of a thermally stable material, wherein the material has an coefficient of absorption of no more than about 0.1 percent/cm for light having the desired wavelength, a rate of change of refractive index with temperature of no more than about 2.3.times.10.sup.-6 .degree.C..sup.-1, a thermal conductivity of at least about 9.71 W/m-.degree.C. at 20 deg C., and/or a coefficient of thermal expansion of at least about 9.times.10.sup.-6 (deg C.).sup.-1. In a preferred embodiment, the stability of beam profile is improved, the variation in spectral bandwidth of the beam from the laser is reduced, the spectral bandwidth itself is also reduced, and the laser exhibits greater voltage stability.Type: GrantFiled: January 21, 1997Date of Patent: April 27, 1999Assignee: Cymer, Inc.Inventors: Igor Vladimirovich Fomenkov, Richard L. Sandstrom