Patents by Inventor Igor Vladimirovich Veryovkin

Igor Vladimirovich Veryovkin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10622203
    Abstract: A mass analyzing apparatus and system are disclosed for time-of-flight (“TOF”) mass spectrometry analysis. A representative system includes a first electrostatic mirror prism to reflect a first ion beam and provide an intermediate ion beam having an intermediate TOF focus and having a spatial dispersion of ions proportional to ion kinetic energies; and a second electrostatic mirror prism to reflect the second ion beam and converge the spatial dispersion of ions to provide a third, recombined ion beam having an output TOF focus; and an ion detector arranged at the output TOF focus to receive and detect the ions of the third ion beam. A bandpass filter may be arranged at the intermediate TOF focus to selectively allow propagation of ions of the second ion beam having a selected range of ion kinetic energies. Configurations having additional electrostatic mirror prisms are disclosed, including for tandem MS-MS and selectable time-of-flight.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: April 14, 2020
    Assignee: THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
    Inventors: Igor Vladimirovich Veryovkin, Luke Hanley
  • Publication number: 20180323053
    Abstract: A mass analyzing apparatus and system are disclosed for time-of-flight (“TOF”) mass spectrometry analysis. A representative system includes a first electrostatic mirror prism to reflect a first ion beam and provide an intermediate ion beam having an intermediate TOF focus and having a spatial dispersion of ions proportional to ion kinetic energies; and a second electrostatic mirror prism to reflect the second ion beam and converge the spatial dispersion of ions to provide a third, recombined ion beam having an output TOF focus; and an ion detector arranged at the output TOF focus to receive and detect the ions of the third ion beam. A bandpass filter may be arranged at the intermediate TOF focus to selectively allow propagation of ions of the second ion beam having a selected range of ion kinetic energies. Configurations having additional electrostatic mirror prisms are disclosed, including for tandem MS-MS and selectable time-of-flight.
    Type: Application
    Filed: November 30, 2016
    Publication date: November 8, 2018
    Inventors: Igor Vladimirovich Veryovkin, Luke Hanley