Patents by Inventor Igor Volfman

Igor Volfman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Performance Analyses of Micromirror Devices
    Publication number: 20090190825
    Abstract: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.
    Type: Application
    Filed: January 26, 2009
    Publication date: July 30, 2009
    Applicant: Texas Instruments Incorporated
    Inventors: Igor Volfman, Andrew Huibers, Satyadev Patel, Peter Richards, Leonid Frenkel, Jim Dunphy, Regis Grasser, Greg Schaadt
  • Characterization of micromirror array devices using interferometers
    Patent number: 7557932
    Abstract: The invention provides a method and apparatus for evaluating the quality of microelectromechanical devices having deformable and deflectable members using resonation techniques. Specifically, product quality characterized in terms of uniformity of the deformable and deflectable elements is inspected with an optical resonance mapping mechanism on a wafer-level.
    Type: Grant
    Filed: April 19, 2005
    Date of Patent: July 7, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Jonathan Doan, Regis Grasser, Satyadev Patel, Andrew Huibers, Igor Volfman
  • Performance analyses of micromirror devices
    Patent number: 7483126
    Abstract: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: January 27, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Igor Volfman, Andrew Huibers, Satyadev Patel, Peter Richards, Leonid Frenkel, Jim Dunphy, Regis Grasser, Greg Schaadt
  • Characterization of micromirror array devices using interferometers
    Publication number: 20060245032
    Abstract: The invention provides a method and apparatus for evaluating the quality of microelectromechanical devices having deformable and deflectable members using resonation techniques. Specifically, product quality characterized in terms of uniformity of the deformable and deflectable elements is inspected with an optical resonance mapping mechanism on a wafer-level.
    Type: Application
    Filed: April 19, 2005
    Publication date: November 2, 2006
    Inventors: Jonathan Doan, Regis Grasser, Satyadev Patel, Andrew Huibers, Igor Volfman
  • Performance analyses of micromirror devices
    Publication number: 20050286045
    Abstract: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.
    Type: Application
    Filed: June 23, 2004
    Publication date: December 29, 2005
    Inventors: Igor Volfman, Andrew Huibers, Satyadev Patel, Peter Richards, Leonid Frenkel, Jim Dunphy, Regis Grasser, Greg Schaadt