Abstract: There is disclosed a substrate including at least one photodetector, the photodetector having a first active area on a first surface of the substrate and a second active area on a second surface of the substrate, wherein the photodetector is provided with a conductive via electrically isolated from the substrate, said conductive via extending through the photodetector from the first surface of the substrate to the second surface of the substrate for connecting the first active area to the second surface of the substrate, the second surface providing electrical connections for the first and second active areas of the photodetector.

Abstract: There is disclosed an imaging system comprising: a first integrated circuit including a photodiode array comprising a plurality of integrating photodiode elements formed in an array of rows and columns, the integrated circuit providing a plurality of output signals corresponding to an output of each photodiode; and a second integrated circuit for receiving as inputs the plurality of output signals from the first integrated circuit and including a plurality of multiplexers corresponding to the number of columns in the array, the outputs signals from a respective column forming inputs to a respective multiplexer, each multiplexer for selectively connecting one of the output signals to a multiplexer output, wherein each multiplexer is selectively switched between the plurality of output signals by a plurality of control lines, the number of control lines corresponding to the number of rows in the array.

Abstract: There is disclosed a photo-detector array including a plurality of sub-arrays of photo-detectors, the photo-detectors of each sub-array being formed on a substrate with an active area of each photo-detector being formed on a surface of the substrate, there further being formed for each photo-detector a conductive via through the substrate from an upper surface thereof to a lower surface thereof to connect the active area of each photo-detector to the lower surface of the substrate, wherein a plurality of said sub-arrays of photo-detectors are placed adjacent to each other in a matrix to form the photo-detector array. An imaging system comprising: a radiation detector including such a photo detector array, a radiation source facing the radiation detector, and means for controlling the radiation detector and the radiation source is also disclosed. A method for making such an array is also disclosed.

Abstract: There is disclosed a substrate including at least one photodetector, the photodetector having a first active area on a first surface of the substrate and a second active area on a second surface of the substrate, wherein the photodetector is provided with a conductive via electrically isolated from the substrate, said conductive via extending through the photodetector from the first surface of the substrate to the second surface of the substrate for connecting the first active area to the second surface of the substrate, the second surface providing electrical connections for the first and second active areas of the photodetector.

Abstract: The invention relates to a method for finding holes, and other related defects and measuring characteristics of sheets of industrial material. Optical detections systems are constantly plagued by intense ambient light and challenged in accuracy. The invention exhibits a defect detection method and means that is resistant to intense ambient light and is capable of inspecting sheets of material (410, 510, 610, 710) continuously, without integration of long periods. In the invention, synchronous detection between the optical transmitters and receivers is utilised. The invention is applicable for inspecting and measuring materials like paper, metal, rubber, plastic, aluminium foil, copper foil, film, coated metal sheet or any other sheet-like material that could run on a production line. The invention is also applicable for finding special defects like holes, pinholes, scratches, spots, cracks, edge faults, streaks, surface faults or any other conceivable defects.

Abstract: A method for finding holes, and other related defects and measuring characteristics of sheets of industrial material. Optical detections systems are constantly plagued by intense ambient light and challenged in accuracy. The invention exhibits a defect detection method and apparatus that is resistant to intense ambient light and is capable of inspecting sheets of material (410, 510, 610, 710) continuously, without integration of long periods. In the invention, synchronous detection between the optical transmitters and receivers is utilized. The invention is applicable for inspecting and measuring materials like paper, metal, rubber, plastic, aluminum foil, copper foil, film, coated metal sheet or any other sheet-like material that could run on a production line. The invention is also applicable for finding special defects like holes, pinholes, scratches, spots, cracks, edge faults, streaks, surface faults or any other conceivable defects.

Abstract: There is disclosed a photo-detector array including a plurality of sub-arrays of photo-detectors, the photo-detectors of each sub-array being formed of: a plurality of anodes formed at a first surface of at least one substrate; a corresponding plurality of cathodes formed at a second surface of at least one substrate; and an electrical interconnection between the plurality of anodes, whereby outputs of the array are provided by the plurality of cathodes, wherein a plurality of said sub-arrays of photo-detectors are placed adjacent to each other in a matrix to form the photo-detector array.

Abstract: There is disclosed a photo-detector array including a plurality of sub-arrays of photo-detectors, the photo-detectors of each sub-array being formed on a substrate with an active area of each photo-detector being formed on a surface of the substrate, there further being formed for each photo-detector a conductive via through the substrate from an upper surface thereof to a lower surface thereof to connect the active area of each photo-detector to the lower surface of the substrate, wherein a plurality of said sub-arrays of photo-detectors are placed adjacent to each other in a matrix to form the photo-detector array. An imaging system comprising: a radiation detector including such a photo detector array, a radiation source facing the radiation detector, and means for controlling the radiation detector and the radiation source is also disclosed. A method for making such an array is also disclosed.

Abstract: There is disclosed a photo-detector array including a plurality of sub-arrays of photo-detectors, the photo-detectors of each sub-array being formed of: a plurality of anodes formed at a first surface of at least one substrate; a corresponding plurality of cathodes formed at a second surface of at least one substrate; and an electrical interconnection between the plurality of anodes, whereby outputs of the array are provided by the plurality of cathodes, wherein a plurality of said sub-arrays of photo-detectors are placed adjacent to each other in a matrix to form the photo-detector array.