Patents by Inventor Ikuo WAKAYAMA

Ikuo WAKAYAMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12174103
    Abstract: Provided are a light scattering measuring apparatus. The light scattering measuring apparatus includes: light sources; a single light receiver; a sample holder including a cell, a frame body, a first opening formed in an incident portion of a first optical path used for forward measurement or side measurement, and a second opening formed in an incident portion of a second optical path used for back measurement, and an optical element; and a moving mechanism. The first optical path and the second optical path are separated from each other in vertical direction. The moving mechanism moves the first opening to a position of the incident portion of the first optical path when the forward or side measurement is to be performed, and to move the second opening to a position of the incident portion of the second optical path when the back measurement is to be performed.
    Type: Grant
    Filed: November 12, 2021
    Date of Patent: December 24, 2024
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventors: Yusuke Izutani, Ikuo Wakayama, Hiroya Nagasawa
  • Patent number: 11953465
    Abstract: To provide a zeta-potential measurement jig which does not require dedicated tools and enables placement of a sample in a cell with simple work. Provided is a zeta-potential measurement jig, to be used for an electrophoretic mobility measuring device, including: a frame body including: a first holding wall and a second holding wall; and a bottom wall; an intermediate block, and a cell retainer, wherein at least one of the first holding wall or the second holding wall has one of a first groove or a first protrusion to be elastically fitted into the first groove, which is configured to support the intermediate block on a lateral side, and wherein the intermediate block has another one of the first groove or the first protrusion.
    Type: Grant
    Filed: April 13, 2021
    Date of Patent: April 9, 2024
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventors: Hiroya Nagasawa, Ikuo Wakayama
  • Patent number: 11598713
    Abstract: Provided are a particle size measurement method, a particle size measurement apparatus, and a particle size measurement program in which a needless measurement time period is omitted by setting an appropriate measurement time period in accordance with a particle size to be measured. The particle size measurement method includes: a test measurement step; an autocorrelation function calculation step; a setting step of setting a part of a plurality of measurement timings set in advance as measurement timings to be used for main measurement, based on a time period required until an autocorrelation function falls below a predetermined threshold value and a preliminary time period set and added to the time period; a main measurement step of measuring a main measurement intensity of scattered light during a main measurement time period; and a particle size calculation step of calculating a particle size of a sample.
    Type: Grant
    Filed: April 2, 2021
    Date of Patent: March 7, 2023
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventor: Ikuo Wakayama
  • Publication number: 20220155203
    Abstract: Provided are a light scattering measuring apparatus. The light scattering measuring apparatus includes: light sources; a single light receiver; a sample holder including a cell, a frame body, a first opening formed in an incident portion of a first optical path used for forward measurement or side measurement, and a second opening formed in an incident portion of a second optical path used for back measurement, and an optical element; and a moving mechanism. The first optical path and the second optical path are separated from each other in vertical direction. The moving mechanism moves the first opening to a position of the incident portion of the first optical path when the forward or side measurement is to be performed, and to move the second opening to a position of the incident portion of the second optical path when the back measurement is to be performed.
    Type: Application
    Filed: November 12, 2021
    Publication date: May 19, 2022
    Inventors: Yusuke IZUTANI, Ikuo WAKAYAMA, Hiroya NAGASAWA
  • Publication number: 20210325340
    Abstract: To provide a zeta-potential measurement jig which does not require dedicated tools and enables placement of a sample in a cell with simple work. Provided is a zeta-potential measurement jig, to be used for an electrophoretic mobility measuring device, including: a frame body including: a first holding wall and a second holding wall; and a bottom wall; an intermediate block, and a cell retainer, wherein at least one of the first holding wall or the second holding wall has one of a first groove or a first protrusion to be elastically fitted into the first groove, which is configured to support the intermediate block on a lateral side, and wherein the intermediate block has another one of the first groove or the first protrusion.
    Type: Application
    Filed: April 13, 2021
    Publication date: October 21, 2021
    Inventors: Hiroya NAGASAWA, Ikuo WAKAYAMA
  • Publication number: 20210310929
    Abstract: Provided are a particle size measurement method, a particle size measurement apparatus, and a particle size measurement program in which a needless measurement time period is omitted by setting an appropriate measurement time period in accordance with a particle size to be measured. The particle size measurement method includes: a test measurement step; an autocorrelation function calculation step; a setting step of setting a part of a plurality of measurement timings set in advance as measurement timings to be used for main measurement, based on a time period required until an autocorrelation function falls below a predetermined threshold value and a preliminary time period set and added to the time period; a main measurement step of measuring a main measurement intensity of scattered light during a main measurement time period; and a particle size calculation step of calculating a particle size of a sample.
    Type: Application
    Filed: April 2, 2021
    Publication date: October 7, 2021
    Inventor: Ikuo WAKAYAMA
  • Patent number: 10788412
    Abstract: An optical measurement apparatus includes a main body base, an optical base movably combined with the main body base, a measurement optical system fixed to the optical base, and an optical base moving mechanism which moves the optical base relative to the main body base. The optical base moving mechanism moves the optical base relative to the main body base between an internal measurement position and an external measurement position. A measurement object position of the measurement optical system coincides with an internal measurement object position within the main body base. The measurement object position of the measurement optical system coincides with an external measurement object position outside the main body base.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: September 29, 2020
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventors: Yusuke Izutani, Ikuo Wakayama
  • Publication number: 20190011351
    Abstract: An optical measurement apparatus includes a main body base, an optical base movably combined with the main body base, a measurement optical system fixed to the optical base, and an optical base moving mechanism which moves the optical base relative to the main body base. The optical base moving mechanism moves the optical base relative to the main body base between an internal measurement position and an external measurement position. A measurement object position of the measurement optical system coincides with an internal measurement object position within the main body base. The measurement object position of the measurement optical system coincides with an external measurement object position outside the main body base.
    Type: Application
    Filed: June 22, 2018
    Publication date: January 10, 2019
    Inventors: Yusuke IZUTANI, Ikuo WAKAYAMA
  • Patent number: D869310
    Type: Grant
    Filed: March 21, 2018
    Date of Patent: December 10, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hiroya Nagasawa, Ikuo Wakayama, Kazuyoshi Kamekawa
  • Patent number: D962096
    Type: Grant
    Filed: August 18, 2020
    Date of Patent: August 30, 2022
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Sayaka Obana, Toru Takegawa, Hiroya Nagasawa, Ikuo Wakayama, Minoru Suzuki