Abstract: A thermistor sintered body has a thickness in a range of 1 ?m to 100 ?m and an area in a range of 1 mm2 to 10 mm2, and is composed of a single body of a sintered body having a composition of NiMn2O4. This thermistor sintered body can be manufactured by a first step of dropping a raw material liquid RL onto a surface of a substrate rotatably supported, a second step of rotating the substrate with the dropped raw material liquid RL and spreading the raw material liquid RL, a third step of forming a sintered body having the composition of NiMn2O4 on the surface of the substrate by heating and holding the raw material liquid RL and the substrate on which the raw material liquid RL has been placed, and a fourth step of separating the sintered body from the substrate.

Abstract: The present invention relates to a chemical reaction processing method for producing and analyzing a plurality of samples, including a measuring and mixing step of producing the samples in different mixing ratios by mixing raw inorganic materials and of arranging the samples in predetermined quantities on a reaction tray, a flattening step of flattening surfaces of the samples on the reaction tray, a heat treating step of heat-treating the samples on the reaction tray all at once, an X-ray diffraction measurement step of sequentially performing the X-ray diffraction measurement on the samples on the reaction tray, and an analyzing step of analyzing measurement results obtained in the X-ray diffraction measurement step.

Abstract: The present invention relates to a chemical reaction processing apparatus for producing and analyzing a plurality of samples, including a measuring and mixing section for producing the samples in different mixing ratios by mixing raw inorganic materials and for arranging the samples in predetermined quantities on a reaction tray, a heating apparatus section for heat-treating the samples on the reaction tray all at once, an X-ray diffracting apparatus section for sequentially performing the X-ray diffraction measurement on the samples on the reaction tray, and a collating and analyzing apparatus section for analyzing measurement results obtained in the X-ray diffraction apparatus section.