Abstract: In one embodiment, a video display system employs an array of ribbon light modulators having a reflective surface configured to reflect or diffract a beam. The beam may have a wavelength suitable for displaying a video image. The reflective surface may comprise an aluminum alloy suitable for receiving the beam, which may have a relatively high power density. In one embodiment, a method of displaying a video image comprises impinging a beam on a portion of a reflective surface of a light modulator. The beam may have a wavelength suitable for displaying a video image, and the reflective surface may comprise an aluminum alloy.

Abstract: Techniques for determining large deformation of layered or graded structures to include effects of body forces such as gravity, electrostatic or electromagnetic forces, and other forces that uniformly distribute over the structures, support forces, and concentrated forces. A real-time stress monitoring system is also disclosed to provide in-situ monitoring of a device based on the large deformation analytical approach. A coherent gradient sensing module, for example, may be included in such a system.

Abstract: In one embodiment, a video display system employs an array of ribbon light modulators having a reflective surface configured to reflect or diffract a beam. The beam may have a wavelength suitable for displaying a video image. The reflective surface may comprise an aluminum alloy suitable for receiving the beam, which may have a relatively high power density. In one embodiment, a method of displaying a video image comprises impinging a beam on a portion of a reflective surface of a light modulator. The beam may have a wavelength suitable for displaying a video image, and the reflective surface may comprise an aluminum alloy.

Abstract: The current invention is directed to devices and systems with patterned reflective surfaces. The reflective surfaces are patterned with primary reflective regions and gap regions. The gap regions provide for separation between reflective material within adjacent primary reflective regions. The separation between reflective material reduces atomic flux which can lead to the depletion of the reflective material within regions of the reflective surface that are exposed to an intense light source. The primary reflective regions are preferably formed from a reflective material such as aluminum, silver, gold or platinum. The gap regions are left vacant or deposited with second material which is non-reflective, reflective or semi-reflective. The patterned reflective surface is preferably formed on a micro-structure, such an elongated ribbon. The patterned ribbon structure is preferably one of a plurality patterned ribbon structures in a grating light valve device.

Abstract: Techniques for determining large deformation of layered or graded structures to include effects of body forces such as gravity, electrostatic or electromagnetic forces, and other forces that uniformly distribute over the structures, support forces, and concentrated forces. A real-time stress monitoring system is also disclosed to provide in-situ monitoring of a device based on the large deformation analytical approach. A coherent gradient sensing module, for example, may be included in such a system.

Abstract: The current invention is directed to devices and systems with patterned reflective surfaces. The reflective surfaces are patterned with primary reflective regions and gap regions. The gap regions provide for separation between reflective material within adjacent primary reflective regions. The separation between reflective material reduces atomic flux which can lead to the depletion of the reflective material within regions of the reflective surface that are exposed to an intense light source. The primary reflective regions are preferably formed from a reflective material such as aluminum, silver, gold or platinum. The gap regions are left vacant or deposited with second material which is non-reflective, reflective or semi-reflective. The patterned reflective surface is preferably formed on a micro-structure, such an elongated ribbon. The patterned ribbon structure is preferably one of a plurality patterned ribbon structures in a grating light valve device.

Abstract: An apparatus and a method for measuring the radius of curvature of a surface using a laser beam with a wavelength selectable from a plurality wavelengths are disclosed. The present invention avoids poor measurement due to destructive interference of the beams reflected at a thin film's upper and lower surfaces. The present invention is applicable to laser reflection stress measurement apparatuses of both scanning and beam-splitting types.

Abstract: In accordance with the present invention, an apparatus and a method for measuring the radius of curvature of a surface using laser beams of multiple wavelengths are provided. The present invention avoids poor measurement due to destructive interference of the beams reflected at a thin film's upper and lower surfaces. The present invention is applicable to laser reflection stress measurement apparatuses of both scanning and beam-splitting types.

Abstract: A memory matrix comprises a plurality of word lines, a plurality of bit lines, and a stacked diode and voltage-variable resistor structure interconnecting bit lines to word lines. The stacked diode and voltage-variable resistor structure includes a doped region in a semiconductor substrate defining a work line, a doped polycrystalline silicon layer over said word line and forming a p-n junction therewith, and an amorphized region in the doped polycrystalline silicon layer having increased resistance over the non-amorphized portion of the doped polycrystalline silicon layer. A contact is made to the amorphized polycrystalline silicon material which preferably includes a titanium-tungsten barrier layer and an aluminum layer over the barrier layer.

Abstract: A voltage-programmable device in which the programming voltage V.sub.p and the "off" resistance R.sub.i are separately controlled. The device includes a body of semiconductor material having a doped region therein, and an amorphized layer in the doped region and abutting a surface, and a surface layer in the amorphized layer with the surface layer having a resistivity higher than the resistivity of the amorphized layer prior ot programming of the device. The surface layer has a miniscule thickness (on the order of 50-150 Angstroms) and does not affect the programming of the device. Moreover, the final resistance of the programmed device is not significantly affected by the presence of the first layer. The amorphized layer is formed by ion implantation, and the or by oxygen plasma treatment.

Abstract: An electrically programmable element is fabricated in a P-N junction isolated region of a semiconductor body by first extending the depth of the region in the body by introducing dopants through the region into the body by ion implantation or by diffusion and drive-in, and thereafter forming an amorphotized layer in the first region overlying the extended portion. The increased depth of the first region provided by the second region prevents damage to the P-N junction between the semiconductor body and the first region during formation of the amorphotized layer.