Patents by Inventor Ilana Grimberg

Ilana Grimberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8319978
    Abstract: A method for analyzing probe mark, the method includes: scanning the probe mark by multiple spots; evaluating a probe mark characteristic in response to detection signals generated by multiple sensors of the chromatic confocal system that is characterized by a sub-micron axial resolution.
    Type: Grant
    Filed: July 10, 2007
    Date of Patent: November 27, 2012
    Assignee: Camtek Ltd.
    Inventors: Meir Ben-Levi, Ilana Grimberg
  • Publication number: 20110184694
    Abstract: A method for measuring a depth of a narrow hole, the method includes: obtaining from a chromatic confocal sensor a group of height measurements taken along an imaginary line that crosses the narrow hole; ignoring height measurements attributed to optical artifacts and blind measurement points and calculating an inverted parabolic estimate of a sub-group of the height measurements; wherein a top of the parabolic estimate is representative of a height of a bottom of the narrow hole.
    Type: Application
    Filed: August 18, 2008
    Publication date: July 28, 2011
    Applicant: CAMTEK LTD.
    Inventors: Ilana Grimberg, Michael Bloomhill, Shimon Koren
  • Publication number: 20100171962
    Abstract: A method for analyzing probe mark, the method includes: scanning the probe mark by multiple spots; evaluating a probe mark characteristic in response to detection signals generated by multiple sensors of the chromatic confocal system that is characterized by a sub-micron axial resolution.
    Type: Application
    Filed: July 10, 2007
    Publication date: July 8, 2010
    Inventors: Meir Ben-Levi, Ilana Grimberg