Abstract: An electromagnetic sensor for use in a variety of applications requiring extremely high sensitivity, such as measuring power and characteristics of incident electromagnetic radiation includes a superconducting layer that carries an exchange field for providing a spin splitting effect of charge carriers in the superconducting layer, a metal electrode, and an insulating layer arranged between the superconducting layer and metal electrode to form a spin filter junction therebetween. The electromagnetic sensor provides an antenna including a wave collecting element, in contact with the superconducting layer to convey thereinto external electromagnetic waves that are generated by an external source.

Abstract: An electromagnetic sensor for use in a variety of applications requiring extremely high sensitivity, such as measuring power and characteristics of incident electromagnetic radiation includes a superconducting layer that carries an exchange field for providing a spin splitting effect of charge carriers in the superconducting layer, a metal electrode, and an insulating layer arranged between the superconducting layer and metal electrode to form a spin filter junction therebetween. The electromagnetic sensor provides an antenna including a wave collecting element, in contact with the superconducting layer to convey thereinto external electromagnetic waves that are generated by an external source.

Abstract: An x-ray spectrometer includes: an x-ray plasma source that produces first x-rays; an x-ray optic in optical communication with the x-ray plasma source and that: receives the first x-rays from the x-ray plasma source; focuses the first x-rays to produce second x-rays; and communicates the second x-rays to a sample that produces product x-rays in response to receipt of the second x-rays and second light; and a microcalorimeter array detector in optical communication with the sample and that receives the product x-rays from the sample.

Abstract: An x-ray spectrometer includes: an x-ray plasma source that produces first x-rays; an x-ray optic in optical communication with the x-ray plasma source and that: receives the first x-rays from the x-ray plasma source; focuses the first x-rays to produce second x-rays; and communicates the second x-rays to a sample that produces product x-rays in response to receipt of the second x-rays and second light; and a microcalorimeter array detector in optical communication with the sample and that receives the product x-rays from the sample.

Abstract: The present invention provides a method for determining radioactivity in an ion-sensitive field effect transistor array, the method comprising the steps of incubating the array with electron-sensitive silver-halide material and then incubating the array with a developer solution reducing the silver halides that have been exposed to radioactivity to elemental silver and simultaneously measuring pH at each separate reaction chambers, wherein decrease of the pH indicates the presence of radioactivity in a reaction chamber.