Patents by Inventor Ilhan Hatirnaz

Ilhan Hatirnaz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10825486
    Abstract: A power control system, method, and architecture are disclosed for a multi-bank memory which provides independent, concurrent memory access to at least one memory block in each memory bank by using observation circuits to monitor bus masters connected over bus master interface signals to an interconnect for memory access requests to the multi-bank memory and to provide notifications to a power control circuitry that a valid memory access request was issued by a bus master over the bus master interface, where the power control circuitry processes the notifications received from each observation circuit and generates therefrom power control signals that are provided directly to each memory block and to bypass the interconnect, thereby separately controlling a power state for each memory block with power-up control signals that arrive at each memory block at or before a memory access request sent over the interconnect.
    Type: Grant
    Filed: April 9, 2018
    Date of Patent: November 3, 2020
    Assignee: NXP USA, Inc.
    Inventors: Michael Rohleder, David A. Brown, Peter M. Ippolito, Ilhan Hatirnaz
  • Publication number: 20190311748
    Abstract: A power control system, method, and architecture are disclosed for a multi-bank memory which provides independent, concurrent memory access to at least one memory block in each memory bank by using observation circuits to monitor bus masters connected over bus master interface signals to an interconnect for memory access requests to the multi-bank memory and to provide notifications to a power control circuitry that a valid memory access request was issued by a bus master over the bus master interface, where the power control circuitry processes the notifications received from each observation circuit and generates therefrom power control signals that are provided directly to each memory block and to bypass the interconnect, thereby separately controlling a power state for each memory block with power-up control signals that arrive at each memory block at or before a memory access request sent over the interconnect.
    Type: Application
    Filed: April 9, 2018
    Publication date: October 10, 2019
    Applicant: NXP USA, Inc.
    Inventors: Michael Rohleder, David A. Brown, Peter M. Ippolito, Ilhan Hatirnaz
  • Patent number: 10243559
    Abstract: The disclosure relates to an integrated circuit comprising: a first voltage terminal; a second voltage terminal; and a plurality of logic cells, comprising one or more field effect transistors having a p-type channel and one or more field effect transistors having an n-type channel. The plurality of logic cells comprises a regular subset of cells and a spare subset of cells. Electrical connectors are arranged to: connect the gates of the regular subset of cells in order to provide a functional logic arrangement; connect the gates of the one or more field effect transistors having a p-type channel of the spare subset of cells to the first voltage terminal; and connect the gates of the one or more field effect transistors having an n-type channel of the spare subset of cells to the second voltage terminal.
    Type: Grant
    Filed: March 17, 2017
    Date of Patent: March 26, 2019
    Assignee: NXP USA, Inc.
    Inventors: Andreas Stahl, Hubert Martin Bode, Ilhan Hatirnaz
  • Publication number: 20170331478
    Abstract: The disclosure relates to an integrated circuit comprising: a first voltage terminal; a second voltage terminal; and a plurality of logic cells, comprising one or more field effect transistors having a p-type channel and one or more field effect transistors having an n-type channel. The plurality of logic cells comprises a regular subset of cells and a spare subset of cells. Electrical connectors are arranged to: connect the gates of the regular subset of cells in order to provide a functional logic arrangement; connect the gates of the one or more field effect transistors having a p-type channel of the spare subset of cells to the first voltage terminal; and connect the gates of the one or more field effect transistors having an n-type channel of the spare subset of cells to the second voltage terminal.
    Type: Application
    Filed: March 17, 2017
    Publication date: November 16, 2017
    Inventors: Andreas STAHL, Hubert Martin BODE, Ilhan HATIRNAZ
  • Publication number: 20170179049
    Abstract: A semiconductor apparatus for power distribution on a die, the semiconductor apparatus, comprising a first die, wherein the first die comprises a first integrated circuit, a dam coupled to the first die, wherein the dam is a metal ring, a second die, wherein the second die comprises a second integrated circuit, wherein the first and second dies are stacked together and are electrically connected, and a pair of metal connectors coupled to the dam and an edge of the first die, wherein power and ground wires are coupled to the dam, wherein the power transmitted through the power and ground wires is distributed through the dam and metal connectors to the first die and wherein the power transmitted to the first die is distributed to the to the second die.
    Type: Application
    Filed: December 16, 2015
    Publication date: June 22, 2017
    Inventors: Thomas KOCH, Ilhan HATIRNAZ, Michael ROHLEDER
  • Patent number: 9244123
    Abstract: A synchronous circuit comprises a functional circuitry and one or more validation circuits for validating synchronization of the functional circuitry. The functional and the validation circuits are clocked by a clock source. Each validation circuit comprises a clock distribution network, a test signal generator, a capture cell, a test signal path from the test signal generator to the capture cell, and a verification unit. The clock distribution network applies a launch clock signal at the test signal generator and a capture clock signal at the capture cell. The test signal generator produces a bi-level test signal. The test signal path transmits the test signal to the capture cell, which generates a proof sequence by sampling the test signal. The verification unit determines whether the proof sequence is identical to the test sequence. A method of designing a synchronous circuit and method of validating a synchronous circuit are also described.
    Type: Grant
    Filed: November 25, 2014
    Date of Patent: January 26, 2016
    Assignee: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Thomas Koch, Ilhan Hatirnaz, Michael Rohleder