Abstract: Systems and methods for transition delay measuring are presented. A transition delay measuring method can include oscillating a signal between states and tracking an indication associated with an isolated attribute of the transitions between the states. Oscillations can include asymmetric transitions between the states and the tracked isolated attribute can be a delay in completing transitions between the states in one direction or vice versa. The asymmetric transitions can include transitions between the first state and the second state that are faster than slower transitions between the second state and the first state or vice versa. The tracked indication can be utilized in analysis of the isolated transition delay characteristics. The results can be utilized in analysis of various further features and characteristics (e.g., examination of leakage current related power consumption, timing of asymmetric operation, etc.). The analysis can include examination of fabrication process and operating parameters.

Abstract: A flip-flop circuit may include a master latch and a slave latch. Each latch may have a transparent mode and a storage mode. The slave latch may be in storage mode when the master latch is in transparent mode; and vice-versa. A clock signal may control the mode of each latch through a pair of clock-gated pull-up transistors and a pair clock-gated of pull-down transistors, for a total of four clock-gated transistors. The clock-gated transistors may be shared by the master latch and the slave latch. Fewer clock-gated transistors may be required when they are shared, as opposed to not being shared. Clock-gated transistors may have parasitic capacitance and consume power when subjected to a varying clock signal, due to the charging and discharging of the parasitic capacitance. Having fewer clock-gated transistors thus may reduce the power consumed by the flip-flop circuit.

Abstract: A clock gating latch, a method of gating a clock signal and an integrating circuit incorporating the clock gating latch or the method. In one embodiment, the clock gating latch includes: (1) a propagation circuit having a single, first switch configured to be driven by an input clock signal, (2) a keeper circuit coupled to the propagation circuit and having a single, first switch configured to be driven by the input clock signal and (3) an AND gate coupled to the propagation circuit and the keeper circuit and having an internal node coupled to a second switch in the propagation circuit and a second switch in the keeper circuit.

Abstract: One embodiment of the present invention sets forth a technique for capturing and holding a level of an input signal using a latch circuit that presents a low number of loads to the clock signal. The clock is only coupled to a bridging transistor and a pair of clock-activated pull-down or pull-up transistors. The level of the input signal is propagated to the output signal when the storage sub-circuit is not enabled. The storage sub-circuit is enabled by the bridging transistor and a propagation sub-circuit is activated and deactivated by the pair of clock-activated transistors.

Abstract: Systems and methods for latches are presented. In one embodiment a system includes scan in propagation component, data propagation component, and control component. The scan in propagation component is operable to select between a scan in value and a recirculation value. The data propagation component is operable to select between a data value and results forwarded from the scan in propagation component, wherein results of the data propagation component are forwarded as the recirculation value to the scan in propagation component. The control component is operable to control an indication of a selection by the scan in propagation component and the data propagation component.

Abstract: A clock gating latch, a method of gating a clock signal and an integrating circuit incorporating the clock gating latch or the method. In one embodiment, the clock gating latch includes: (1) a propagation circuit having a single, first switch configured to be driven by an input clock signal, (2) a keeper circuit coupled to the propagation circuit and having a single, first switch configured to be driven by the input clock signal and (3) an AND gate coupled to the propagation circuit and the keeper circuit and having an internal node coupled to a second switch in the propagation circuit and a second switch in the keeper circuit.

Abstract: One embodiment of the present invention sets forth a technique for capturing and holding a level of an input signal using a latch circuit that presents a low number of loads to the clock signal. The clock is only coupled to a bridging transistor and a pair of clock-activated pull-down or pull-up transistors. The level of the input signal is propagated to the output signal when the storage sub-circuit is not enabled. The storage sub-circuit is enabled by the bridging transistor and a propagation sub-circuit is activated and deactivated by the pair of clock-activated transistors.

Abstract: Leakage inversion systems and methods are described. A leakage inverter can be configured to transition a signal, wherein a leakage characteristic impacts a transition of the signal. The leakage inverter can be included in an oscillating ring path that outputs an indication of the impacts the leakage characteristic has on a transition of a signal. A leakage inverter can include a leakage transistor coupled in series between a pull up transistor and a pull down transistor, wherein leakage in the leakage transistor impacts at least one transition of the signal. A pull down transition delay can be asymmetric (e.g., fast/slow, short/long, etc.) with respect to a pull up transition delay. Asymmetry can be associated with an effect of the leakage current on a transition of the signal. Results can be utilized in a variety of different analysis (e.g., analyze manufacturing process compliance and defects, leakage current power consumption, etc.).

Abstract: Systems and methods for transition delay measuring are presented. A transition delay measuring method can include oscillating a signal between states and tracking an indication associated with an isolated attribute of the transitions between the states. Oscillations can include asymmetric transitions between the states and the tracked isolated attribute can be a delay in completing transitions between the states in one direction or vice versa. The asymmetric transitions can include transitions between the first state and the second state that are faster than slower transitions between the second state and the first state or vice versa. The tracked indication can be utilized in analysis of the isolated transition delay characteristics. The results can be utilized in analysis of various further features and characteristics (e.g., examination of leakage current related power consumption, timing of asymmetric operation, etc.). The analysis can include examination of fabrication process and operating parameters.

Abstract: A method, in one embodiment, can include modeling and calibrating two types of sensors that are part of a semiconductor device. In addition, the method can include determining a temperature and voltage based on data received from the two sensors.

Abstract: The described systems and methods can facilitate examination of device parameters including analysis of relatively dominant characteristic impacts on delays. In one embodiment, at least some coupling components (e.g., metal layer wires, traces, lines, etc.) have a relatively dominate impact on delays and the delay is in part a function of both capacitance and resistance of the coupling component. In one embodiment, a system comprises a plurality of dominate characteristic oscillating rings, wherein each respective one of the plurality of dominate characteristic oscillating rings includes a respective dominate characteristic. Additional analysis can be performed correlating the dominate characteristic delay impact results with device fabrication and operation.

Abstract: One embodiment of the present invention sets forth a technique for capturing and holding a level of an input signal using a latch circuit that presents a low number of loads to the clock signal. The clock is only coupled to a bridging transistor and a pair of clock-activated pull-down or pull-up transistors. The level of the input signal is propagated to the output signal when the storage sub-circuit is not enabled. The storage sub-circuit is enabled by the bridging transistor and a propagation sub-circuit is activated and deactivated by the pair of clock-activated transistors.

Abstract: Component characteristics analysis systems and methods are described. In one embodiment, a ring oscillator comprises: at least one inversion stage operable to cause a signal transition; a target component that has an increased comparative impact or influence on a signal transition propagation in the ring oscillator; and an output component for outputting an indication of the impact the target component has on the signal transition. The target component can include a plurality of vias from one metal layer to another metal layer. The plurality of vias from one metal layer to another metal layer can be configured in a cell. The vias can correspond to a via layer. In one exemplary implementation, the output is coupled to an analysis component. The analysis component can include correlation of the via resistance into a wafer variations and generate a wafer map. The analysis component can include correlation of the via resistance into a wafer.

Abstract: A repeater circuit. The repeater circuit includes two output circuits, two echo circuits, two activation circuits, and two deactivation circuits. Responsive to detecting a logical transition of an input signal, one of the activation circuits is configured to activate a corresponding output circuit, which is configured to drive an output signal on an output node. A corresponding echo circuit is configured to be activated and to drive an input node responsive to activation of the corresponding output circuit. A corresponding one of the deactivation circuits is configured to deactivate the corresponding output circuit after a delay time has elapsed, whereas the corresponding echo circuit is deactivated in response thereto. A keeper circuit is configured to continue providing the output signal on the output node after deactivation of the corresponding output circuit.

Abstract: A method and apparatus for test of asynchronous pipelines. An asynchronous data pipeline includes first and second pluralities of pipeline stages in an alternating sequence. Each of the pipeline stages includes a control circuit, a latch circuit configured to latch data responsive to an indication from the control circuit, and a combinational logic circuit coupled to receive data from an output of the latch circuit. Each of the latch circuits is scannable. The latch circuits of the first and second pluralities of pipeline stages form a data scan chain configured to load test data into the combinational logic circuits during testing of the data pipeline. The data pipeline further includes a control scan chain configured to load control data for operating the control circuits during testing of the data pipeline. Testing of the data pipeline can include independent testing of the control portion or the data portion.

Abstract: A repeater circuit. The repeater circuit includes two output circuits, two echo circuits, two activation circuits, and two deactivation circuits. Responsive to detecting a logical transition of an input signal, one of the activation circuits is configured to activate a corresponding output circuit, which is configured to drive an output signal on an output node. A corresponding echo circuit is configured to be activated and to drive an input node responsive to activation of the corresponding output circuit. A corresponding one of the deactivation circuits is configured to deactivate the corresponding output circuit after a delay time has elapsed, whereas the corresponding echo circuit is deactivated in response thereto. A keeper circuit is configured to continue providing the output signal on the output node after deactivation of the corresponding output circuit.

Abstract: A modified high-speed flip-flop including an input circuit, a smart window circuit, a smart keeper circuit, a pre-charge circuit, a discharge circuit, a slave storage circuit, and an output circuit. Additionally, a circuit including the modified high-speed flip-flop, the circuit also including a non-zero operating voltage provided to the flip-flop, a common voltage provided to the flip-flop, a clock signal input to the flip-flop, a data signal input to the flip-flop wherein the data signal has a high state and a low state, and an output signal from the flip-flop wherein the output signal has a high state and a low state.

Abstract: A method and apparatus for test of asynchronous pipelines. An asynchronous data pipeline includes first and second pluralities of pipeline stages in an alternating sequence. Each of the pipeline stages includes a control circuit, a latch circuit configured to latch data responsive to an indication from the control circuit, and a combinational logic circuit coupled to receive data from an output of the latch circuit. Each of the latch circuits is scannable. The latch circuits of the first and second pluralities of pipeline stages form a data scan chain configured to load test data into the combinational logic circuits during testing of the data pipeline. The data pipeline further includes a control scan chain configured to load control data for operating the control circuits during testing of the data pipeline. Testing of the data pipeline can include independent testing of the control portion or the data portion.

Abstract: A one gate delay output noise insensitive latch includes an input node, an output node, a storage node, a not storage node, and a data clock line. A primary latch element is connected to the input node, the output node, and the data clock line. A mirror primary latch element is connected to the input node in parallel with the primary latch element, to the storage node, and to the data clock line. A weak keeper is connected to the storage node and to the not storage node. A strong enabled tri-state keeper is connected to the not storage node, to the data clock line, and to the output node. The input node is either a dynamic data input node or a static data input node. Optionally, the weak keeper is also clock enabled.