Abstract: An image sensor having maximized photosensitivity includes a photodiode and a transistor formed over the semiconductor substrate. A first passivation layer is formed over the semiconductor substrate including the transistor and the photodiode, a pre-metal dielectric layer formed over the first passivation layer and insulating layers having metal wirings formed over the pre-metal dielectric layer. A trench is formed in the insulating layers and the pre-metal dielectric layer exposing a portion of the first passivation layer formed over the photodiode while a second passivation layer formed on sidewalls and a bottom of the trench and over the uppermost surface of the insulating layer such that the second passivation layer directly contacts the portion of the first passivation layer formed over the photodiode. A photosensitive material is then formed over the second passivation layer and buried in the trench.