Patents by Inventor In-Gu Jeon

In-Gu Jeon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Pick and place apparatus for electronic device inspection equipment
    Patent number: 8926259
    Abstract: A technology related to a pick-and-place apparatus for electronic device inspection equipment is provided. The pick-and-place apparatus includes the guiding unit that can interact with a loading element and can guide the picker to load the electronic devices at a correct position on the loading element. Therefore, the pick-and-place apparatus can allow the electronic devices, for example, semiconductor devices having a ball type of electrical contact lead (BGA, FBGA, etc.), to electrically contact the tester in a stable manner when the tester inspects the electronic devices.
    Type: Grant
    Filed: April 25, 2013
    Date of Patent: January 6, 2015
    Assignee: TechWing., Co. Ltd.
    Inventors: Yun-Sung Na, In-Gu Jeon, Dong-Hyun Yo, Young-Chul Lee
  • Hi-fix board clamping apparatus for use in test handler
    Patent number: 8919755
    Abstract: A clamping apparatus for clamping a plurality of Hi-Fix boards arranged in a row, includes at least one rotational clamping unit installed to clamp facing end sides of the two or more Hi-Fix boards together, and a plurality of clamping units installed to clamp end sides of the Hi-Fix boards other than the facing sides thereof. The rotational clamping unit includes a clamper installed to rotate about a fixed rotation point to clamp or release the claming of the facing end sides of the two or more Hi-Fix boards, and a driving unit for providing a rotational force to the clamper.
    Type: Grant
    Filed: January 11, 2007
    Date of Patent: December 30, 2014
    Assignee: Techwing Co. Ltd.
    Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Tae Hung Ku, Dong Han Kim
  • METHOD AND APPARATUS FOR MANAGING ENERGY CONSUMPTION IN A HOME NETWORK SYSTEM
    Publication number: 20140180968
    Abstract: Provided is a method and apparatus for managing energy consumption in a home network system including multiple home devices. The method includes collecting measurement results of power consumptions of the respective multiple home devices, generating power consumption information of the multiple home devices by analyzing the collected measurement results, and transmitting the generated power consumption information to a user device if receiving a request for transmitting the power consumption information from the user device, in which the power consumption information comprises in-home room-specific power consumption information.
    Type: Application
    Filed: December 18, 2013
    Publication date: June 26, 2014
    Applicant: Samsung Electronics Co. Ltd.
    Inventors: Kwan-Woo SONG, Ji-Hyeon KWEON, Hyun-Suk MIN, Jong-Gu JEON
  • Test handler and method for operating the same for testing semiconductor devices
    Patent number: 8653845
    Abstract: A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.
    Type: Grant
    Filed: November 15, 2011
    Date of Patent: February 18, 2014
    Assignee: TechWing Co., Ltd.
    Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Dong-Han Kim
  • Air conditioner system and method for controlling the same
    Patent number: 8638189
    Abstract: The present invention relates to a system for controlling an air conditioner and method for controlling the same, and more particularly, to a system for controlling an air conditioner and method for controlling the same which can make real time control for maintaining system reliability, can make real time control of air conditioners while minimizing a network load to minimize a load on a server, and can prevent transmission and reception delay of a data.
    Type: Grant
    Filed: March 7, 2011
    Date of Patent: January 28, 2014
    Assignee: LG Electronics Inc.
    Inventors: Byoung Keun Cha, Duck Gu Jeon, Jae Sik Jung, Jong Hyun Han
  • Electrical-mechanical complex sensor for nanomaterials
    Patent number: 8621661
    Abstract: Disclosed is an electrical-mechanical complex sensor for nanomaterials, including: a detector having a piezoelectric film therein, for measuring a mechanical property of a nanomaterial when a bending or tensile load is applied to the nanomaterial; a first detection film formed at an end of the detector to measure the mechanical property and an electrical property of the nanomaterial) in real time at the same time, when the nanomaterial contacts the first detection film; and a support to which one end of the detector is integrally connected, for supporting the detector.
    Type: Grant
    Filed: January 10, 2011
    Date of Patent: December 31, 2013
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Seung Hoon Nahm, Hoon Sik Jang, Sang Gu Jeon, Min Seok Kim
  • Carrier board transfer system for handler that supports testing of electronic devices and method for transferring carrier board in chamber of handler
    Patent number: 8570058
    Abstract: A system and method is disclosed that transfers carrier boards in a handler that supports the testing of electronic devices. A carrier board can be transferred from the transfer start position to one of the mid transfer positions and the transfer final position. Carrier boards, which are spaced apart from each other in a chamber, can be gathered adjacent to each other in the circulation direction of carrier board. The transfer speed and the total circulation speed of the carrier boards can be enhanced. The transfer speed of carrier board can be easily controlled according to the test conditions.
    Type: Grant
    Filed: January 19, 2009
    Date of Patent: October 29, 2013
    Assignee: TechWing Co., Ltd.
    Inventors: Yun-Sung Na, In-Gu Jeon, Dong-Hyun Yo, Young-Ho Kweon, Hoyung-Su Kim
  • PICK AND PLACE APPARATUS FOR ELECTRONIC DEVICE INSPECTION EQUIPMENT, PICKING APPARATUS THEREOF, AND METHOD FOR LOADING ELECTRONIC DEVICES ONTO LOADING ELEMENT
    Publication number: 20130230377
    Abstract: A technology related to a pick-and-place apparatus for electronic device inspection equipment is provided. The pick-and-place apparatus includes the guiding unit that can interact with a loading element and can guide the picker to load the electronic devices at a correct position on the loading element. Therefore, the pick-and-place apparatus can allow the electronic devices, for example, semiconductor devices having a ball type of electrical contact lead (BGA, FBGA, etc.), to electrically contact the tester in a stable manner when the tester inspects the electronic devices.
    Type: Application
    Filed: April 25, 2013
    Publication date: September 5, 2013
    Applicant: TechWing., Co. Ltd.
    Inventors: Yun-Sung NA, In-Gu JEON, Dong-Hyun YO, Young-Chul LEE
  • Opener and buffer table for test handler
    Patent number: 8523158
    Abstract: An opener and a buffer table for a test handler are disclosed. The opener includes an opening plate, a plurality of pin blocks forming pairs, and at least one or more interval retaining apparatus for retaining an interval between the pin blocks forming a pair. Each of the pin blocks is movably coupled to the opening plate, and includes opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board. Although semiconductor devices to be tested are altered in size and a carrier board loading with the semiconductor devices is thus replaced, the opener does not need to be replaced, thereby reducing the replacement cost and the waste of resources.
    Type: Grant
    Filed: July 2, 2008
    Date of Patent: September 3, 2013
    Assignee: TechWing., Co. Ltd.
    Inventors: Yun-Sung Na, In-Gu Jeon, Seung-Chul Ahn, Dong-Han Kim, Jae-Hyun Son
  • Pick and place apparatus for electronic device inspection equipment, picking apparatus thereof, and method for loading electronic devices onto loading element
    Patent number: 8496426
    Abstract: A technology related to a pick-and-place apparatus for electronic device inspection equipment is provided. The pick-and-place apparatus includes the guiding unit that can interact with a loading element and can guide the picker to load the electronic devices at a correct position on the loading element. Therefore, the pick-and-place apparatus can allow the electronic devices, for example, semiconductor devices having a ball type of electrical contact lead (BGA, FBGA, etc.), to electrically contact the tester in a stable manner when the tester inspects the electronic devices.
    Type: Grant
    Filed: June 7, 2010
    Date of Patent: July 30, 2013
    Assignee: TechWing., Co. Ltd.
    Inventors: Yun-Sung Na, In-Gu Jeon, Dong Hyun Yo, Young-Chul Lee
  • ELECTRICAL-MECHANICAL COMPLEX SENSOR FOR NANOMATERIALS
    Publication number: 20130167272
    Abstract: Disclosed is an electrical-mechanical complex sensor for nanomaterials, including: a detector having a piezoelectric film therein, for measuring a mechanical property of a nanomaterial when a bending or tensile load is applied to the nanomaterial; a first detection film formed at an end of the detector to measure the mechanical property and an electrical property of the nanomaterial) in real time at the same time, when the nanomaterial contacts the first detection film; and a support to which one end of the detector is integrally connected, for supporting the detector.
    Type: Application
    Filed: January 10, 2011
    Publication date: June 27, 2013
    Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Seung Hoon Nahm, Hoon Sik Jang, Sang Gu Jeon, Min Seok Kim
  • ORGANIC SEMICONDUCTOR PARTICULATE MATERIAL, ORGANIC SEMICONDUCTOR THIN-FILM, DISPERSION LIQUID FOR FORMING ORGANIC SEMICONDUCTOR FILM, METHOD FOR PRODUCING ORGANIC SEMICONDUCTOR THIN-FILM, AND ORGANIC THIN-FILM TRANSISTOR
    Publication number: 20130153884
    Abstract: Provided are a fine-particulate organic semiconductor material, a thin organic semiconductor film and an organic transistor. The fine-particulate organic semiconductor material is in a form of fine particles and is usable as an organic semiconductor material. The fine particles are fine thermotropic liquid crystal particles that undergo a phase transition into a liquid crystal state when heated to a temperature of from 50° C. to 350° C. The fine-particulate organic semiconductor material can easily and uniformly form the thin organic semiconductor film over a large area by a film printing process or a dispersion coating process. The thin organic semiconductor film has high electron mobility and high ON/OFF value.
    Type: Application
    Filed: August 17, 2011
    Publication date: June 20, 2013
    Applicants: DAINICHISEIKA COLOR & CHEMICALS MFG. CO., LTD., SHINSHU UNIVERSITY
    Inventors: Musubu Ichikawa, Hyeon-Gu Jeon, Naomi Oguma, Naoki Hirata, Hisao Kono
  • APPARATUS AND METHOD FOR MEASURING LENGTH OF PIPE
    Publication number: 20130120007
    Abstract: An apparatus for detecting a pipe length in an air conditioning system includes a detector to detect a signal traveled through a pipe; and a processor to determine a pipe length based on the detected signal.
    Type: Application
    Filed: November 2, 2012
    Publication date: May 16, 2013
    Inventors: Jun-Tae Kim, Chi-Sun Ahn, Seung-Hwan Jung, Sang-Chul Youn, Duck-Gu Jeon
  • AIR CONDITIONING SYSTEM AND CONTROLLING METHOD THEREOF
    Publication number: 20130060386
    Abstract: An air conditioning system and a controlling method of the same are disclosed.
    Type: Application
    Filed: March 4, 2011
    Publication date: March 7, 2013
    Inventors: Byoung Keun Cha, Duck Gu Jeon, Jae Sik Jung, Jong Hyun Han
  • Apparatus and method for measuring length of pipe
    Patent number: 8326572
    Abstract: An apparatus for detecting a pipe length in an air conditioning system includes a detector to detect a signal traveled through a pipe and a first impedance coupler that couples to one end of the pipe, where the detector detects the signal traveled through the pipe at the first impedance coupler. A processor determines a pipe length based on the detected signal and a signal generator generates the signal to be sent through the pipe. A second impedance coupler couples to another end of the pipe, where the signal generator sends the signal to the pipe through the second impedance coupler.
    Type: Grant
    Filed: July 2, 2009
    Date of Patent: December 4, 2012
    Assignee: LG Electronics Inc.
    Inventors: Jun-Tae Kim, Chi-Sun Ahn, Seung-Hwan Jung, Sang-Chul Youn, Duck-Gu Jeon
  • Test tray for test handler
    Patent number: 8258804
    Abstract: A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.
    Type: Grant
    Filed: October 22, 2007
    Date of Patent: September 4, 2012
    Assignee: TechWing., Co. Ltd
    Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Jung-Woo Hwang
  • Test handler and method for operating the same for testing semiconductor devices
    Patent number: 8159252
    Abstract: A test handler and method for operating a test handler for testing semiconductor devices are provided. The test handler includes a test tray located on one side of an opening apparatus in which a plurality of inserts are arrayed, wherein each insert comprises at least one semiconductor device loaded thereon, at least one opening unit for opening inserts at one part of the one side of the test tray, and a position changing apparatus comprises a motor including a driving pulley for moving at least one opening unit along a contact surface of the test tray such that the at least one opening unit changes positions on the test tray and is located at another part of the one side of the test tray in order to open inserts at the other part of the one side of the test tray.
    Type: Grant
    Filed: February 9, 2007
    Date of Patent: April 17, 2012
    Assignee: TechWing Co., Ltd.
    Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Dong-Han Kim
  • Side-docking type test handler and apparatus for transferring test tray for same
    Patent number: 8154314
    Abstract: In a side-docking type test handler, a descending mechanism lowers a horizontally postured test tray, which has been transferred into a soak chamber, down to a descent finish position and a vertical posture changing mechanism changes the posture of the test tray, which has been lowered to the descent finish position, from the horizontal state to a vertical state, to transfer the test tray into a test chamber. Further, a horizontal posture changing mechanism changes the posture of the test tray in the test chamber from the vertical state to the horizontal state while transferring the test tray to an ascent start position in a desoak chamber.
    Type: Grant
    Filed: March 31, 2009
    Date of Patent: April 10, 2012
    Assignee: Techwing Co., Ltd.
    Inventors: Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Dong Hyun Yo, Bong Soo Kim, Choung Min Joung
  • Pick-and-place apparatus
    Patent number: 8141922
    Abstract: A pick-and-place apparatus for transferring and loading semiconductor devices between first and second loading elements is provided. The pick-and-place apparatus includes a multiplicity of picking unit modules, each of which has at least one or more picking units, and an interval regulation apparatus for regulating intervals between the picking unit modules at the first to third modes. The first to third row interval values are different from each other. The intervals between the picking unit modules are all regulated to be identical to the first row interval at the first mode, are alternately regulated to the second row interval and the third row interval in turn at the second mode, and are alternately regulated to the third row interval and the second row interval in turn at the third mode.
    Type: Grant
    Filed: June 26, 2007
    Date of Patent: March 27, 2012
    Assignee: TechWing Co., Ltd
    Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Dong Hyun Yo
  • TEST HANDLER AND METHOD FOR OPERATING THE SAME FOR TESTING SEMICONDUCTOR DEVICES
    Publication number: 20120056636
    Abstract: A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.
    Type: Application
    Filed: November 15, 2011
    Publication date: March 8, 2012
    Applicant: TECHWING CO., LTD.
    Inventors: Jae-Gyun SHIM, Yun-Sung Na, In-Gu JEON, Tae-Hung KU, Dong-Han KIM