Abstract: A display device includes: a display panel including a first light emitting area to emit a source light; a barrier wall on the display panel, and having a first opening corresponding to the first light emitting area; a first light control pattern in the first opening; and a light shielding pattern between the display panel and the barrier wall, and overlapping with the barrier wall and the first opening. The light shielding pattern overlaps with a portion of the first light control pattern.

Abstract: A semiconductor device includes a substrate, a stack structure, peripheral gate structures and residual spacers. The substrate includes a cell array region and a peripheral circuit region. The stack structure is disposed on the cell array region, having electrodes and insulating layers alternately stacked. The peripheral gate structures are disposed on the peripheral circuit region, being spaced apart from each other in one direction and having a peripheral gate pattern disposed on the substrate, and a peripheral gate spacer disposed on a sidewall of the peripheral gate pattern. The residual spacers are disposed on sidewalls of the peripheral gate structures, having a sacrificial pattern and an insulating pattern that are stacked. The insulating pattern includes substantially the same material as the insulating layers of the stack structure.

Abstract: A semiconductor device includes a substrate, a stack structure, peripheral gate structures and residual spacers. The substrate includes a cell array region and a peripheral circuit region. The stack structure is disposed on the cell array region, having electrodes and insulating layers alternately stacked. The peripheral gate structures are disposed on the peripheral circuit region, being spaced apart from each other in one direction and having a peripheral gate pattern disposed on the substrate, and a peripheral gate spacer disposed on a sidewall of the peripheral gate pattern. The residual spacers are disposed on sidewalls of the peripheral gate structures, having a sacrificial pattern and an insulating pattern that are stacked. The insulating pattern includes substantially the same material as the insulating layers of the stack structure.

Abstract: A semiconductor device includes a substrate, a stack structure, peripheral gate structures and residual spacers. The substrate includes a cell array region and a peripheral circuit region. The stack structure is disposed on the cell array region, having electrodes and insulating layers alternately stacked. The peripheral gate structures are disposed on the peripheral circuit region, being spaced apart from each other in one direction and having a peripheral gate pattern disposed on the substrate, and a peripheral gate spacer disposed on a sidewall of the peripheral gate pattern. The residual spacers are disposed on sidewalls of the peripheral gate structures, having a sacrificial pattern and an insulating pattern that are stacked. The insulating pattern includes substantially the same material as the insulating layers of the stack structure.

Abstract: The present invention relates to a multi fixed-point cell for calibrating a thermometer and a thermometer calibration apparatus using the same, wherein measuring errors can be checked by using a property of constant temperature of a metal on the basis of a phase transition and wide range of temperature region can be measured by one time calibration, thereby capable of increasing efficiencies of time and cost which are taken for calibration. In a multi fixed-point cell for calibrating a thermometer according to the present invention, a thermometer inserting hole in which a thermometer is inserted is formed at one side and at least two reference material inserting holes in which reference materials having different phase transition temperatures are inserted respectively are formed on a same plane as that of the thermometer inserting hole so as to be spaced apart each other.

Abstract: The present invention relates to a multi fixed-point cell for calibrating a thermometer and a thermometer calibration apparatus using the same, wherein measuring errors can be checked by using a property of constant temperature of a metal on the basis of a phase transition and wide range of temperature region can be measured by one time calibration, thereby capable of increasing efficiencies of time and cost which are taken for calibration. In a multi fixed-point cell for calibrating a thermometer according to the present invention, a thermometer inserting hole in which a thermometer is inserted is formed at one side and at least two reference material inserting holes in which reference materials having different phase transition temperatures are inserted respectively are formed on a same plane as that of the thermometer inserting hole so as to be spaced apart each other.