Abstract: A thin film deposition apparatus and a method of manufacturing an organic light-emitting display device by using the same, and more particularly, to a thin film deposition apparatus that can remove a deposition material deposited on a patterning slit sheet without performing an additional cleaning process, and a method of manufacturing an organic light-emitting display device by using the thin film deposition apparatus.

Abstract: A thin film deposition apparatus and a method of manufacturing an organic light-emitting display device using the thin film deposition apparatus. The thin film deposition apparatus includes a plurality of thin film deposition assemblies, each of which includes: a deposition source that discharges a deposition material; a deposition source nozzle unit that is disposed at a side of the deposition source and includes a plurality of deposition source nozzles; a patterning slit sheet that is disposed opposite to the deposition source nozzle unit and includes a plurality of patterning slits arranged in a first direction; and a barrier plate assembly that is disposed between the deposition source nozzle unit and the patterning slit sheet, in the first direction. The barrier plate assembly includes a plurality of barrier plates that partition a space between the deposition source nozzle unit and the patterning slit sheet into a plurality of sub-deposition spaces.

Abstract: An apparatus for testing an object includes a test chamber, a guiding member, testing units and a transferring unit. The test chamber is configured to receive the object. The guiding member is arranged extending along a first direction in the test chamber. The testing units are movably connected to the guiding member to test electrical characteristics of the object. The transferring unit is arranged in the test chamber to load the object into one of the testing units and unload the object from one of the testing units. The testing units may be transferred to a position for repair without suspension of the apparatus. The object may be tested using another testing unit while the other testing unit is being repaired.

Abstract: A semiconductor device having a trench in the side portion of a conducting line pattern and methods of forming the same. The semiconductor device provides a way of preventing an electrical short between the conducting line pattern and a landing pad adjacent to the conducting line pattern. There are disposed two conducting line patterns on a semiconductor substrate. Each of the conducting line patterns includes a conducting line and a conducting line capping layer pattern stacked thereon. Each of the conducting line patterns has a trench between the conducting line capping layer pattern and the conducting line. Conducting line spacers are formed between the conducting line patterns. One conducting line spacer covers a portion of a sidewall of one of the conducting line patterns, and the remaining conducting line spacer covers an entire sidewall of the remaining conducting line pattern. A landing pad is disposed between the conducting line patterns.

Abstract: A shirt frame including a fixed frame installed on ground, a model installed on the fixed frame, for supporting a shirt, a front iron installed on the fixed frame and movable towards the model so as to iron a front part of the shirt supported on the model, a rear iron installed on the fixed frame and moveable towards the model so as to iron a rear part of the shirt supported on the model, a sleeve supporter installed on the fixed frame, for stretching a sleeve of the shirt supported on the model, and a lateral stretcher installed on the fixed frame and including at least one rods that are folded and unfolded in both directions with respect to the model so as to stretch lateral surfaces of the shirt supported on the model. The quality of an ironing operation is maximized, and an operating speed of a user is increased. Upper and lower surfaces of a sleeve of shirt are uniformly ironed, sleeves are easily supported, and thus creases of the sleeves are prevented.

Abstract: An apparatus for providing grayscale voltages and a display device using the same are provided. The display device includes a grayscale voltage provider that provides grayscale voltages using a first reference voltage and a second reference voltage in accordance with a selection signal. A data driver applies data voltages to data lines using the grayscale voltages and an image signal. A gate driver successively provides a gate-on voltage to the gate lines. A display panel displays an image for each frame using the data voltages and the gate-on voltage.

Abstract: There is disclosed a plasma gun for bio/medical treatment using atmospheric plasma. The disclosed plasma gun comprises a housing having an elongate chamber provided therein, the chamber having an end at which a nozzle for spraying plasma is positioned; a gas supply unit for supplying a reaction gas to the chamber; and a plasma discharge unit formed with an elongate cavity communicating with the nozzle, the plasma discharge unit including first and second electrodes and a dielectric or insulating barrier material for plasma ignition in the elongate cavity.

Abstract: A liquid crystal display includes a liquid crystal panel, a backlight unit, and a backlight control circuit. The liquid crystal panel displays an image. The backlight unit supplies light to the liquid crystal panel and includes a plurality of backlight blocks arranged in a matrix. The backlight control circuit controls the backlight unit. When the backlight control circuit turns on at least one of the backlight blocks, it turns off any remaining backlight blocks arranged in a same row of the backlight unit.

Abstract: A liquid crystal display includes a liquid crystal panel that displays an image signal, a backlight unit supplying light to the liquid crystal panel, and a backlight control circuit to scan the backlight unit. The backlight control circuit supplies a pulse width modulation signal to rows of the backlight unit, which are adjacent to rows being scanned, such that the rows adjacent to the rows being scanned have a brightness lower than a brightness of the rows being scanned.

Abstract: Provided are a field mounting-type test apparatus and method, which can enhance competitiveness of a product by simulating various test conditions including a mounting environment so as to improve quality reliability of a memory device and by minimizing overall loss due to change in a mounting environment so as to reduce testing time and cost. In accordance with example embodiments, the field mounting-type test apparatus may include a mass storage device configured to store logic data simulating a mounting environment of a device under test (DUT) and a tester main frame configured to test the DUT by using the logic data.

Abstract: A semiconductor device having a trench in the side portion of a conducting line pattern and methods of forming the same. The semiconductor device provides a way of preventing an electrical short between the conducting line pattern and a landing pad adjacent to the conducting line pattern. There are disposed two conducting line patterns on a semiconductor substrate. Each of the conducting line patterns includes a conducting line and a conducting line capping layer pattern stacked thereon. Each of the conducting line patterns has a trench between the conducting line capping layer pattern and the conducting line. Conducting line spacers are formed between the conducting line patterns. One conducting line spacer covers a portion of a sidewall of one of the conducting line patterns, and the remaining conducting line spacer covers an entire sidewall of the remaining conducting line pattern. A landing pad is disposed between the conducting line patterns.

Abstract: A semiconductor device having a trench in the side portion of a conducting line pattern and methods of forming the same. The semiconductor device provides a way of preventing an electrical short between the conducting line pattern and a landing pad adjacent to the conducting line pattern. There are disposed two conducting line patterns on a semiconductor substrate. Each of the conducting line patterns includes a conducting line and a conducting line capping layer pattern stacked thereon. Each of the conducting line patterns has a trench between the conducting line capping layer pattern and the conducting line. Conducting line spacers are formed between the conducting line patterns. One conducting line spacer covers a portion of a sidewall of one of the conducting line patterns, and the remaining conducting line spacer covers an entire sidewall of the remaining conducting line pattern. A landing pad is disposed between the conducting line patterns.

Abstract: An apparatus for testing an object includes a test chamber, a guiding member, testing units and a transferring unit. The test chamber is configured to receive the object. The guiding member is arranged extending along a first direction in the test chamber. The testing units are movably connected to the guiding member to test electrical characteristics of the object. The transferring unit is arranged in the test chamber to load the object into one of the testing units and unload the object from one of the testing units. The testing units may be transferred to a position for repair without suspension of the apparatus. The object may be tested using another testing unit while the other testing unit is being repaired.

Abstract: Disclosed is a bicycle of shaking equipment capable of carrying out a normal rotation running or a shaking rotation running according to the rotation of a hub. The bicycle of shaking equipment has an adjusting means causing a cylindrical eccentric cam inserted and installed a hub and the inside of the hub to make a centrifugal rotation and an eccentric rotation to be carried out, wherein the adjusting means may be used as a handle lever installed to the handle. And a wire cable of a handle lever makes a rotation piece to be rotated on basis of a pin. A connection long rod inserted and coupled in a guide tube portion of a hub screw axis makes a movable member inserted in a guide part of the center of the hub screw axis to be moved back and also moved forward by the elasticity of a coil spring of the hub screw axis to restore, and due to this key pin elastically installed the hub and the inside of pin hole of the cylindrical eccentric cam makes the hub and the cylindrical eccentric cam to be incorporated.

Abstract: An apparatus and method for depositing a protective layer. The apparatus includes an anti-hydration module, wherein a substrate is loaded through a substrate input hole and mounted on a carrier; a load lock chamber, which is connected to the anti-hydration module and maintains a vacuum; a plurality of vacuum chambers; a depositing chamber, which is installed in one of the vacuum chambers; a target unit, which is installed in the depositing chamber and deposits a raw material of a protective layer on the substrate; a transferring unit which is continuously installed in the anti-hydration module, the load lock chamber, the vacuum chambers, and the depositing chamber, and transfers the substrate mounted on the carrier. Accordingly, since the carrier is not exposed to the atmosphere, moisture pressure inside the depositing chamber does not increase even if the apparatus is used for a long time.

Abstract: Provided is a plasma gun including: a cathode unit generating plasma; and a return electrode unit which ejects plasma generated in the cathode unit toward a target and returns electrons reflected from the target to a power source. The return electrode unit includes a frame, an insulating tube, and a gas flow unit. The frame includes a plasma outlet. The insulating tube electrically insulates the surface of the plasma outlet. The gas flow unit is formed to eject gases toward a target side end of the insulating tube.

Abstract: The present invention discloses a polypeptide having function of cinnamyl alcohol dehydrogenase, a polynucleotide coding the polypeptide and those uses. Particularly, this present invention discloses a polypeptide having function of cinnamyl alcohol dehydrogenase, a polynucleotide coding the polypeptide, a method for inducing plant growth inhibition, a method for screening a compound inducing plant growth inhibition, and composition for inducing plant growth inhibition which comprises the compound obtained by the screening method.

Abstract: An apparatus for injecting plasma in the atmosphere is provided, including a plurality of dielectric panels (13a, 13b, 13c), and 13d, which are disposed in parallel at predetermined intervals, a gas supply portion (14), to which the dielectric panels (13a, 13b, 13c, and 13d) are fixed and which supplies a gas to spaces between the dielectric panels (13a and 13b), between the dielectric panels (13b and 13c), and between the dielectric panels (13c and 13d), power electrodes (15a, 15b, and 15c), which are linearly installed near the gas supply portion (14) and between the dielectric panels (13a and 13b, between the dielectric panels 13b and 13c, and between the dielectric panels 13c and 13d), respectively, ground electrodes (16a, 16b, 16c, and 16d), which are formed in the ends of the dielectric panels (13a, 13b, 13c, and 13d), respectively, and a high frequency generator (17), which applies high frequency power to the power electrodes (15a, 15b, and 15c) and the ground electrodes (16a, 16b, 16c, and 16d).

Abstract: An electrical power generator that generates power based on a carrier frequency of a received signal, a mobile terminal provided with the same and a control method thereof are discussed. The mobile terminal according to an embodiment includes an electrical power generator to generate an electrical energy based on a a carrier frequency separated from a signal received from a base station.

Abstract: A multi-chip die bonder may include a first substrate conveyor conveying a substrate in a first direction and a second substrate conveyor conveying a substrate in a second direction. A plurality of dies may be stacked onto the substrate while the substrate is circulating the first substrate conveyor and the second substrate conveyor. A first heater may be provided in a die bonding unit and a second heater may be provided in the first substrate conveyor. An adhesive curing process may be performed together with a die attaching process.