Patents by Inventor Ina Huh

Ina Huh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for testing electronic devices using master-slave test architectures
    Patent number: 11509563
    Abstract: A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
    Type: Grant
    Filed: July 17, 2020
    Date of Patent: November 22, 2022
    Assignee: Contec, LLC
    Inventors: Ina Huh, Rajeev Tiwari, Jin Ryu
  • SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES USING MASTER-SLAVE TEST ARCHITECTURES
    Publication number: 20200358690
    Abstract: A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
    Type: Application
    Filed: July 17, 2020
    Publication date: November 12, 2020
    Inventors: Ina Huh, Rajeev Tiwari, Jin Ryu
  • Systems and methods for testing electronic devices using master-slave test architectures
    Patent number: 10757002
    Abstract: A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: August 25, 2020
    Assignee: Contec, LLC
    Inventors: Ina Huh, Rajeev Tiwari, Jin Ryu
  • Wireless devices under test
    Patent number: 10581718
    Abstract: A system for testing multiple wireless devices independently and simultaneously using different types of device probes is disclosed. The system includes real-time, bi-directional/asynchronous communication and interaction between system components.
    Type: Grant
    Filed: December 11, 2018
    Date of Patent: March 3, 2020
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Dinesh Kumar, Shivashankar Diddimani, Gunjan Samaiya, Ina Huh, Jin Ryu
  • SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICS USING MASTER-SLAVE TEST ARCHITECTURES
    Publication number: 20190230022
    Abstract: A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
    Type: Application
    Filed: March 29, 2019
    Publication date: July 25, 2019
    Inventors: Ina Huh, Rajeev Tiwari, Jin Ryu
  • CABLE MODEMS/EMTAS UNDER TEST
    Publication number: 20190182134
    Abstract: A system for testing multiple cable modem/eMTA devices independently and simultaneously using different types of device probes is disclosed. The system includes real-time, bi-directional/asynchronous communication and interaction between the system components.
    Type: Application
    Filed: February 18, 2019
    Publication date: June 13, 2019
    Inventors: Samant Kumar, Dinesh Kumar, Shivashankar Diddimani, Gunjan Samaiya, Ina Huh, Jin Ryu
  • Systems and methods for testing electronic devices using master-slave test architectures
    Patent number: 10284456
    Abstract: A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
    Type: Grant
    Filed: November 10, 2016
    Date of Patent: May 7, 2019
    Assignee: Contec, LLC
    Inventors: Ina Huh, Rajeev Tiwari, Jin Ryu
  • WIRELESS DEVICES UNDER TEST
    Publication number: 20190109778
    Abstract: A system for testing multiple wireless devices independently and simultaneously using different types of device probes is disclosed. The system includes real-time, bi-directional/asynchronous communication and interaction between system components.
    Type: Application
    Filed: December 11, 2018
    Publication date: April 11, 2019
    Inventors: Samant Kumar, Dinesh Kumar, Shivashankar Diddimani, Gunjan Samaiya, Ina Huh, Jin Ryu
  • Wireless routers under test
    Patent number: 10230617
    Abstract: A system for testing multiple wireless routers independently and simultaneously using different types of device probes is disclosed. The system includes real-time, bi-directional/asynchronous communication and interaction between system components.
    Type: Grant
    Filed: November 15, 2017
    Date of Patent: March 12, 2019
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Dinesh Kumar, Shivashankar Diddimani, Gunjan Samaiya, Ina Huh, Jin Ryu
  • Test sequences using universal testing system
    Patent number: 10116397
    Abstract: A testing system that provides a separate set of virtualization container probes for each of at least a subset of devices that is under testing can perform Wifi Layer 2 and Wifi Layer 3 tests in a manner that minimizes or avoids wireless interference is disclosed.
    Type: Grant
    Filed: June 16, 2017
    Date of Patent: October 30, 2018
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Dinesh Kumar, Ina Huh, Jin Ryu, Rajeev Tiwari
  • Systems and methods for testing electronic devices using master-slave test architectures
    Patent number: 10103967
    Abstract: A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
    Type: Grant
    Filed: June 16, 2017
    Date of Patent: October 16, 2018
    Assignee: Contec, LLC
    Inventors: Ina Huh, Rajeev Tiwari, Jin Ryu
  • Cable modems/eMTAs under test
    Patent number: 9992084
    Abstract: A system for testing multiple cable modem/eMTA devices independently and simultaneously using different types of device probes is disclosed. The system employs multiple device probes configured to test various functions and connectivity associated with the device under test, including wireless local area network (WLAN), local area network (LAN), Multimedia Over Coax Alliance (MoCA), DOCSIS, and Foreign Exchange Station (FXS). The system includes real-time, bi-directional/asynchronous communication and interaction between the system components.
    Type: Grant
    Filed: November 20, 2015
    Date of Patent: June 5, 2018
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Dinesh Kumar, Shivashankar Diddimani, Gunjan Samaiya, Ina Huh, Jin Ryu
  • SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES USING MASTER-SLAVE TEST ARCHITECTURES
    Publication number: 20180131596
    Abstract: A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
    Type: Application
    Filed: June 16, 2017
    Publication date: May 10, 2018
    Inventors: Ina Huh, Rajeev Tiwari, Jin Ryu
  • SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES USING MASTER-SLAVE TEST ARCHITECTURES
    Publication number: 20180131594
    Abstract: A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
    Type: Application
    Filed: November 10, 2016
    Publication date: May 10, 2018
    Applicant: Contec, LLC
    Inventors: Ina Huh, Rajeev Tiwari, Jin Ryu
  • WIRELESS ROUTERS UNDER TEST
    Publication number: 20180077046
    Abstract: A system for testing multiple wireless routers independently and simultaneously using different types of device probes is disclosed. The system includes real-time, bi-directional/asynchronous communication and interaction between system components.
    Type: Application
    Filed: November 15, 2017
    Publication date: March 15, 2018
    Inventors: Samant Kumar, Dinesh Kumar, Shivashankar Diddimani, Gunjan Samaiya, Ina Huh, Jin Ryu
  • Test sequences using universal testing system
    Patent number: 9900116
    Abstract: A testing system that provides a separate set of virtualization container probes for each of at least a subset of devices that is under testing can perform Wifi Layer 2 and Wifi Layer 3 tests in a manner that minimizes or avoids wireless interference is disclosed.
    Type: Grant
    Filed: January 4, 2016
    Date of Patent: February 20, 2018
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Dinesh Kumar, Ina Huh, Jin Ryu, Rajeev Tiwari
  • Wireless routers under test
    Patent number: 9838295
    Abstract: A system for testing multiple wireless routers independently and simultaneously using different types of device probes is disclosed. The system includes real-time, bi-directional/asynchronous communication and interaction between system components.
    Type: Grant
    Filed: November 23, 2015
    Date of Patent: December 5, 2017
    Assignee: Contec, LLC
    Inventors: Samant Kumar, Dinesh Kumar, Shivashankar Diddimani, Gunjan Samaiya, Ina Huh, Jin Ryu
  • CABLE MODEMS/EMTAS UNDER TEST
    Publication number: 20170288993
    Abstract: A system for testing multiple cable modem/eMTA devices independently and simultaneously using different types of device probes is disclosed. The system includes real-time, bi-directional/asynchronous communication and interaction between the system components.
    Type: Application
    Filed: June 16, 2017
    Publication date: October 5, 2017
    Inventors: Samant Kumar, Dinesh Kumar, Shivashankar Diddimani, Gunjan Samaiya, Ina Huh, Jin Ryu
  • TEST SEQUENCES USING UNIVERSAL TESTING SYSTEM
    Publication number: 20170288791
    Abstract: A testing system that provides a separate set of virtualization container probes for each of at least a subset of devices that is under testing can perform Wifi Layer 2 and Wifi Layer 3 tests in a manner that minimizes or avoids wireless interference is disclosed.
    Type: Application
    Filed: June 16, 2017
    Publication date: October 5, 2017
    Inventors: Samant Kumar, Dinesh Kumar, Ina Huh, Jin Ryu, Rajeev Tiwari
  • TEST SEQUENCES USING UNIVERSAL TESTING SYSTEM
    Publication number: 20170195071
    Abstract: A testing system that provides a separate set of virtualization container probes for each of at least a subset of devices that is under testing can perform Wifi Layer 2 and Wifi Layer 3 tests in a manner that minimizes or avoids wireless interference is disclosed.
    Type: Application
    Filed: January 4, 2016
    Publication date: July 6, 2017
    Inventors: SAMANT KUMAR, DINESH KUMAR, INA HUH, JIN RYU, RAJEEV TIWARI