Patents by Inventor Ines Nimsky

Ines Nimsky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for slice position planning of tomographic measurements, using statistical images
    Patent number: 6952097
    Abstract: In a method and computer program product for operating a tomographic imaging apparatus, a standard measurement protocol is generated by displaying a planning representation of a standard object, defining a spatial position of a standard imaging area in the planning representation, and storing, as the standard measurement protocol for the standard object, a reference to the standard object and parameters of the standard imaging area. Such a standard measurement protocol can then be used in the slice position planning for an actual tomographic measurement, by obtaining data representing features of an examination object, corresponding to the standard object, determining a geometrical relation of the features of the examination object to features of the standard object, and generating an object-specific measurement protocol wherein the imaging area is positioned relative to the examination object by modification of the standard measurement protocol.
    Type: Grant
    Filed: October 22, 2003
    Date of Patent: October 4, 2005
    Assignee: Siemens Aktiengesellschaft
    Inventors: Oliver Schreck, Mike Müller, Martin Harder, Hans-Peter Hollenbach, Franz Schmitt, Ines Nimsky, Anders Dale, Andre Van Der Kouwe
  • Method for slice position planning of tomographic measurements, using statistical images
    Publication number: 20050088177
    Abstract: In a method and computer program product for operating a tomographic imaging apparatus, a standard measurement protocol is generated by displaying a planning representation of a standard object, defining a spatial position of a standard imaging area in the planning representation, and storing, as the standard measurement protocol for the standard object, a reference to the standard object and parameters of the standard imaging area. Such a standard measurement protocol can then be used in the slice position planning for an actual tomographic measurement, by obtaining data representing features of an examination object, corresponding to the standard object, determining a geometrical relation of the features of the examination object to features of the standard object, and generating an object-specific measurement protocol wherein the imaging area is positioned relative to the examination object by modification of the standard measurement protocol.
    Type: Application
    Filed: October 22, 2003
    Publication date: April 28, 2005
    Inventors: Oliver Schreck, Mike Muller, Martin Harder, Hans-Peter Hollenbach, Franz Schmitt, Ines Nimsky, Anders Dale, Andre Van Der Kouwe
  • Method for adapting a magnetic resonance measurement protocol to an examination subject
    Publication number: 20050038336
    Abstract: In order to adapt a magnetic resonance measurement protocol to an examination subject, a magnetic resonance localization measurement is performed, Measurement data obtained In this localization measurement are evaluated. Geometric parameters characterizing the maximum physical extent of the examination subject are determined and the magnetic resonance measurement protocol is adapted to the geometric parameters. This speeds up and simplifies the execution of magnetic resonance examinatIons.
    Type: Application
    Filed: May 14, 2004
    Publication date: February 17, 2005
    Inventor: Ines Nimsky