Patents by Inventor Ingo Andreas Schneider

Ingo Andreas Schneider has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ISFET measuring probe, measurement circuit for the ISFET measuring probe, and method
    Patent number: 10197528
    Abstract: ISFET measuring probe with a housing in which an ISFET and a reference electrode are arranged in such a way that the gate electrode of the ISFET, which is coated with an ion-sensitive layer, and the reference electrode reach into a measurement space into which a measurement medium can be introduced, with the distinguishing feature that an auxiliary electrode is arranged additionally inside the housing and is held inside the measurement space.
    Type: Grant
    Filed: February 14, 2017
    Date of Patent: February 5, 2019
    Assignee: Mettler-Toledo GmbH
    Inventors: Ingo Andreas Schneider, Petr Horn
  • ISFET MEASURING PROBE, MEASUREMENT CIRCUIT FOR THE ISFET MEASURING PROBE, AND METHOD
    Publication number: 20170241944
    Abstract: ISFET measuring probe with a housing in which an ISFET and a reference electrode are arranged in such a way that the gate electrode of the ISFET, which is coated with an ion-sensitive layer, and the reference electrode reach into a measurement space into which a measurement medium can be introduced, with the distinguishing feature that an auxiliary electrode is arranged additionally inside the housing and is held inside the measurement space.
    Type: Application
    Filed: February 14, 2017
    Publication date: August 24, 2017
    Inventors: Ingo Andreas Schneider, Petr Horn