Abstract: A method for operating a multi-beam particle microscope which operates using a plurality of individual charged particle beams, wherein the method includes the following steps: measuring the beam current; determining a deviation of the measured beam current from a nominal beam current; decomposing the determined deviation into a drift component and into a high-frequency component; and controlling the high-frequency component of the beam current via a first closed-loop beam current control mechanism and/or compensating an effect of the high-frequency component on a recording quality of the multi-beam particle microscope using different mechanism than a closed-loop beam current control mechanism. An electrostatic control lens arranged in the beam generating system between extractor and anode can be used as first closed-loop beam current control mechanism. Adapting an extractor voltage of the beam generating system can be avoided.

Abstract: A surgical suture system (1, 21, 41) is illustrated and described. The object, namely to permit simple correction of the suture course or of an incorrect position, is achieved by a suture system (1) with a needle-like applicator (2, 22, 42) having a tip (26, 50) in its front end area, with a surgical suture material (4, 24, 44) provided with barbs (6, 7, 28, 29, 47, 48) which, on one side, preferably point in one direction of action from a reference point (8, 30, 49) and, on the other side, point in the opposite direction of action from the reference point (8, 30, 49) and are designed to block a movement of body tissue (12) away from the reference point (8, 30, 49), and with a sheath (3, 23, 43) whose front end area starts from the rear end area of the applicator (2, 22, 42) and which surrounds the surgical suture material (4, 24, 44).