Patents by Inventor Inkeon Ryu

Inkeon Ryu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of measuring 3D profile
    Patent number: 10731971
    Abstract: A 3D profile measurement method includes: forming structured light having a sinusoidal intensity pattern by forcing light to pass through a grating filter and an objective lens; acquiring a structured illumination image of a measurement object by photographing the measurement object with the structured light projected thereon at predetermined intervals in a height direction of the measurement object and a uniform illumination image of the measurement object is acquired by photographing the measurement object under illumination with general light rather than the structured light; generating a Hi-Lo image by using the structured illumination image and the uniform illumination image at each height of the measurement object; extracting height-specific intensity of respective pixels in the plural Hi-Lo images; and generating a 3D profile of the measurement object based on the obtained surface position.
    Type: Grant
    Filed: November 15, 2019
    Date of Patent: August 4, 2020
    Assignee: INDUSTRY-ACADEMIC COOPERATION FOUNDATION, DANKOOK UNIVERSITY
    Inventors: Daekeun Kim, Se Won Kang, Inkeon Ryu
  • METHOD OF MEASURING 3D PROFILE
    Publication number: 20200240774
    Abstract: A 3D profile measurement method includes: forming structured light having a sinusoidal intensity pattern by forcing light to pass through a grating filter and an objective lens; acquiring a structured illumination image of a measurement object by photographing the measurement object with the structured light projected thereon at predetermined intervals in a height direction of the measurement object and a uniform illumination image of the measurement object is acquired by photographing the measurement object under illumination with general light rather than the structured light; generating a Hi-Lo image by using the structured illumination image and the uniform illumination image at each height of the measurement object; extracting height-specific intensity of respective pixels in the plural Hi-Lo images; and generating a 3D profile of the measurement object based on the obtained surface position.
    Type: Application
    Filed: November 15, 2019
    Publication date: July 30, 2020
    Applicant: INDUSTRY-ACADEMIC COOPERATION FOUNDATION, DANKOOK UNIVERSITY
    Inventors: Daekeun KIM, Se Won KANG, Inkeon Ryu