Abstract: A semiconductor device includes a first power line extended in a first direction, a second power line extended in the first direction and spaced apart from the first power line in a second direction crossing the first direction, a filler cell electrically connected to the first and second power lines, and a first logic cell and a second logic cell spaced apart from each other in the first direction, with the filler cell interposed therebetween. The filler cell includes a first source/drain pattern and a second source/drain pattern, a first gate electrode between the first and second source/drain patterns, a third source/drain pattern and a fourth source/drain pattern, and a second gate electrode between the third and fourth source/drain patterns.

Abstract: A nonvolatile memory device includes a first memory block connected to first word lines, a second memory block arranged in a direction perpendicular to the first memory block and is connected to second word lines, first pass transistors for enabling the first word lines, and second pass transistors for enabling the second word lines. The first and second pass transistors are arranged in a horizontal direction with respect to the first and second memory blocks.

Abstract: A nonvolatile memory device includes a first memory block connected to first word lines, a second memory block arranged in a direction perpendicular to the first memory block and is connected to second word lines, first pass transistors for enabling the first word lines, and second pass transistors for enabling the second word lines. The first and second pass transistors are arranged in a horizontal direction with respect to the first and second memory blocks.

Abstract: A method of reading data in a non-volatile memory device based on the logic level of a selection bit of an address, determines an order of reading a first and second bits of data stored in one multi-level memory cell corresponding to the address based on the logic level of the selection bit, and senses and outputs the first and second bits of data according to the determined order of reading. The method of reading data in a non-volatile memory device and the method of inputting and outputting data in a non-volatile memory device may reduce the initial read time by selecting the order of reading the first and second bits of data stored in the multi-level memory cell and reading the data according the order based on the start address.

Abstract: A nonvolatile memory device performs a program operation on selected memory cells by determining a level of a program voltage based on a degree of deterioration of the memory cells, and executing the program operation using the program voltage.

Abstract: A method of reading data in a non-volatile memory device based on the logic level of a selection bit of an address, determines an order of reading a first and second bits of data stored in one multi-level memory cell corresponding to the address based on the logic level of the selection bit, and senses and outputs the first and second bits of data according to the determined order of reading. The method of reading data in a non-volatile memory device and the method of inputting and outputting data in a non-volatile memory device may reduce the initial read time by selecting the order of reading the first and second bits of data stored in the multi-level memory cell and reading the data according the order based on the start address.

Abstract: A flash memory device includes a flash memory cell array having flash memory cells arranged with word and bit lines, a word line driver circuit configured to drive the word lines at a selected step increment during a programming operation, a bulk-voltage supply circuit configured to supply a bulk voltage into a bulk of the flash memory cell array and a writing circuit configured to drive the bit lines selected by conditions during a programming operation. A control logic block is configured to control the writing circuit and the bulk-voltage supply circuit during the programming operation. The control logic block is configured to cause the writing circuit and/or the bulk-voltage supply circuit to change at least one of the conditions of the writing circuit and/or the bulk voltage responsive to the selected step increment.

Abstract: A flash memory device includes a flash memory cell array having flash memory cells arranged with word and bit lines, a word line driver circuit configured to drive the word lines at a selected step increment during a programming operation, a bulk-voltage supply circuit configured to supply a bulk voltage into a bulk of the flash memory cell array and a writing circuit configured to drive the bit lines selected by conditions during a programming operation. A control logic block is configured to control the writing circuit and the bulk-voltage supply circuit during the programming operation. The control logic block is configured to cause the writing circuit and/or the bulk-voltage supply circuit to change at least one of the conditions of the writing circuit and/or the bulk voltage responsive to the selected step increment.