Abstract: A method for preparing error recovery of a memory device included in a memory system includes performing a training operation of the memory device upon power-on of the memory system, booting an operating system into a normal mode by operating the memory device using a selected operation frequency of a plurality of operation frequencies based on results of the training operation, detecting an error frequency among the plurality of operation frequencies in response to a change of the selected operation frequency of the memory device by the operating system, the error frequency being an operation frequency which causes at least one error in the memory device, and storing information regarding the detected error frequency in a first register included in a memory controller associated with the memory device.

Abstract: Disclosed are a negative testing-based security analysis system for protocol implementation of an LTE device, and a method thereof. According to an embodiment, a negative testing-based security analyzing method for protocol implementation of an LTE device performed by a computer device includes redefining a state of user equipment (UE) as a security abstraction state for a negative test and composing a test case generation rule by analyzing a specification document in redefining the state of the UE as the security abstraction state.

Abstract: Debugging systems are configured to resolve both memory aliasing conditions in which a write instruction is directed to an unknown destination address, and concurrency conditions in which control flow information is collected for multiple, concurrently executing threads. Recorded state values corresponding to an application's prior execution and control flow information are both obtained.