Abstract: A method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least including an interface structure, including a sampling or skimmer cone, and at least one passage with an inlet and an outlet into a reaction zone, the method including: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.

Abstract: A method for analyzing a sample using a system, wherein the sample is a solid sample comprising a first chemical element and a second chemical element, wherein the system comprises a plasma spectrometer and an analytical device, the method including: determining a concentration of the first chemical element using the analytical device; determining a sensitivity of the plasma spectrometer to the first chemical element and to the second chemical element; measuring a signal intensity of the first chemical element using the plasma spectrometer; measuring a signal intensity of the second chemical element using the plasma spectrometer; and calculating a concentration of the second chemical element using the determined concentration of the first chemical element, the sensitivities to the first chemical element and to the second chemical element, and the signal intensities of the first chemical element and the second chemical element.

Abstract: A system for analyzing a sample, wherein the sample is an air composition or an aerosol, includes: a sample preparation unit, including a sample inlet and a plasma torch, wherein the sample enters the system through the sample inlet, wherein the plasma torch is configured to produce a plasma, which ionizes the sample such that ions and/or photons are generated, wherein the plasma is configured to aspirate the sample through the sample inlet; an interface configured to guide the generated ions and/or photons towards a detector; the detector, which is configured to detect the generated ions and/or photons; and an evaluation unit configured to analyze the sample by means of the detected ions and/or photons.

Abstract: A method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least including an interface structure, including a sampling or skimmer cone, and at least one passage with an inlet and an outlet into a reaction zone, the method including: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.

Abstract: The present disclosure includes a mass spectrometry apparatus for analyzing an analyte sample, which comprises: an ion source from which a quantity of analyte ions from the analyte sample may be sourced for providing an ion beam; a mass analyzer serving to filter the analyte ions of the ion beam based on their mass-to-charge ratio; a first detector unit for analyzing the ions of the ion beam; and a second detector unit being based on the time-of-flight principle and comprising a second detector for analyzing the ions of the ion beam. The present disclosure further includes a method for analyzing an analyte sample using a mass spectrometry apparatus according to the present disclosure.

Abstract: There is provided an interface for use in sampling ions in a mass spectrometer, the interface being arranged for receiving a quantity of ions from an ion source and forming more than one ion beam therefrom, each ion beam being directed along a respective desired pathway.

Abstract: There is provided an ion guide arrangement comprising a guide assembly comprising a plurality of elongate members arranged so as to be spaced about a common axis. The elongate members are capable of being in electrical association with one another so as to guide a stream of ions along an intended pathway substantially aligned with the axis. The or each elongate member is shaped at or near an end of the ion guide assembly so as to define a region capable of receiving a quantity of ions, whereby the or each elongate member is so shaped so as the region converges substantially toward the axis.

Abstract: There is provided a sampling interface for use with a mass spectrometry apparatus. The sampling interface is arranged so as to enable the sampling of ions in a mass spectrometer. In one aspect, the sampling interface comprises an inlet for receiving a quantity of ions from an ion source, and a region downstream of the inlet for accommodating a gas through which the ions may pass, wherein a field having a selected bias voltage potential is provided in at least a portion of the downstream region through which the ions may pass.

Abstract: There is provided an ion deflector for use with a mass spectrometer for directing a flow of ions between two distinct axes of travel. The ion deflector includes an electric field inducer arranged so as to establish at least one electrostatic field capable of deflecting ions travelling substantially along a first intended path of travel so as to travel substantially along a second intended path of travel.

Abstract: There is provided an ion reflector for use with a mass spectrometer for directing a flow of ions between two distinct axes of travel. The reflector includes an electric field capable of causing a flow of ions focused through a first spatial region to be focused toward a second spatial region, whereby the first and second spatial regions are aligned with respective axes of travel.

Abstract: There is provided a mass spectrometry apparatus comprising: an ion source arranged in a substantially horizontal orientation and from which a quantity of ions may be sourced, an ion filter device arranged for receiving a stream of ions for filtering thereof; and, an ion guide arranged so as to guide ions sourced from the ion source toward the ion filter device. The ion source and the ion filter device are arranged relative to one another so that the profile of the apparatus is reduced so as to minimize the effective footprint of the apparatus.

Abstract: There is provided an ion deflector for use with a mass spectrometer for directing a flow of ions between two distinct axes of travel. The ion deflector includes an electric field inducer arranged so as to establish at least one electrostatic field capable of deflecting ions travelling substantially along a first intended path of travel so as to travel substantially along a second intended path of travel.

Abstract: There is provided an interface for use in sampling ions in a mass spectrometer, the interface being arranged for receiving a quantity of ions from an ion source and forming more than one ion beam therefrom, each ion beam being directed along a respective desired pathway.

Abstract: There is provided an ion reflector for use with a mass spectrometer for directing a flow of ions between two distinct axes of travel. The reflector includes an electric field capable of causing a flow of ions focused through a first spatial region to be focused toward a second spatial region, whereby the first and second spatial regions are aligned with respective axes of travel.

Abstract: There is provided an ion guide arrangement comprising a guide assembly comprising a plurality of elongate members arranged so as to be spaced about a common axis. The elongate members are capable of being in electrical association with one another so as to guide a stream of ions along an intended pathway substantially aligned with the axis. The or each elongate member is shaped at or near an end of the ion guide assembly so as to define a region capable of receiving a quantity of ions, whereby the or each elongate member is so shaped so as the region converges substantially toward the axis.

Abstract: There is provided a sampling interface for use with a mass spectrometry apparatus. The sampling interface is arranged so as to enable the sampling of ions in a mass spectrometer. In one aspect, the sampling interface comprises an inlet for receiving a quantity of ions from an ion source, and a region downstream of the inlet for accommodating a gas through which the ions may pass, wherein a field having a selected bias voltage potential is provided in at least a portion of the downstream region through which the ions may pass.

Abstract: An electrode for use in a reduced pressure region in a mass spectrometer whereby the electrode is subject to deposition of dielectric (non-conducting) substances thereon, which can cause unstable performance of the mass spectrometer. The surface portion of the electrode that is for providing an equipotential boundary of an electric field for influencing charged particles is made rough, in contrast to the prior art of providing a polished surface. The rough surface provides projections and cavities, which may have a regular or irregular occurrence, which it has been found significantly reduces the deposition of dielectric substances from the charged particles thereon. A preferred structure is for a rod electrode (42) to have a screw thread (44) formed thereon whereby the thread crests (43) along the rod electrode provide projections (43) and the thread roots (45) provide cavities.

Abstract: A mass spectrometer in which a substance is introduced into a plasma (28) which contains analyte ions as the plasma (28) is passing through an aperture (42), for example in a skimmer cone (40) between two vacuum regions (38) and (44) so that the substance interacts with the plasma (28) thereby reducing the concentration of interfering polyatomic or multicharged ions in the plasma by reactive or collisional interactions. The substance may be supplied via passage (60) having an outlet (63) in skimmer cone (40). The invention gives improved attenuation of interfering ions because the substance is supplied directly into the plasma (28) as it is substantially radially confined by aperture (42) and before an ion beam (58) is extracted. Alternatively or additionally a substance may be supplied directly into the plasma within aperture (36) in sampling cone (34).

Abstract: An electrode for use in a reduced pressure region in a mass spectrometer whereby the electrode is subject to deposition of dielectric (non-conducting) substances thereon, which can cause unstable performance of the mass spectrometer. The surface portion of the electrode that is for providing an equipotential boundary of an electric field for influencing charged particles is made rough, in contrast to the prior art of providing a polished surface. The rough surface provides projections and cavities, which may have a regular or irregular occurrence, which it has been found significantly reduces the deposition of dielectric substances from the charged particles thereon. A preferred structure is for a rod electrode (42) to have a screw thread (44) formed thereon whereby the thread crests (43) along the rod electrode provide projections (43) and the thread roots (45) provide cavities.

Abstract: A plasma source mass spectrometer (20) having an ion beam extraction electrode (45) associated with a skimmer cone (40) to restrict the pumping of gas from a region (60) immediately behind the skimmer cone orifice (42) to provide a higher pressure (e.g. 1–10?2 Torr) in the region (60) compared to the pressure downstream of the electrode (45) (e.g. 10?3–10?4 Torr). This provides a collisional gas volume (60) for plasma (28) for attenuating polyatomic and multicharged interfering ions prior to extraction of an ion beam (49). In one embodiment a substance (e.g. hydrogen) can be supplied into the region (60) to assist attenuation of polyatomic and multicharged interfering ions by reactive or collisional interactions.