Patents by Inventor Ippei Kamiyama

Ippei Kamiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Evaluation device
    Patent number: 12188885
    Abstract: An evaluation device includes an X-ray diffraction measuring device configured to acquire a first X-ray locking curve having a first main peak and a first sub-peak partially overlapping the first main peak by measuring an X-ray locking curve of a first portion of a sample having a crystalline material. The evaluation device includes an analysis device configured to separate the first sub-peak from the first main peak, perform first evaluation of a crystal defects or distortion of the sample based on a peak position, peak intensity, or a half width of the separated first sub-peak, and output the first evaluation.
    Type: Grant
    Filed: August 22, 2022
    Date of Patent: January 7, 2025
    Assignee: KIOXIA CORPORATION
    Inventors: Takehiro Nakai, Yumiko Yamashita, Ippei Kamiyama
  • EVALUATION DEVICE
    Publication number: 20230288351
    Abstract: An evaluation device includes an X-ray diffraction measuring device configured to acquire a first X-ray locking curve having a first main peak and a first sub-peak partially overlapping the first main peak by measuring an X-ray locking curve of a first portion of a sample having a crystalline material. The evaluation device includes an analysis device configured to separate the first sub-peak from the first main peak, perform first evaluation of a crystal defects or distortion of the sample based on a peak position, peak intensity, or a half width of the separated first sub-peak, and output the first evaluation.
    Type: Application
    Filed: August 22, 2022
    Publication date: September 14, 2023
    Applicant: Kioxia Corporation
    Inventors: Takehiro Nakai, Yumiko Yamashita, Ippei Kamiyama