Patents by Inventor Ira H. Leventhal

Ira H. Leventhal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9335347
    Abstract: Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications. The invention uses a novel “split-cartridge” design, combined with a method for aligning wafers when they are separated from the probe card assembly, to create a cost effective, efficient multi-wafer test cell. A “probe-card stops” design may be used within the cartridge to simplify the overall cartridge design and operation.
    Type: Grant
    Filed: September 10, 2012
    Date of Patent: May 10, 2016
    Assignee: ADVANTEST CORPORATION
    Inventors: John W. Andberg, Ira H. Leventhal, Matthew W. Losey, Yohannes Desta, Lakshmikanth Namburi, Vincent E. Lopopolo, Sanjeev Grover, Erik Volkerink
  • Publication number: 20140070828
    Abstract: Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications. The invention uses a novel “split-cartridge” design, combined with a method for aligning wafers when they are separated from the probe card assembly, to create a cost effective, efficient multi-wafer test cell. A “probe-card stops” design may be used within the cartridge to simplify the overall cartridge design and operation.
    Type: Application
    Filed: September 10, 2012
    Publication date: March 13, 2014
    Inventors: John W. Andberg, Ira H. Leventhal, Matthew W. Losey, Yohannes Desta, Lakshmikanth Namburi, Vincent E. Lopopolo, Sanjeev Grover, Erik Volkerink