Patents by Inventor Irfan Malik

Irfan Malik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11734497
    Abstract: A document authoring platform receives a user-selected idea type attribute of a structured document template. The platform identifies a supporting idea type attribute based on the user-selected idea type attribute and taxonomy rules for the structured document template. The platform receives a user-selected supporting idea type attribute and content of the user-selected supporting idea type attribute. The platform forms a tree structure of the structured document template based on the user-selected idea type attribute, the user-selected supporting idea type attribute, and the content of the user-selected supporting idea type attribute. A document is generated based on the tree structure.
    Type: Grant
    Filed: May 18, 2020
    Date of Patent: August 22, 2023
    Assignee: Icarus Lived Inc.
    Inventor: John Irfan Malik
  • Patent number: 11662889
    Abstract: A reader platform system generates a display of a document that is formed based on a tree structure from a structured document template with an idea type attribute and content of a supporting idea type attribute that is based on the idea type attribute. The idea type attribute and the content of the supporting idea type attribute are validated based on taxonomy rules for the structured document template. The reader platform system receives a reader feedback of the document via a feedback user interface of the display. The profile of a reader of the document and the profile of an author of the document are updated based on the reader feedback. The feed of another reader related to the reader of the document is updated based on the updated profile of the reader of the document.
    Type: Grant
    Filed: March 7, 2022
    Date of Patent: May 30, 2023
    Assignee: Icarus Lived Inc.
    Inventor: John Irfan Malik
  • Publication number: 20220187968
    Abstract: A reader platform system generates a display of a document that is formed based on a tree structure from a structured document template with an idea type attribute and content of a supporting idea type attribute that is based on the idea type attribute. The idea type attribute and the content of the supporting idea type attribute are validated based on taxonomy rules for the structured document template. The reader platform system receives a reader feedback of the document via a feedback user interface of the display. The profile of a reader of the document and the profile of an author of the document are updated based on the reader feedback. The feed of another reader related to the reader of the document is updated based on the updated profile of the reader of the document.
    Type: Application
    Filed: March 7, 2022
    Publication date: June 16, 2022
    Inventor: John Irfan Malik
  • Patent number: 11307741
    Abstract: A reader platform system generates a display of a document that is formed based on a tree structure from a structured document template with an idea type attribute and content of a supporting idea type attribute that is based on the idea type attribute. The idea type attribute and the content of the supporting idea type attribute are validated based on taxonomy rules for the structured document template. The reader platform system receives a reader feedback of the document via a feedback user interface of the display. The profile of a reader of the document and the profile of an author of the document are updated based on the reader feedback. The feed of another reader related to the reader of the document is updated based on the updated profile of the reader of the document.
    Type: Grant
    Filed: May 28, 2020
    Date of Patent: April 19, 2022
    Assignee: Icarus Lived Inc.
    Inventor: John Irfan Malik
  • Publication number: 20210373727
    Abstract: A reader platform system generates a display of a document that is formed based on a tree structure from a structured document template with an idea type attribute and content of a supporting idea type attribute that is based on the idea type attribute. The idea type attribute and the content of the supporting idea type attribute are validated based on taxonomy rules for the structured document template. The reader platform system receives a reader feedback of the document via a feedback user interface of the display. The profile of a reader of the document and the profile of an author of the document are updated based on the reader feedback. The feed of another reader related to the reader of the document is updated based on the updated profile of the reader of the document.
    Type: Application
    Filed: May 28, 2020
    Publication date: December 2, 2021
    Inventor: John Irfan Malik
  • Publication number: 20210357576
    Abstract: A document authoring platform receives a user-selected idea type attribute of a structured document template. The platform identifies a supporting idea type attribute based on the user-selected idea type attribute and taxonomy rules for the structured document template. The platform receives a user-selected supporting idea type attribute and content of the user-selected supporting idea type attribute. The platform forms a tree structure of the structured document template based on the user-selected idea type attribute, the user-selected supporting idea type attribute, and the content of the user-selected supporting idea type attribute. A document is generated based on the tree structure.
    Type: Application
    Filed: May 18, 2020
    Publication date: November 18, 2021
    Inventor: John Irfan Malik
  • Patent number: 8041106
    Abstract: Methods and systems for detecting defects on a reticle are provided. One method includes printing a single die reticle in first areas of a wafer using different values of a parameter of a lithography process and at least one second area using a nominal value of the parameter. The method also includes acquiring first images of the first areas and second image(s) of the at least one second area. In addition, the method includes separately comparing the first images acquired for different first areas to at least one of the second image(s). The method further includes detecting defects on the reticle based on first portions of the first images in which variations in the first images compared to the at least one second image are greater than second portions of the first images and the first portions that are common to two or more of the first images.
    Type: Grant
    Filed: December 5, 2008
    Date of Patent: October 18, 2011
    Assignee: KLA-Tencor Corp.
    Inventors: Patrick Tung-Sing Pak, Wee-Teck Chia, Aaron Geurdon Chin, Irfan Malik, Brian Duffy
  • Publication number: 20100142800
    Abstract: Methods and systems for detecting defects on a reticle are provided. One method includes printing a single die reticle in first areas of a wafer using different values of a parameter of a lithography process and at least one second area using a nominal value of the parameter. The method also includes acquiring first images of the first areas and second image(s) of the at least one second area. In addition, the method includes separately comparing the first images acquired for different first areas to at least one of the second image(s). The method further includes detecting defects on the reticle based on first portions of the first images in which variations in the first images compared to the at least one second image are greater than second portions of the first images and the first portions that are common to two or more of the first images.
    Type: Application
    Filed: December 5, 2008
    Publication date: June 10, 2010
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Patrick Tung-Sing Pak, Wee-Teck Chia, Aaron Geurdon Chin, Irfan Malik, Brian Duffy
  • Publication number: 20070280526
    Abstract: Various computer-implemented methods are provided. One computer-implemented method for determining information about a defect detected on a wafer after an immersion lithography (IL) process is performed on the wafer includes comparing inspection results for the defect to data in a defect library for different types of IL defects and determining the information about the defect based on results of the comparison. One computer-implemented method for binning defects detected on a wafer after an IL process is performed on the wafer includes comparing one or more characteristics of the defects to one or more characteristics of IL defects and one or more characteristics of non-IL defects. The method also includes binning the defects having one or more characteristics that substantially match the one or more characteristics of the IL defects and the non-IL defects in different groups.
    Type: Application
    Filed: May 30, 2006
    Publication date: December 6, 2007
    Inventors: Irfan Malik, Somnath Nag