Patents by Inventor Irfan Malik
Irfan Malik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11734497Abstract: A document authoring platform receives a user-selected idea type attribute of a structured document template. The platform identifies a supporting idea type attribute based on the user-selected idea type attribute and taxonomy rules for the structured document template. The platform receives a user-selected supporting idea type attribute and content of the user-selected supporting idea type attribute. The platform forms a tree structure of the structured document template based on the user-selected idea type attribute, the user-selected supporting idea type attribute, and the content of the user-selected supporting idea type attribute. A document is generated based on the tree structure.Type: GrantFiled: May 18, 2020Date of Patent: August 22, 2023Assignee: Icarus Lived Inc.Inventor: John Irfan Malik
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Patent number: 11662889Abstract: A reader platform system generates a display of a document that is formed based on a tree structure from a structured document template with an idea type attribute and content of a supporting idea type attribute that is based on the idea type attribute. The idea type attribute and the content of the supporting idea type attribute are validated based on taxonomy rules for the structured document template. The reader platform system receives a reader feedback of the document via a feedback user interface of the display. The profile of a reader of the document and the profile of an author of the document are updated based on the reader feedback. The feed of another reader related to the reader of the document is updated based on the updated profile of the reader of the document.Type: GrantFiled: March 7, 2022Date of Patent: May 30, 2023Assignee: Icarus Lived Inc.Inventor: John Irfan Malik
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Publication number: 20220187968Abstract: A reader platform system generates a display of a document that is formed based on a tree structure from a structured document template with an idea type attribute and content of a supporting idea type attribute that is based on the idea type attribute. The idea type attribute and the content of the supporting idea type attribute are validated based on taxonomy rules for the structured document template. The reader platform system receives a reader feedback of the document via a feedback user interface of the display. The profile of a reader of the document and the profile of an author of the document are updated based on the reader feedback. The feed of another reader related to the reader of the document is updated based on the updated profile of the reader of the document.Type: ApplicationFiled: March 7, 2022Publication date: June 16, 2022Inventor: John Irfan Malik
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Patent number: 11307741Abstract: A reader platform system generates a display of a document that is formed based on a tree structure from a structured document template with an idea type attribute and content of a supporting idea type attribute that is based on the idea type attribute. The idea type attribute and the content of the supporting idea type attribute are validated based on taxonomy rules for the structured document template. The reader platform system receives a reader feedback of the document via a feedback user interface of the display. The profile of a reader of the document and the profile of an author of the document are updated based on the reader feedback. The feed of another reader related to the reader of the document is updated based on the updated profile of the reader of the document.Type: GrantFiled: May 28, 2020Date of Patent: April 19, 2022Assignee: Icarus Lived Inc.Inventor: John Irfan Malik
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Publication number: 20210373727Abstract: A reader platform system generates a display of a document that is formed based on a tree structure from a structured document template with an idea type attribute and content of a supporting idea type attribute that is based on the idea type attribute. The idea type attribute and the content of the supporting idea type attribute are validated based on taxonomy rules for the structured document template. The reader platform system receives a reader feedback of the document via a feedback user interface of the display. The profile of a reader of the document and the profile of an author of the document are updated based on the reader feedback. The feed of another reader related to the reader of the document is updated based on the updated profile of the reader of the document.Type: ApplicationFiled: May 28, 2020Publication date: December 2, 2021Inventor: John Irfan Malik
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Publication number: 20210357576Abstract: A document authoring platform receives a user-selected idea type attribute of a structured document template. The platform identifies a supporting idea type attribute based on the user-selected idea type attribute and taxonomy rules for the structured document template. The platform receives a user-selected supporting idea type attribute and content of the user-selected supporting idea type attribute. The platform forms a tree structure of the structured document template based on the user-selected idea type attribute, the user-selected supporting idea type attribute, and the content of the user-selected supporting idea type attribute. A document is generated based on the tree structure.Type: ApplicationFiled: May 18, 2020Publication date: November 18, 2021Inventor: John Irfan Malik
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Patent number: 8041106Abstract: Methods and systems for detecting defects on a reticle are provided. One method includes printing a single die reticle in first areas of a wafer using different values of a parameter of a lithography process and at least one second area using a nominal value of the parameter. The method also includes acquiring first images of the first areas and second image(s) of the at least one second area. In addition, the method includes separately comparing the first images acquired for different first areas to at least one of the second image(s). The method further includes detecting defects on the reticle based on first portions of the first images in which variations in the first images compared to the at least one second image are greater than second portions of the first images and the first portions that are common to two or more of the first images.Type: GrantFiled: December 5, 2008Date of Patent: October 18, 2011Assignee: KLA-Tencor Corp.Inventors: Patrick Tung-Sing Pak, Wee-Teck Chia, Aaron Geurdon Chin, Irfan Malik, Brian Duffy
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Publication number: 20100142800Abstract: Methods and systems for detecting defects on a reticle are provided. One method includes printing a single die reticle in first areas of a wafer using different values of a parameter of a lithography process and at least one second area using a nominal value of the parameter. The method also includes acquiring first images of the first areas and second image(s) of the at least one second area. In addition, the method includes separately comparing the first images acquired for different first areas to at least one of the second image(s). The method further includes detecting defects on the reticle based on first portions of the first images in which variations in the first images compared to the at least one second image are greater than second portions of the first images and the first portions that are common to two or more of the first images.Type: ApplicationFiled: December 5, 2008Publication date: June 10, 2010Applicant: KLA-TENCOR CORPORATIONInventors: Patrick Tung-Sing Pak, Wee-Teck Chia, Aaron Geurdon Chin, Irfan Malik, Brian Duffy
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Publication number: 20070280526Abstract: Various computer-implemented methods are provided. One computer-implemented method for determining information about a defect detected on a wafer after an immersion lithography (IL) process is performed on the wafer includes comparing inspection results for the defect to data in a defect library for different types of IL defects and determining the information about the defect based on results of the comparison. One computer-implemented method for binning defects detected on a wafer after an IL process is performed on the wafer includes comparing one or more characteristics of the defects to one or more characteristics of IL defects and one or more characteristics of non-IL defects. The method also includes binning the defects having one or more characteristics that substantially match the one or more characteristics of the IL defects and the non-IL defects in different groups.Type: ApplicationFiled: May 30, 2006Publication date: December 6, 2007Inventors: Irfan Malik, Somnath Nag