Patents by Inventor Irfan Waheed

Irfan Waheed has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8448107
    Abstract: This disclosure describes a method for accomplishing sequential logical equivalence verification using a hierarchical piecewise approach. Initially, the method provides a reference semiconductor design and a second semiconductor design with logic edits relative to it. The method submits both to formal verification to check the reference design against the second semiconductor design with all edits disabled 200. The semiconductor design is partitioned 202 and associated input constraints 204. The edits are further grouped 206 and ordered 208. The invention also discovers a set of dependencies of the logic edits 210 and checks that the ordering of groups obeys the dependencies 212. Each group of edits is further submitted to formal verification 214 and any input constraints assumed for any partitions are verified in their enclosing partition 216. Finally, the method reports success if formal verification succeeds on each group of logic edits and on each set of input constraints 218.
    Type: Grant
    Filed: July 8, 2009
    Date of Patent: May 21, 2013
    Assignee: Apple Inc.
    Inventors: Nathan Francis Sheeley, Mark H. Nodine, Nicolas Xavier Pena, Irfan Waheed, Patrick Peters, Adrian J. Isles
  • Patent number: 8429580
    Abstract: A method for preparing an IC design that has been modified to be formally verified with a reference IC design. Because some formal verification tools cannot handle the complexity often associated with sequential equivalence checking at the top level of a circuit, the modified IC design may be instantiated into a number of different design versions, each having different levels of modification complexity. In addition, the reference IC design and the modified versions may be decomposed into a datapath and control path. The reference IC design and each of the modified IC design versions may also use wrappers to encapsulate various levels of hierarchy of the logic. Lastly, rather than having to verify each of the modified versions back to the reference IC design, the equivalence checking may be performed between each modified IC design version and a next modified IC design version having a greater modification computational complexity.
    Type: Grant
    Filed: August 19, 2011
    Date of Patent: April 23, 2013
    Assignee: Apple Inc.
    Inventors: Raymond C. Yeung, Irfan Waheed, Mark H. Nodine
  • Publication number: 20110307848
    Abstract: A method for preparing an IC design that has been modified to be formally verified with a reference IC design. Because some formal verification tools cannot handle the complexity often associated with sequential equivalence checking at the top level of a circuit, the modified IC design may be instantiated into a number of different design versions, each having different levels of modification complexity. In addition, the reference IC design and the modified versions may be decomposed into a datapath and control path. The reference IC design and each of the modified IC design versions may also use wrappers to encapsulate various levels of hierarchy of the logic. Lastly, rather than having to verify each of the modified versions back to the reference IC design, the equivalence checking may be performed between each modified IC design version and a next modified IC design version having a greater modification computational complexity.
    Type: Application
    Filed: August 19, 2011
    Publication date: December 15, 2011
    Inventors: Raymond C. Yeung, Irfan Waheed, Mark H. Nodine
  • Publication number: 20110214096
    Abstract: This disclosure describes a method for accomplishing sequential logical equivalence verification using a hierarchical piecewise approach. Initially, the method provides a reference semiconductor design and a second semiconductor design with logic edits relative to it. The method submits both to formal verification to check the reference design against the second semiconductor design with all edits disabled 200. The semiconductor design is partitioned 202 and associated input constraints 204. The edits are further grouped 206 and ordered 208. The invention also discovers a set of dependencies of the logic edits 210 and checks that the ordering of groups obeys the dependencies 212. Each group of edits is further submitted to formal verification 214 and any input constraints assumed for any partitions are verified in their enclosing partition 216. Finally, the method reports success if formal verification succeeds on each group of logic edits and on each set of input constraints 218.
    Type: Application
    Filed: July 8, 2009
    Publication date: September 1, 2011
    Applicant: INTRINSITY, INC.
    Inventors: Nathan Francis Sheeley, Mark H. Nodine, Nicolas Xavier Pena, Irfan Waheed, Patrick Peters, Adrian J. Isles