Patents by Inventor Irit RUACH-NIR
Irit RUACH-NIR has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11810765Abstract: A reactive particles supply system that may include an adjustable gas supply unit that is arranged to supply gas and to set a gas condition, a reactive particles supply unit that may be arranged to receive the gas, and an adjustable reactive particles output unit that may include a reactive particles input, a second reactive particles output, and a reactive particles path. The second reactive particles output is configured to output reactive particles towards an opening of a vacuumed chamber. The adjustable reactive particles output unit is arranged to mechanically configure at least one element of the reactive particles path according to the reactive particles condition.Type: GrantFiled: December 21, 2020Date of Patent: November 7, 2023Assignee: Applied Materials Israel Ltd.Inventors: Asaf Gutman, Irit Ruach-Nir, Kfir Luria, Sven Ruhle, Guy Eytan
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Publication number: 20220199370Abstract: A reactive particles supply system that may include an adjustable gas supply unit that is arranged to supply gas and to set a gas condition, a reactive particles supply unit that may be arranged to receive the gas, and an adjustable reactive particles output unit that may include a reactive particles input, a second reactive particles output, and a reactive particles path. The second reactive particles output is configured to output reactive particles towards an opening of a vacuumed chamber. The adjustable reactive particles output unit is arranged to mechanically configure at least one element of the reactive particles path according to the reactive particles condition.Type: ApplicationFiled: December 21, 2020Publication date: June 23, 2022Inventors: Asaf Gutman, Irit Ruach-Nir, Kfir Luria, Sven Ruhle, Guy Eytan
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Patent number: 11049704Abstract: A cleanliness monitor, an evaluation system and a method. The cleanliness monitor may include: a first vacuum chamber, a second vacuum chamber, a molecule collector, a release unit, a mass spectrometer, a manipulator that may be configured to move the molecule collector from the first position to the second position, and an analyzer. The mass spectrometer may have a line of sight to an inner space of the second vacuum chamber. The mass spectrometer may be configured to monitor the inner space of the second vacuum chamber and to generate detection signals that are indicative of a content of the inner space of the second vacuum chamber. A first subset of the detection signals may be indicative of a presence of the at least subset of released organic molecules. The analyzer may be configured to determine, based on the detection signals, the cleanliness of at least one out of (a) the first vacuum chamber, and (b) a tested vacuum chamber. The tested vacuum chamber is fluidly coupled to the first vacuum chamber.Type: GrantFiled: May 20, 2020Date of Patent: June 29, 2021Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Irit Ruach-Nir, Michal Eilon, Guy Eytan, Magen Yaacov Schulman, Sven Ruhle, Manuel Radek, Igor Krivts (Krayvitz)
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Patent number: 10910204Abstract: A cleanliness monitor for monitoring a cleanliness of a vacuum chamber. The cleanliness monitor may include a mass spectrometer, a molecule aggregation and release unit and an analyzer. The molecule aggregation and release unit is configured to (a) aggregate, during an aggregation period, organic molecules that are present in the vacuum chamber and (b) induce, during a release period, a release of a subset of the organic molecules towards the mass spectrometer. The mass spectrometer is configured to monitor an environment within the vacuum chamber and to generate detection signals indicative of a content of the environment; wherein a first subset of the detection signals is indicative of a presence of the subset of the organic molecules. The analyzer is configured to determine the cleanliness of the vacuum chamber based on the detection signals.Type: GrantFiled: September 19, 2019Date of Patent: February 2, 2021Assignee: Applied Materials Israel Ltd.Inventors: Irit Ruach-Nir, Michal Eilon, Guy Eytan, Magen Yaacov Schulman
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Publication number: 20200013603Abstract: A cleanliness monitor for monitoring a cleanliness of a vacuum chamber. The cleanliness monitor may include a mass spectrometer, a molecule aggregation and release unit and an analyzer. The molecule aggregation and release unit is configured to (a) aggregate, during an aggregation period, organic molecules that are present in the vacuum chamber and (b) induce, during a release period, a release of a subset of the organic molecules towards the mass spectrometer. The mass spectrometer is configured to monitor an environment within the vacuum chamber and to generate detection signals indicative of a content of the environment; wherein a first subset of the detection signals is indicative of a presence of the subset of the organic molecules. The analyzer is configured to determine the cleanliness of the vacuum chamber based on the detection signals.Type: ApplicationFiled: September 19, 2019Publication date: January 9, 2020Inventors: Irit Ruach-Nir, Michal Jacobon-Eilon, Guy Eytan, Magen Yaacov Schulman
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Patent number: 10217621Abstract: A cleanliness monitor for monitoring a cleanliness of a vacuum chamber. The cleanliness monitor may include a mass spectrometer, a molecule aggregation and release unit and an analyzer. The molecule aggregation and release unit is configured to (a) aggregate, during an aggregation period, organic molecules that are present in the vacuum chamber and (b) induce, during a release period, a release of a subset of the organic molecules towards the mass spectrometer. The mass spectrometer is configured to monitor an environment within the vacuum chamber and to generate detection signals indicative of a content of the environment; wherein a first subset of the detection signals is indicative of a presence of the subset of the organic molecules. The analyzer is configured to determine the cleanliness of the vacuum chamber based on the detection signals.Type: GrantFiled: July 18, 2017Date of Patent: February 26, 2019Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Irit Ruach-Nir, Michal Eilon, Guy Eytan, Magen Yaacov Schulman
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Publication number: 20190027354Abstract: A cleanliness monitor for monitoring a cleanliness of a vacuum chamber. The cleanliness monitor may include a mass spectrometer, a molecule aggregation and release unit and an analyzer. The molecule aggregation and release unit is configured to (a) aggregate, during an aggregation period, organic molecules that are present in the vacuum chamber and (b) induce, during a release period, a release of a subset of the organic molecules towards the mass spectrometer. The mass spectrometer is configured to monitor an environment within the vacuum chamber and to generate detection signals indicative of a content of the environment; wherein a first subset of the detection signals is indicative of a presence of the subset of the organic molecules. The analyzer is configured to determine the cleanliness of the vacuum chamber based on the detection signals.Type: ApplicationFiled: July 18, 2017Publication date: January 24, 2019Applicant: APPLIED MATERIALS ISRAEL LTD.Inventors: Irit RUACH-NIR, Michal JACOBON-EILON, Guy EYTAN, Magen Yaacov SCHULMAN
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Patent number: 9327324Abstract: A system and method are described, for use in cleaning of a vacuum chamber. The method comprising connecting a vacuum chamber to a plasma generating unit via a plasma connection port and connecting the vacuum chamber to a high vacuum pumping unit via a pumping port. A flow conductance through the plasma connection port to the vacuum chamber is controlled to limit passage of charged particles and cleaning substances produced in the plasma generating unit, to thereby maintain a working pressure inside the vacuum chamber while cleaning the vacuum chamber by said cleaning substances.Type: GrantFiled: February 26, 2013Date of Patent: May 3, 2016Assignee: Applied Materials Israel Ltd.Inventors: Lior Segev, Irit Ruach Nir, Guy Eitan
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Patent number: 9164034Abstract: A device is presented comprising a multi-layer structure with a plurality of metal islands on the surface of a solid transparent substrate. The islands are coated by an ultrathin sol-gel derived silica film via self-assembled monolayer.Type: GrantFiled: June 5, 2009Date of Patent: October 20, 2015Assignee: YEDA RESEARCH AND DEVELOPMENT COMPANY LTD. AT THE WEIZMANN INSTITUTE OF SCIENCEInventors: Israel Rubinstein, Alexander Vaskevich, Irit Ruach-Nir, Tatyana Bendikov
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Publication number: 20140238438Abstract: A system and method are described, for use in cleaning of a vacuum chamber. The method comprising connecting a vacuum chamber to a plasma generating unit via a plasma connection port and connecting the vacuum chamber to a high vacuum pumping unit via a pumping port. A flow conductance through the plasma connection port to the vacuum chamber is controlled to limit passage of charged particles and cleaning substances produced in the plasma generating unit, to thereby maintain a working pressure inside the vacuum chamber while cleaning the vacuum chamber by said cleaning substances.Type: ApplicationFiled: February 26, 2013Publication date: August 28, 2014Applicant: Applied Materials Israel Ltd.Inventors: Lior Segev, Irit Ruach Nir, Guy Eitan
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Publication number: 20090257062Abstract: A device is presented comprising a multi-layer structure with a plurality of metal islands on the surface of a solid transparent substrate. The islands are coated by an ultrathin sol-gel derived silica film via self-assembled monolayer.Type: ApplicationFiled: June 5, 2009Publication date: October 15, 2009Applicant: Yeda Research and Development Company Ltd.Inventors: Israel RUBINSTEIN, Alexander VASKEVICH, Irit RUACH-NIR, Tatyana BENDIKOV