Abstract: One variation of a method for predicting manufacturing defects includes: accessing a set of inspection images of a set of assembly units recorded by an optical inspection station; for each inspection image in the set of inspection images, detecting a set of features in the inspection image and generating a vector representing the set of features in a multi-dimensional feature space; grouping neighboring vectors in the multi-dimensional feature space into a set of vector groups; and, in response to receipt of a first inspection result indicting a defect in a first assembly unit, in the set of assembly units, associated with a first vector in a first vector group, in the set of vector groups, labeling the first vector group with the defect and flagging a second assembly unit associated with a second vector, in the first vector group, as exhibiting characteristics of the defect.

Abstract: A method includes: displaying a first image of a first assembly unit within a user interface; locating a first virtual origin at a first feature on the first assembly unit; displaying a first subregion of the first image within the user interface responsive to a change in a view window of the first image; recording a geometry and a position of the first subregion relative to the first virtual origin; locating a second virtual origin at a second feature—analogous to the first feature—on a second assembly unit represented in the second image; projecting the geometry and the position of the first subregion onto the second image according to the second virtual origin to define a second subregion of the second image; and, in response to receipt of a command to advance from the first image to the second image, displaying the second subregion within the user interface.

Abstract: One variation of a method for automatically generating a common measurement across multiple assembly units includes: displaying a first image—recorded at an optical inspection station—within a user interface; receiving manual selection of a particular feature in a first assembly unit represented in the first image; receiving selection of a measurement type for the particular feature; extracting a first real dimension of the particular feature in the first assembly unit from the first image according to the measurement type; for each image in a set of images, identifying a feature—analogous to the particular feature—in an assembly unit represented in the image and extracting a real dimension of the feature in the assembly unit from the image according to the measurement type; and aggregating the first real dimension and a set of real dimensions extracted from the set of images into a digital container.