Abstract: Provided are instantaneous phase mapping deflectometry measurement systems and methods based on multiplexing phase shifted fringe patterns with color, and decomposing them in X and Y using Fourier techniques. The new methods and devices provide accurate measurements, and more robust tools with less uncertainty when reconstructing a surface (e.g., compared to prior art Fourier Transform Profilometry (FTP) methods). The systems and methods revolutionize the applications of deflectometry by enabling measuring dynamic events (e.g., in high vibration environments, and a host of other previously impossible scenarios), and including environmental changes to the bending modes of large optics. Methods of error correction applicable to the new methods and devices are also provided.

Abstract: Provided are instantaneous phase mapping deflectometry measurement systems and methods based on multiplexing phase shifted fringe patterns with color, and decomposing them in X and Y using Fourier techniques. The new methods and devices provide accurate measurements, and more robust tools with less uncertainty when reconstructing a surface (e.g., compared to prior art Fourier Transform Profilometry (FTP) methods). The systems and methods revolutionize the applications of deflectometry by enabling measuring dynamic events (e.g., in high vibration environments, and a host of other previously impossible scenarios), and including environmental changes to the bending modes of large optics. Methods of error correction applicable to the new methods and devices are also provided.